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Class Information
Number: 438/692
Name: Semiconductor device manufacturing: process > Chemical etching > Combined with the removal of material by nonchemical means (e.g., ablating, abrading, etc.) > Combined mechanical and chemical material removal > Simultaneous (e.g., chemical-mechanical polishing, etc.)
Description: Processes wherein the chemical and mechanical material removal processes are concurrent.


Sub-classes under this class:

Class Number Class Name Patents
438/693 Utilizing particulate abradant 865


Patents under this class:

Patent Number Title Of Patent Date Issued
7091164 Slurry for chemical mechanical polishing silicon dioxide Aug. 15, 2006
7087187 Meta oxide coated carbon black for CMP Aug. 8, 2006
7087188 Abrasives for chemical mechanical polishing Aug. 8, 2006
7087527 Extended kalman filter incorporating offline metrology Aug. 8, 2006
7087528 Chemical-mechanical polishing (CMP) process for shallow trench isolation Aug. 8, 2006
7087529 Chemical-mechanical polishing (CMP) slurry and method of planarizing surfaces Aug. 8, 2006
7087562 Post-CMP washing liquid composition Aug. 8, 2006
7083989 Thin-film magnetic head and method of forming the same Aug. 1, 2006
7084097 Cleaning solution for substrates of electronic materials Aug. 1, 2006
7081380 Method of forming a conductive pattern of a semiconductor device and method of manufacturing a non-volatile semiconductor memory device using the same Jul. 25, 2006
7081410 Controlling threading dislocation densities in Ge on Si using graded GeSi layers and planarization Jul. 25, 2006
7081417 Manufacturing method for electronic device and multiple layer circuits thereof Jul. 25, 2006
7077727 Process for chemical-mechanical polishing of metal substrates Jul. 18, 2006
7078239 Integrated circuit structure formed by damascene process Jul. 18, 2006
7078343 Method of manufacturing compound semiconductor wafer Jul. 18, 2006
7078344 Stress free etch processing in combination with a dynamic liquid meniscus Jul. 18, 2006
7074664 Dual metal gate electrode semiconductor fabrication process and structure thereof Jul. 11, 2006
7074725 Method for forming a storage node of a capacitor Jul. 11, 2006
7071054 Methods of fabricating MIM capacitors in semiconductor devices Jul. 4, 2006
7071074 Structure and method for placement, sizing and shaping of dummy structures Jul. 4, 2006
7071105 Method of polishing a silicon-containing dielectric Jul. 4, 2006
7071106 Method for CMP removal rate compensation Jul. 4, 2006
7071108 Chemical mechanical polishing slurry containing abrasive particles exhibiting photocatalytic function Jul. 4, 2006
7071109 Methods for fabricating spatial light modulators with hidden comb actuators Jul. 4, 2006
7067425 Method of manufacturing flash memory device Jun. 27, 2006
7067428 Method for cleaning polysilicon Jun. 27, 2006
7067465 Cleaning composition useful in semiconductor integrated circuit fabricating Jun. 27, 2006
7067466 Cleaning composition useful in semiconductor integrated circuit fabrication Jun. 27, 2006
7064063 Photo-thermal induced diffusion Jun. 20, 2006
7064070 Removal of CMP and post-CMP residue from semiconductors using supercritical carbon dioxide process Jun. 20, 2006
7060197 Micromechanical mass flow sensor and method for the production thereof Jun. 13, 2006
7060606 Method and apparatus for chemical mechanical polishing of semiconductor substrates Jun. 13, 2006
7060618 Semiconductor device, method for manufacturing the same, and plating solution Jun. 13, 2006
7060620 Method of preparing a surface of a semiconductor wafer to make it epiready Jun. 13, 2006
7060621 Slurry for CMP, polishing method and method of manufacturing semiconductor device Jun. 13, 2006
7056811 Method for manufacturing semiconductor device Jun. 6, 2006
7056829 Polishing composition for semiconductor wafers Jun. 6, 2006
7056872 Solution composition for removing a remaining photoresist resin Jun. 6, 2006
7052522 Polishing composition and polishing method using the same May. 30, 2006
7052620 Polishing slurry for aluminum-based metal, and method of manufacturing semiconductor device May. 30, 2006
7052969 Method for semiconductor wafer planarization by isolation material growth May. 30, 2006
7052994 Method for manufacturing semiconductor device, and processing system and semiconductor device May. 30, 2006
7052995 Process of manufacturing semiconductor device including chemical-mechanical polishing May. 30, 2006
7052996 Electrochemically polishing conductive films on semiconductor wafers May. 30, 2006
7049237 Methods for planarization of Group VIII metal-containing surfaces using oxidizing gases May. 23, 2006
7049238 Method for fabricating semiconductor device having recess May. 23, 2006
7049239 STI structure and fabricating methods thereof May. 23, 2006
7045450 Method of manufacturing semiconductor device May. 16, 2006
7040967 Multi-step, in-situ pad conditioning system and method for chemical mechanical planarization May. 9, 2006
7041599 High through-put Cu CMP with significantly reduced erosion and dishing May. 9, 2006



 
 
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