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Class Information
Number: 438/629
Name: Semiconductor device manufacturing: process > Coating with electrically or thermally conductive material > To form ohmic contact to semiconductive material > Contacting multiple semiconductive regions (i.e., interconnects) > Multiple metal levels, separated by insulating layer (i.e., multiple level metallization) > At least one metallization level formed of diverse conductive layers > Diverse conductive layers limited to viahole/plug
Description: Processes wherein the diverse conductive layers of a metallization level are limited in lateral extent to the viahole or plug extending through an insulating layer.


Sub-classes under this class:

Class Number Class Name Patents
438/630 Silicide formation 245


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

Patent Number Title Of Patent Date Issued
7622381 Semiconductor structure and the forming method thereof Nov. 24, 2009
7618888 Temperature-controlled metallic dry-fill process Nov. 17, 2009
RE40983 Method to plate C4 to copper stud Nov. 17, 2009
7608535 Method for forming metal contact in semiconductor device Oct. 27, 2009
7605072 Interconnect structure with a barrier-redundancy feature Oct. 20, 2009
7605075 Multilayer circuit board and method of manufacturing the same Oct. 20, 2009
7605035 Method of fabricating semiconductor device by exposing upper sidewalls of contact plug to form charge storage electrode Oct. 20, 2009
7601630 Semiconductor device and method for fabricating the same Oct. 13, 2009
7601634 Process for producing a contact pad on a region of an integrated circuit, in particular on the electrodes of a transistor Oct. 13, 2009
7592703 RF and MMIC stackable micro-modules Sep. 22, 2009
7588960 Nanotube device structure and methods of fabrication Sep. 15, 2009
7589016 Method of depositing a sculptured copper seed layer Sep. 15, 2009
7585770 Method of growing carbon nanotubes and method of manufacturing field emission device having the same Sep. 8, 2009
7585723 Method for fabricating capacitor Sep. 8, 2009
7582558 Reducing corrosion in copper damascene processes Sep. 1, 2009
7569479 Method for fabricating semiconductor device Aug. 4, 2009
7566646 Three dimensional programmable device and method for fabricating the same Jul. 28, 2009
7566653 Interconnect structure with grain growth promotion layer and method for forming the same Jul. 28, 2009
7560307 Resin composition, heat-resistant resin paste and semiconductor device using these and method of preparing the same Jul. 14, 2009
7557450 Wiring substrate and electronic parts packaging structure Jul. 7, 2009
7544605 Method of making a contact on a backside of a die Jun. 9, 2009
7545045 Dummy via for reducing proximity effect and method of using the same Jun. 9, 2009
7541276 Methods for forming dual damascene wiring for semiconductor devices using protective via capping layer Jun. 2, 2009
7541279 Method for manufacturing semiconductor device Jun. 2, 2009
7538027 Fabrication method for semiconductor interconnections May. 26, 2009
7538413 Semiconductor components having through interconnects May. 26, 2009
7534722 Back-to-front via process May. 19, 2009
7524756 Process of forming a semiconductor assembly having a contact structure and contact liner Apr. 28, 2009
7517792 Semiconductor device having a multilayer interconnection structure, fabrication method thereof, and designing method thereof Apr. 14, 2009
7514297 Methods for a multiple die integrated circuit package Apr. 7, 2009
7514353 Contact metallization scheme using a barrier layer over a silicide layer Apr. 7, 2009
7514354 Methods for forming damascene wiring structures having line and plug conductors formed from different materials Apr. 7, 2009
7510961 Utilization of energy absorbing layer to improve metal flow and fill in a novel interconnect structure Mar. 31, 2009
7504334 Semiconductor device and method for manufacturing same Mar. 17, 2009
7498258 Through-hole conductors for semiconductor substrates and method for making same Mar. 3, 2009
7498256 Copper contact via structure using hybrid barrier layer Mar. 3, 2009
7494917 Method for forming an electrical interconnection providing improved surface morphology of tungsten Feb. 24, 2009
7494919 Method for post lithographic critical dimension shrinking using thermal reflow process Feb. 24, 2009
7494920 Method of fabricating a vertically mountable IC package Feb. 24, 2009
7494925 Method for making through-hole conductors for semiconductor substrates Feb. 24, 2009
7494927 Method of growing electrical conductors Feb. 24, 2009
7482264 Method of forming metal line of semiconductor device, and semiconductor device Jan. 27, 2009
7476963 Three-dimensional stack manufacture for integrated circuit devices and method of manufacture Jan. 13, 2009
7473634 Method for integrated substrate processing in copper metallization Jan. 6, 2009
7473639 Method of forming dual damascene pattern Jan. 6, 2009
7468318 Method for manufacturing mold type semiconductor device Dec. 23, 2008
7465652 Method of forming a catalyst layer on the barrier layer of a conductive interconnect of a semiconductor device Dec. 16, 2008
7466027 Interconnect structures with surfaces roughness improving liner and methods for fabricating the same Dec. 16, 2008
7462523 Semiconductor memory device and method for manufacturing the same Dec. 9, 2008
7456094 LDMOS transistor Nov. 25, 2008

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