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Class Information
Number: 438/700
Name: Semiconductor device manufacturing: process > Chemical etching > Combined with coating step > Formation of groove or trench
Description: Processes wherein at least one groove or trench is formed by a combination of chemical etching and material deposition.


Sub-classes under this class:

Class Number Class Name Patents
438/702 Plural coating steps 633
438/701 Tapered configuration 490


Patents under this class:

Patent Number Title Of Patent Date Issued
6977227 Method of etching bottle trench and fabricating capacitor with same Dec. 20, 2005
6974756 Methods of forming shallow trench isolation Dec. 13, 2005
6974770 Self-aligned mask to reduce cell layout area Dec. 13, 2005
6974772 Integrated low-k hard mask Dec. 13, 2005
6972240 Forming of close thin trenches Dec. 6, 2005
6972241 Method of forming an STI feature to avoid electrical charge leakage Dec. 6, 2005
6972258 Method for selectively controlling damascene CD bias Dec. 6, 2005
6972259 Method for forming openings in low dielectric constant material layer Dec. 6, 2005
6972260 Method of fabricating flash memory cell Dec. 6, 2005
6969683 Method of preventing resist poisoning in dual damascene structures Nov. 29, 2005
6967146 Isolation region forming methods Nov. 22, 2005
6964899 Semiconductor device and method of manufacturing the same Nov. 15, 2005
6964910 Methods of forming conductive capacitor plug in a memory array Nov. 15, 2005
6964912 Method for fabricating a semiconductor structure Nov. 15, 2005
6964924 Integrated circuit process monitoring and metrology system Nov. 15, 2005
6964926 Method of forming geometric deep trench capacitors Nov. 15, 2005
6960529 Methods for sidewall protection of metal interconnect for unlanded vias using physical vapor deposition Nov. 1, 2005
6958276 Method of manufacturing trench-type MOSFET Oct. 25, 2005
6955988 Method of forming a cavity and SOI in a semiconductor substrate Oct. 18, 2005
6955989 Use of a U-groove as an alternative to using a V-groove for protection against dicing induced damage in silicon Oct. 18, 2005
6953752 Reduced silicon gouging and common source line resistance in semiconductor devices Oct. 11, 2005
6949430 Semiconductor processing methods Sep. 27, 2005
6949460 Line edge roughness reduction for trench etch Sep. 27, 2005
6949467 Forming method of contact in semiconductor device and manufacturing method of PMOS device using the same Sep. 27, 2005
6946390 Photolithographic production of trenches in a substrate Sep. 20, 2005
6943092 Methods of manufacturing semiconductor devices Sep. 13, 2005
6939805 Method of etching a layer in a trench and method of fabricating a trench capacitor Sep. 6, 2005
6939806 Etching memory Sep. 6, 2005
6940170 Techniques for triple and quadruple damascene fabrication Sep. 6, 2005
6936383 Method of defining the dimensions of circuit elements by using spacer deposition techniques Aug. 30, 2005
6936510 Semiconductor device with self-aligned contact and its manufacture Aug. 30, 2005
6936541 Method for planarizing metal interconnects Aug. 30, 2005
6933237 Substrate etch method and device Aug. 23, 2005
6933238 Method for manufacturing semiconductor device Aug. 23, 2005
6930027 Method of manufacturing a semiconductor component Aug. 16, 2005
6930038 Dual damascene partial gap fill polymer fabrication process Aug. 16, 2005
6930052 Method for producing an integrated circuit having at least one metalicized surface Aug. 16, 2005
6927138 Method of semiconductor device fabrication Aug. 9, 2005
6927160 Fabrication of copper-containing region such as electrical interconnect Aug. 9, 2005
6927169 Method and apparatus to improve thickness uniformity of surfaces for integrated device manufacturing Aug. 9, 2005
6927174 Site-specific method for large area uniform thickness plan view transmission electron microscopy sample preparation Aug. 9, 2005
6924230 Method for forming a conductive layer Aug. 2, 2005
6921699 Method for manufacturing a semiconductor device with a trench termination Jul. 26, 2005
6919255 Semiconductor trench structure Jul. 19, 2005
6919277 Deliberate semiconductor film variation to compensate for radial processing differences, determine optimal device characteristics, or produce small productions Jul. 19, 2005
6916737 Methods of manufacturing a semiconductor device Jul. 12, 2005
6916743 Semiconductor device and method for manufacturing thereof Jul. 12, 2005
6916744 Method and apparatus for planarization of a material by growing a sacrificial film with customized thickness profile Jul. 12, 2005
6916745 Structure and method for forming a trench MOSFET having self-aligned features Jul. 12, 2005
6913871 Fabricating sub-resolution structures in planar lightwave devices Jul. 5, 2005



 
 
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