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Class Information
Number: 438/690
Name: Semiconductor device manufacturing: process > Chemical etching > Combined with the removal of material by nonchemical means (e.g., ablating, abrading, etc.)
Description: Processes wherein the chemical removal is accompanied by the removal, either concurrently or consecutively, of material by nonchemical means.


Sub-classes under this class:

Class Number Class Name Patents
438/691 Combined mechanical and chemical material removal 729


Patents under this class:
1 2 3 4 5 6 7 8 9 10

Patent Number Title Of Patent Date Issued
6884709 Connecting member between wiring films, manufacturing method thereof, and manufacturing method of multilayer wiring substrate Apr. 26, 2005
6884721 Silicon wafer storage water and silicon wafer storage method Apr. 26, 2005
6869889 Etching metal carbide films Mar. 22, 2005
6858482 Method of manufacture of programmable switching circuits and memory cells employing a glass layer Feb. 22, 2005
6855567 Etch endpoint detection Feb. 15, 2005
6855035 Apparatus and method for producing substrate with electrical wire thereon Feb. 15, 2005
6852629 Backside integrated circuit die surface finishing technique and tool Feb. 8, 2005
6852633 Method for operating chemical mechanical polishing ("CMP") tool for the manufacture of semiconductor devices Feb. 8, 2005
6847092 Microelectronic capacitor structure with radial current flow Jan. 25, 2005
6841479 Method of reducing in-trench smearing during polishing Jan. 11, 2005
6835118 Rigid plate assembly with polishing pad and method of using Dec. 28, 2004
6833109 Method and apparatus for storing a semiconductor wafer after its CMP polishing Dec. 21, 2004
6827866 Deep-well lithography process for forming micro-electro-mechanical structures Dec. 7, 2004
6821794 Flexible snapshot in endpoint detection Nov. 23, 2004
6821893 Method of manufacturing a substrate for information recording media Nov. 23, 2004
6815309 Support-integrated donor wafers for repeated thin donor layer separation Nov. 9, 2004
6812147 GCIB processing to improve interconnection vias and improved interconnection via Nov. 2, 2004
6809031 Method for manufacturing a reclaimable test pattern wafer for CMP applications Oct. 26, 2004
6808645 Susceptor and surface processing method Oct. 26, 2004
6800495 Lot-optimized wafer level burn-in Oct. 5, 2004
6796883 Controlled lubricated finishing Sep. 28, 2004
6797625 Method of forming a protective step on the edge of a semiconductor wafer Sep. 28, 2004
6797624 Solution for ruthenium chemical mechanical planarization Sep. 28, 2004
6793830 Method for forming a microstructure from a monocrystalline substrate Sep. 21, 2004
6790747 Method and device for controlled cleaving process Sep. 14, 2004
6790779 Anisotropic dry etching technique for deep bulk silicon etching Sep. 14, 2004
6787470 Sacrificial feature for corrosion prevention during CMP Sep. 7, 2004
6780772 Method and system to provide electroplanarization of a workpiece with a conducting material layer Aug. 24, 2004
6780756 Etch back of interconnect dielectrics Aug. 24, 2004
6780771 Forming a substantially planar upper surface at the outer edge of a semiconductor topography Aug. 24, 2004
6776852 Process of removing holefill residue from a metallic surface of an electronic substrate Aug. 17, 2004
6776696 Continuous chemical mechanical polishing process for polishing multiple conductive and non-conductive layers on semiconductor wafers Aug. 17, 2004
6773933 Method of boosting wafer cleaning efficiency and increasing process yield Aug. 10, 2004
6762124 Method for patterning a multilayered conductor/substrate structure Jul. 13, 2004
6762116 System and method for fabricating microcomponent parts on a substrate having pre-fabricated electronic circuitry thereon Jul. 13, 2004
6753256 Method of manufacturing semiconductor wafer Jun. 22, 2004
6743698 Semiconductor wafer, method for producing the same, and wafer chuck Jun. 1, 2004
6743722 Method of spin etching wafers with an alkali solution Jun. 1, 2004
6740588 Smooth metal semiconductor surface and method for making the same May. 25, 2004
6740569 Method of fabricating polysilicon film by excimer laser annealing process May. 25, 2004
6730602 Method for forming aluminum bumps by sputtering and chemical mechanical polishing May. 4, 2004
6720263 Planarization of metal layers on a semiconductor wafer through non-contact de-plating and control with endpoint detection Apr. 13, 2004
6719916 Multilayer microstructures and laser based method for precision and reduced damage patterning of such structures Apr. 13, 2004
6716754 Methods of forming patterns and molds for semiconductor constructions Apr. 6, 2004
6716755 Composition and method for planarizing surfaces Apr. 6, 2004
6706632 Methods for forming capacitor structures; and methods for removal of organic materials Mar. 16, 2004
6703286 Metal bond pad for low-k inter metal dielectric Mar. 9, 2004
6692978 Methods for marking a bare semiconductor die Feb. 17, 2004
6693033 Method of removing an amorphous oxide from a monocrystalline surface Feb. 17, 2004
6692580 Method of cleaning a dual damascene structure Feb. 17, 2004

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