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Class Information
Number: 438/634
Name: Semiconductor device manufacturing: process > Coating with electrically or thermally conductive material > To form ohmic contact to semiconductive material > Contacting multiple semiconductive regions (i.e., interconnects) > Multiple metal levels, separated by insulating layer (i.e., multiple level metallization) > Having planarization step > Utilizing etch-stop layer
Description: Processes wherein the planarization step is conducted utilizing an etch stop layer to limit the extent of a material removal operation.


Patents under this class:
1 2 3 4 5 6 7 8 9 10

Patent Number Title Of Patent Date Issued
7602032 Memory having cap structure for magnetoresistive junction and method for structuring the same Oct. 13, 2009
7601610 Method for manufacturing a high integration density power MOS device Oct. 13, 2009
7557034 Semiconductor device and a method of manufacturing the same Jul. 7, 2009
7553758 Method of fabricating interconnections of microelectronic device using dual damascene process Jun. 30, 2009
7553759 Semiconductor device and method of manufacturing a semiconductor device Jun. 30, 2009
7544617 Die scale control of chemical mechanical polishing Jun. 9, 2009
7538025 Dual damascene process flow for porous low-k materials May. 26, 2009
7534642 Methods of manufacturing an image device May. 19, 2009
7534711 System and method for direct etching May. 19, 2009
7531448 Manufacturing method of dual damascene structure May. 12, 2009
7524752 Method of manufacturing semiconductor device Apr. 28, 2009
7524757 Method for manufacturing multi-level transistor comprising forming selective epitaxial growth layer Apr. 28, 2009
7521357 Methods of forming metal wiring in semiconductor devices using etch stop layers Apr. 21, 2009
7521348 Method of fabricating semiconductor device having fine contact holes Apr. 21, 2009
7507657 Method for fabricating storage node contact in semiconductor device Mar. 24, 2009
7504287 Methods for fabricating an integrated circuit Mar. 17, 2009
7476612 Method for manufacturing semiconductor device Jan. 13, 2009
7459396 Method for thin film deposition using multi-tray film precursor evaporation system Dec. 2, 2008
7435682 Method of manufacturing semiconductor device Oct. 14, 2008
7364924 Silicon phosphor electroluminescence device with nanotip electrode Apr. 29, 2008
7361587 Semiconductor contact and nitride spacer formation system and method Apr. 22, 2008
7361605 System and method for removal of photoresist and residues following contact etch with a stop layer present Apr. 22, 2008
7354855 Semiconductor device and a method of manufacturing the same Apr. 8, 2008
7351635 Method of fabricating microelectronic device using super critical fluid Apr. 1, 2008
7341937 Semiconductor device and method of manufacturing same Mar. 11, 2008
7335598 Chemical-mechanical polishing method Feb. 26, 2008
7335584 Method of using SACVD deposition and corresponding deposition reactor Feb. 26, 2008
7326645 Methods for forming copper interconnect of semiconductor devices Feb. 5, 2008
7300840 MIM capacitor structure and fabricating method thereof Nov. 27, 2007
7291553 Method for forming dual damascene with improved etch profiles Nov. 6, 2007
7288476 Controlled dry etch of a film Oct. 30, 2007
7282447 Method for an integrated circuit contact Oct. 16, 2007
7279410 Method for forming inlaid structures for IC interconnections Oct. 9, 2007
7271087 Dual damascene interconnection in semiconductor device and method for forming the same Sep. 18, 2007
7262120 Method for fabricating metal line in semiconductor device Aug. 28, 2007
7256502 Metal interconnections for semiconductor devices including a buffer layer on a trench sidewall Aug. 14, 2007
7253097 Integrated circuit system using dual damascene process Aug. 7, 2007
7235478 Polymer spacer formation Jun. 26, 2007
7229911 Adhesion improvement for low k dielectrics to conductive materials Jun. 12, 2007
7223685 Damascene fabrication with electrochemical layer removal May. 29, 2007
7214609 Methods for forming single damascene via or trench cavities and for forming dual damascene via cavities May. 8, 2007
7202157 Method for forming metallic interconnects in semiconductor devices Apr. 10, 2007
7183195 Method of fabricating dual damascene interconnections of microelectronic device using hybrid low k-dielectric and carbon-free inorganic filler Feb. 27, 2007
7179732 Interconnection structure and fabrication method thereof Feb. 20, 2007
7176122 Dielectric with sidewall passivating layer Feb. 13, 2007
7172960 Multi-layer film stack for extinction of substrate reflections during patterning Feb. 6, 2007
7172908 Magnetic memory cells and manufacturing methods Feb. 6, 2007
7163890 Methods of fabricating semiconductor device having slope at lower sides of interconnection hole with etch-stop layer Jan. 16, 2007
7163881 Method for forming CMOS structure with void-free dielectric film Jan. 16, 2007
7157366 Method of forming metal interconnection layer of semiconductor device Jan. 2, 2007

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