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Class Information
Number: 438/600
Name: Semiconductor device manufacturing: process > Coating with electrically or thermally conductive material > To form ohmic contact to semiconductive material > Selectively interconnecting (e.g., customization, wafer scale integration, etc.) > Using structure alterable to conductive state (i.e., antifuse)
Description: Processes for making an electrical interconnect structure which is alterable to a conductive state.










Patents under this class:
1 2 3 4 5 6 7

Patent Number Title Of Patent Date Issued
8709931 Fuse part in semiconductor device and method for forming the same Apr. 29, 2014
8689163 Semiconductor apparatus capable of error revision using pin extension technique and design method therefor Apr. 1, 2014
8674476 Anti-fuse device structure and electroplating circuit structure and method Mar. 18, 2014
8610243 Metal e-fuse with intermetallic compound programming mechanism and methods of making same Dec. 17, 2013
8610245 Anti-fuse element without defective opens Dec. 17, 2013
8530319 Vertical silicide e-fuse Sep. 10, 2013
8507326 BEOL anti-fuse structures for gate last semiconductor devices Aug. 13, 2013
8501591 Method for manufacturing a multiple-bit-per-cell memory Aug. 6, 2013
8476157 Buried bit line anti-fuse one-time-programmable nonvolatile memory Jul. 2, 2013
8471356 Programmable anti-fuse structures with conductive material islands Jun. 25, 2013
8399959 Programmable poly fuse Mar. 19, 2013
8368069 Antifuse structure for in line circuit modification Feb. 5, 2013
8367484 Antifuse structure for in line circuit modification Feb. 5, 2013
8367483 Antifuse structure for in line circuit modification Feb. 5, 2013
8361887 Method of programming electrical antifuse Jan. 29, 2013
8339844 Programmable vias for structured ASICs Dec. 25, 2012
8329514 Methods for forming antifuses with curved breakdown regions Dec. 11, 2012
8298905 Method for forming functional element using metal-to-insulator transition material, functional element formed by method, method for producing functional device, and functional device produced Oct. 30, 2012
8278155 Reprogrammable fuse structure and method Oct. 2, 2012
8247905 Formation of vertical devices by electroplating Aug. 21, 2012
8242578 Anti-fuse device structure and electroplating circuit structure and method Aug. 14, 2012
8236655 Fuse link structures using film stress for programming and methods of manufacture Aug. 7, 2012
8193074 Integration of damascene type diodes and conductive wires for memory device Jun. 5, 2012
8178945 Programmable PN anti-fuse May. 15, 2012
8148251 Forming a semiconductor device Apr. 3, 2012
8115275 Electrical antifuse Feb. 14, 2012
8043966 Method for monitoring patterning integrity of etched openings and forming conductive structures with the openings Oct. 25, 2011
8030181 Electrical fuse circuit for security applications Oct. 4, 2011
8030736 Fin anti-fuse with reduced programming voltage Oct. 4, 2011
8022503 Anti-fusse structure and method of fabricating the same Sep. 20, 2011
8008669 Programmable anti-fuse structure with DLC dielectric layer Aug. 30, 2011
7982285 Antifuse structure having an integrated heating element Jul. 19, 2011
7981731 Method of forming a high impedance antifuse Jul. 19, 2011
7943515 Shared masks for x-lines and shared masks for y-lines for fabrication of 3D memory arrays May. 17, 2011
7940593 Method and apparatus for verification of a gate oxide fuse element May. 10, 2011
7935621 Anti-fuse device structure and electroplating circuit structure and method May. 3, 2011
7927995 Adopting feature of buried electrically conductive layer in dielectrics for electrical anti-fuse application Apr. 19, 2011
7919363 Integrated circuit with additional mini-pads connected by an under-bump metallization and method for production thereof Apr. 5, 2011
7915093 System and method for manufacturing an integrated circuit anti-fuse in conjunction with a tungsten plug process Mar. 29, 2011
7915095 Silicide-silicon oxide-semiconductor antifuse device and method of making Mar. 29, 2011
7911025 Fuse/anti-fuse structure and methods of making and programming same Mar. 22, 2011
7892926 Fuse link structures using film stress for programming and methods of manufacture Feb. 22, 2011
7888255 Method of forming an antifuse and a conductive interconnect, and methods of forming DRAM circuitry Feb. 15, 2011
7833843 Method for forming a memory cell comprising a semiconductor junction diode crystallized adjacent to a silicide Nov. 16, 2010
7820492 Electrical fuse with metal silicide pipe under gate electrode Oct. 26, 2010
7790517 Method of manufacturing semiconductor device Sep. 7, 2010
7790518 Method of trimming semiconductor elements with electrical resistance feedback Sep. 7, 2010
7786000 Buried bit line anti-fuse one-time-programmable nonvolatile memory Aug. 31, 2010
7713857 Methods of forming an antifuse and a conductive interconnect, and methods of forming DRAM circuitry May. 11, 2010
7691684 Fin-type antifuse Apr. 6, 2010

1 2 3 4 5 6 7










 
 
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