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Class Information
Number: 438/704
Name: Semiconductor device manufacturing: process > Chemical etching > Having liquid and vapor etching steps
Description: Processes having a liquid (i.e., wet) chemical etching step and a gaseous (i.e., dry) chemical etching step.


Patents under this class:
1 2 3 4 5 6 7 8 9

Patent Number Title Of Patent Date Issued
6830979 Method for fabricating semiconductor device Dec. 14, 2004
6828193 Methods of forming hemispherical grained silicon on a template on a semiconductor work object Dec. 7, 2004
6825128 Method for manufacturing semiconductor device Nov. 30, 2004
6825121 Method of manufacturing a capacitor of a semiconductor device Nov. 30, 2004
6821902 Electroless plating liquid and semiconductor device Nov. 23, 2004
6818488 Process for making a gate for a short channel CMOS transistor structure Nov. 16, 2004
6812120 Method of forming floating gate of memory device Nov. 2, 2004
6809004 Method of forming a shallow trench isolation Oct. 26, 2004
6806196 High precision integrated circuit capacitors Oct. 19, 2004
6797632 Bonded wafer producing method and bonded wafer Sep. 28, 2004
6794303 Two stage etching of silicon nitride to form a nitride spacer Sep. 21, 2004
6790786 Etching processes for integrated circuit manufacturing including methods of forming capacitors Sep. 14, 2004
6787052 Method for fabricating microstructures with deep anisotropic etching of thick silicon wafers Sep. 7, 2004
6787390 Electrical and thermal contact for use in semiconductor devices Sep. 7, 2004
6777341 Method of forming a self-aligned contact, and method of fabricating a semiconductor device having a self-aligned contact Aug. 17, 2004
6770563 Process of forming a bottle-shaped trench Aug. 3, 2004
6766811 Method of removing smear from via holes Jul. 27, 2004
6767773 Method of Production of a thin film type semiconductor device having a heat-retaining layer Jul. 27, 2004
6764955 Semiconductor device having a contact window and fabrication method thereof Jul. 20, 2004
6762128 Apparatus and method for manufacturing a semiconductor circuit Jul. 13, 2004
6746945 Method of forming a via hole in a semiconductor device Jun. 8, 2004
6746966 Method to solve alignment mark blinded issues and a technology for application of semiconductor etching at a tiny area Jun. 8, 2004
6746615 Methods of achieving selective etching Jun. 8, 2004
6743729 Etching method and etching apparatus of carbon thin film Jun. 1, 2004
6740537 Process for fabricating a microelectromechanical optical component May. 25, 2004
6740595 Etch process for recessing polysilicon in trench structures May. 25, 2004
6737355 Thick thermal oxide layers and isolation regions in a silicon-containing substrate for high voltage applications May. 18, 2004
6737353 Semiconductor device having bump electrodes May. 18, 2004
6737202 Method of fabricating a tiered structure using a multi-layered resist stack and use May. 18, 2004
6737356 Method of fabricating a semiconductor work object May. 18, 2004
6734105 Method for forming silicon quantum dots and method for fabricating nonvolatile memory device using the same May. 11, 2004
6716757 Method for forming bottle trenches Apr. 6, 2004
6713440 Resist and etching by-product removing composition and resist removing method using the same Mar. 30, 2004
6712077 Method for forming capacitor Mar. 30, 2004
6696364 Method for manipulating MEMS devices, integrated on a wafer semiconductor and intended to be diced one from the other, and relevant support Feb. 24, 2004
6689694 Micromechanical system fabrication method using (111) single crystalline silicon Feb. 10, 2004
6686271 Protective layers prior to alternating layer deposition Feb. 3, 2004
6686237 High precision integrated circuit capacitors Feb. 3, 2004
6682659 Method for forming corrosion inhibited conductor layer Jan. 27, 2004
6683008 Process of removing ion-implanted photoresist from a workpiece Jan. 27, 2004
6664192 Method for bottomless deposition of barrier layers in integrated circuit metallization schemes Dec. 16, 2003
6656846 Apparatus for processing samples Dec. 2, 2003
6645869 Etching back process to improve topographic planarization of a polysilicon layer Nov. 11, 2003
6642148 RELACS shrink method applied for single print resist mask for LDD or buried bitline implants using chemically amplified DUV type photoresist Nov. 4, 2003
6635590 Apparatus and method for in-situ removal of polymer residue Oct. 21, 2003
6627553 Composition for removing side wall and method of removing side wall Sep. 30, 2003
6627548 Process for treating semiconductor substrates Sep. 30, 2003
6617252 Monolithic low dielectric constant platform for passive components and method Sep. 9, 2003
6617085 Wet etch reduction of gate widths Sep. 9, 2003
6613681 Method of removing etch residues Sep. 2, 2003

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