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Class Information
Number: 438/695
Name: Semiconductor device manufacturing: process > Chemical etching > Combined with coating step > Simultaneous etching and coating
Description: Processes wherein the chemical etching and material deposition occur concurrently.


Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
6737286 Apparatus and method for fabricating arrays of atomic-scale contacts and gaps between electrodes and applications thereof May. 18, 2004
6737349 Method of forming a copper wiring in a semiconductor device May. 18, 2004
6734105 Method for forming silicon quantum dots and method for fabricating nonvolatile memory device using the same May. 11, 2004
6730605 Redistribution of copper deposited films May. 4, 2004
6727158 Structure and method for forming a faceted opening and a layer filling therein Apr. 27, 2004
6709987 Method and apparatus for forming improved metal interconnects Mar. 23, 2004
6699795 Gate etch process Mar. 2, 2004
6699792 Polymer spacers for creating small geometry space and method of manufacture thereof Mar. 2, 2004
6685847 Method for observing cross-sectional structure of sample Feb. 3, 2004
6686322 Cleaning agent and cleaning process using the same Feb. 3, 2004
6686285 Semiconductor device manufacture method preventing dishing and erosion during chemical mechanical polishing Feb. 3, 2004
6653058 Methods for reducing profile variation in photoresist trimming Nov. 25, 2003
6638872 Integration of monocrystalline oxide devices with fully depleted CMOS on non-silicon substrates Oct. 28, 2003
6627548 Process for treating semiconductor substrates Sep. 30, 2003
6624076 Semiconductor device and method for fabricating the same Sep. 23, 2003
6620575 Construction of built-up structures on the surface of patterned masking used for polysilicon etch Sep. 16, 2003
6613678 Process for manufacturing a semiconductor substrate as well as a semiconductor thin film, and multilayer structure Sep. 2, 2003
6605526 Wirebond passivation pad connection using heated capillary Aug. 12, 2003
6599437 Method of etching organic antireflection coating (ARC) layers Jul. 29, 2003
6589864 Method for defining windows with different etching depths simultaneously Jul. 8, 2003
6583060 Dual depth trench isolation Jun. 24, 2003
6579808 Method of fabricating a semiconductor device Jun. 17, 2003
6576563 Method of manufacturing a semiconductor device employing a fluorine-based etch substantially free of hydrogen Jun. 10, 2003
6562720 Apparatus and method for surface finishing a silicon film May. 13, 2003
6559057 Semiconductor processing methods of forming a conductive projection and methods of increasing alignment tolerances May. 6, 2003
6555476 Silicon carbide as a stop layer in chemical mechanical polishing for isolation dielectric Apr. 29, 2003
6551915 Thermal annealing/hydrogen containing plasma method for forming structurally stable low contact resistance damascene conductor structure Apr. 22, 2003
6537923 Process for forming integrated circuit structure with low dielectric constant material between closely spaced apart metal lines Mar. 25, 2003
6534409 Silicon oxide co-deposition/etching process Mar. 18, 2003
6531067 Method for forming contact hole Mar. 11, 2003
6531412 Method for low temperature chemical vapor deposition of low-k films using selected cyclosiloxane and ozone gases for semiconductor applications Mar. 11, 2003
6531068 Method of anisotropic etching of silicon Mar. 11, 2003
6528427 Methods for reducing contamination of semiconductor substrates Mar. 4, 2003
6521538 Method of forming a trench with a rounded bottom in a semiconductor device Feb. 18, 2003
6521507 Selective deposition of undoped silicon film seeded in chlorine and hydride gas for a stacked capacitor Feb. 18, 2003
6511915 Electrochemical etching process Jan. 28, 2003
6500351 Process for producing magnetic recording head poles utilizing sputtered materials and a recording head made thereby Dec. 31, 2002
6498104 Method of in-situ cleaning for LPCVD TEOS pump Dec. 24, 2002
6498091 Method of using a barrier sputter reactor to remove an underlying barrier layer Dec. 24, 2002
6489244 Fuse, memory incorporating same and method Dec. 3, 2002
6489247 Copper etch using HCl and HBR chemistry Dec. 3, 2002
6479388 Methods of forming materials over uneven surface topologies, and methods of forming insulative materials over and between conductive lines Nov. 12, 2002
6472324 Method of manufacturing trench type element isolation structure Oct. 29, 2002
6465345 Prevention of inter-channel current leakage in semiconductors Oct. 15, 2002
6465159 Method and apparatus for side wall passivation for organic etch Oct. 15, 2002
6461966 Method of high density plasma phosphosilicate glass process on pre-metal dielectric application for plasma damage reducing and throughput improvement Oct. 8, 2002
6458655 Method of manufacturing semiconductor device and flash memory Oct. 1, 2002
6455399 Smoothing method for cleaved films made using thermal treatment Sep. 24, 2002
6451700 Method and apparatus for measuring planarity of a polished layer Sep. 17, 2002
6451698 System and method for preventing electrochemical erosion by depositing a protective film Sep. 17, 2002

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