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Class Information
Number: 438/672
Name: Semiconductor device manufacturing: process > Coating with electrically or thermally conductive material > To form ohmic contact to semiconductive material > And patterning of conductive layer > Plug formation (i.e., in viahole)
Description: Processes wherein the patterning step results in the remaining conductive material being recessed below the top surface of the substrate.










Patents under this class:
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Patent Number Title Of Patent Date Issued
7071098 Methods of fabricating interconnects for semiconductor components including a through hole entirely through the component and forming a metal nitride including separate precursor cycles Jul. 4, 2006
7071101 Sacrificial TiN arc layer for increased pad etch throughput Jul. 4, 2006
7071104 Laser alignment target Jul. 4, 2006
7071563 Barrier layer for interconnect structures of a semiconductor wafer and method for depositing the barrier layer Jul. 4, 2006
7067417 Methods of removing resistive remnants from contact holes using silicidation Jun. 27, 2006
7064064 Copper recess process with application to selective capping and electroless plating Jun. 20, 2006
RE39126 Two-step chemical mechanical polishing process for producing flush and protruding tungsten plugs Jun. 13, 2006
7056813 Methods of forming backside connections on a wafer stack Jun. 6, 2006
7052949 Method for forming bit line May. 30, 2006
7052989 Semiconductor device having opening and method of fabricating the same May. 30, 2006
7052990 Sealed pores in low-k material damascene conductive structures May. 30, 2006
7052992 Tungsten plug corrosion prevention method using ionized air May. 30, 2006
7052999 Method for fabricating semiconductor device May. 30, 2006
7049230 Method of forming a contact plug in a semiconductor device May. 23, 2006
7045379 Method of manufacturing surface shape recognition sensor May. 16, 2006
7041541 Method for producing a semiconductor component, and semiconductor component produced by the same May. 9, 2006
7041592 Method for forming a metal interconnection layer of a semiconductor device using a modified dual damascene process May. 9, 2006
7041597 Semiconductor device having void free contact and method for fabricating the contact May. 9, 2006
7037825 Damascene method capable of avoiding copper extrusion May. 2, 2006
7038289 Deep insulating trench May. 2, 2006
7033929 Dual damascene interconnect structure with improved electro migration lifetimes Apr. 25, 2006
7033934 Method of production of semiconductor package Apr. 25, 2006
7030006 Method for forming contact hole and spacer of semiconductor device Apr. 18, 2006
7030016 Post ECP multi-step anneal/H2 treatment to reduce film impurity Apr. 18, 2006
7026236 Method of forming multilayer interconnection structure, method of manufacturing circuit board, and method of manufacturing device Apr. 11, 2006
7026239 Method for making an anisotropic conductive polymer film on a semiconductor wafer Apr. 11, 2006
7019402 Silicon chip carrier with through-vias using laser assisted chemical vapor deposition of conductor Mar. 28, 2006
7015110 Method and structure of manufacturing high capacitance metal on insulator capacitors in copper Mar. 21, 2006
7015133 Dual damascene structure formed of low-k dielectric materials Mar. 21, 2006
7015137 Semiconductor device with reduced interconnection capacity Mar. 21, 2006
7012002 Semiconductor memory device and method for fabricating the same Mar. 14, 2006
7012017 Partially etched dielectric film with conductive features Mar. 14, 2006
7005375 Method to avoid copper contamination of a via or dual damascene structure Feb. 28, 2006
6998338 Method of producing an integrated circuit configuration Feb. 14, 2006
6998344 Method for fabricating semiconductor components by forming conductive members using solder Feb. 14, 2006
6995085 Underlayer protection for the dual damascene etching Feb. 7, 2006
6991981 Processing methods of forming an electrically conductive plug to a node location Jan. 31, 2006
6989282 Control of liner thickness for improving thermal cycle reliability Jan. 24, 2006
6989313 Metal-insulator-metal capacitor and method for manufacturing the same Jan. 24, 2006
6984555 Device and method for inhibiting oxidation of contact plugs in ferroelectric capacitor devices Jan. 10, 2006
6979638 Conducting wire and contact opening forming method for reducing photoresist thickness and via resistance Dec. 27, 2005
6977197 Semiconductor devices having DRAM cells and methods of fabricating the same Dec. 20, 2005
6974771 Methods and apparatus for forming barrier layers in high aspect ratio vias Dec. 13, 2005
6974774 Methods of forming a contact opening in a semiconductor assembly using a disposable hard mask Dec. 13, 2005
6969674 Structure and method for fine pitch flip chip substrate Nov. 29, 2005
6967152 Multilevel electronic circuit and method of making the same Nov. 22, 2005
6967161 Method and resulting structure for fabricating DRAM cell structure using oxide line spacer Nov. 22, 2005
6964874 Void formation monitoring in a damascene process Nov. 15, 2005
6964921 Method for forming bit line of flash device Nov. 15, 2005
6962867 Methods of fabrication of semiconductor dice having back side redistribution layer accessed using through-silicon vias and assemblies thereof Nov. 8, 2005

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