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Class Information
Number: 438/705
Name: Semiconductor device manufacturing: process > Chemical etching > Altering etchability of substrate region by compositional or crystalline modification
Description: Processes wherein the manner in which a semiconductor substrate is etched by a chemical etchant is altered by contacting the substrate prior to etching (a) with a material which alloys or diffuses into a substrate region or (b) by modifying the crystalline structure of a substrate region (e.g., amorphosizing, introducing dislocations, etc.).


Patents under this class:
1 2 3 4 5 6 7

Patent Number Title Of Patent Date Issued
6939758 Gate length control for semiconductor chip design Sep. 6, 2005
6932916 Semiconductor substrate with trenches of varying depth Aug. 23, 2005
6930030 Method of forming an electronic device on a recess in the surface of a thin film of silicon etched to a precise thickness Aug. 16, 2005
6927082 Method of evaluating the quality of a contact plug fill Aug. 9, 2005
6924217 Method of forming trench in semiconductor device Aug. 2, 2005
6903023 In-situ plasma etch for TERA hard mask materials Jun. 7, 2005
6900137 Dry etch process to edit copper lines May. 31, 2005
6881644 Smoothing method for cleaved films made using a release layer Apr. 19, 2005
6869884 Process to reduce substrate effects by forming channels under inductor devices and around analog blocks Mar. 22, 2005
6864190 Laser chemical fabrication of nanostructures Mar. 8, 2005
6855639 Precise patterning of high-K films Feb. 15, 2005
6852634 Low cost method of providing a semiconductor device having a high channel density Feb. 8, 2005
6849551 Method for forming isolation region in semiconductor device Feb. 1, 2005
6825057 Thermal membrane sensor and method for the production thereof Nov. 30, 2004
6818556 Method of plating a metal or metal compound on a semiconductor substrate that includes using the same main component in both plating and etching solutions Nov. 16, 2004
6815359 Process for improving the etch stability of ultra-thin photoresist Nov. 9, 2004
6815355 Method of integrating L-shaped spacers in a high performance CMOS process via use of an oxide-nitride-doped oxide spacer Nov. 9, 2004
6806204 Semiconductor etch speed modification Oct. 19, 2004
6806197 Method of forming integrated circuitry, and method of forming a contact opening Oct. 19, 2004
6797629 Method of manufacturing nano transistors Sep. 28, 2004
6780774 Method of semiconductor device isolation Aug. 24, 2004
6774043 Method of manufacturing semiconductor device Aug. 10, 2004
6767773 Method of Production of a thin film type semiconductor device having a heat-retaining layer Jul. 27, 2004
6767839 Method for forming multi-layer wiring structure Jul. 27, 2004
6759304 DRAM memory integration method Jul. 6, 2004
6759315 Method for selective trimming of gate structures and apparatus formed thereby Jul. 6, 2004
6753256 Method of manufacturing semiconductor wafer Jun. 22, 2004
6750149 Method of manufacturing electronic device Jun. 15, 2004
6746962 Method for fabricating a semi-conductor device having a tungsten film-filled via hole Jun. 8, 2004
6743724 Planarization process for semiconductor substrates Jun. 1, 2004
6734105 Method for forming silicon quantum dots and method for fabricating nonvolatile memory device using the same May. 11, 2004
6730607 Method for fabricating a barrier layer May. 4, 2004
6723649 Method of fabricating a semiconductor memory device Apr. 20, 2004
6716757 Method for forming bottle trenches Apr. 6, 2004
6716720 Method for filling depressions on a semiconductor wafer Apr. 6, 2004
6706611 Method for patterning a dual damascene with retrograde implantation Mar. 16, 2004
6696224 Methods of masking and etching a semiconductor substrate, and ion implant lithography methods of processing a semiconductor substrate Feb. 24, 2004
6664197 Process for etching thin-film layers of a workpiece used to form microelectronic circuits or components Dec. 16, 2003
6645869 Etching back process to improve topographic planarization of a polysilicon layer Nov. 11, 2003
6639266 Modifying material removal selectivity in semiconductor structure development Oct. 28, 2003
6638895 Method for fabricating high aspect ratio structures in perovskite material Oct. 28, 2003
6638781 Semiconductor device and method of fabricating the same Oct. 28, 2003
6632699 Process for making a color selective Si detector array Oct. 14, 2003
6607967 Process for forming planarized isolation trench in integrated circuit structure on semiconductor substrate Aug. 19, 2003
6605546 Dual bake for BARC fill without voids Aug. 12, 2003
6599839 Plasma etch process for nonhomogenous film Jul. 29, 2003
6599840 Material removal method for forming a structure Jul. 29, 2003
6596642 Material removal method for forming a structure Jul. 22, 2003
6594898 Method of manufacturing an ink jet printer head Jul. 22, 2003
6589447 Compound semiconductor single crystal and fabrication process for compound semiconductor device Jul. 8, 2003

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