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Class Information
Number: 438/469
Name: Semiconductor device manufacturing: process > Direct application of electrical current > Utilizing pulsed current
Description: Process wherein the electrical current is presented in periodic surges.

Patents under this class:

Patent Number Title Of Patent Date Issued
8575008 Post-fabrication self-aligned initialization of integrated devices Nov. 5, 2013
8445362 Apparatus and method for programming an electronically programmable semiconductor fuse May. 21, 2013
8404568 Systems and methods for fabricating an out-of-plane MEMS structure Mar. 26, 2013
8389990 Nonvolatile semiconductor memory device and manufacturing method thereof Mar. 5, 2013
8253136 Nonvolatile semiconductor memory device and manufacturing method thereof Aug. 28, 2012
8105869 Method of manufacturing a silicon-based semiconductor device by essentially electrical means Jan. 31, 2012
8048761 Fabricating method for crack stop structure enhancement of integrated circuit seal ring Nov. 1, 2011
7977141 Solid-state image pickup device and method of manufacturing the same Jul. 12, 2011
7888240 Method of forming phase change memory devices in a pulsed DC deposition chamber Feb. 15, 2011
7884345 Phase-change material, memory unit and method for electrically storing/reading data Feb. 8, 2011
7851870 Monolithically integrated semiconductor assembly having a power component and method for producing a monolithically integrated semiconductor assembly Dec. 14, 2010
7772047 Method of fabricating a semiconductor die having a redistribution layer Aug. 10, 2010
7723200 Electrically tunable resistor and related methods May. 25, 2010
7671444 Empty vias for electromigration during electronic-fuse re-programming Mar. 2, 2010
7611928 Method for producing a substrate Nov. 3, 2009
7195989 Electrochemical fabrication methods using transfer plating of masks Mar. 27, 2007
7148127 Device mounting substrate and method of repairing defective device Dec. 12, 2006
7135387 Method of manufacturing semiconductor element Nov. 14, 2006
6969618 SOI device having increased reliability and reduced free floating body effects Nov. 29, 2005
6680227 Non-volatile memory device and fabrication method thereof Jan. 20, 2004
6645826 Semiconductor device and method of fabricating the same Nov. 11, 2003
6623992 System and method for determining a subthreshold leakage test limit of an integrated circuit Sep. 23, 2003
6620707 Heat conductor, especially for a sensor, and method for producing such a heat conductor Sep. 16, 2003
6358758 Low imprint ferroelectric material for long retention memory and method of making the same Mar. 19, 2002
6306692 Coplanar type polysilicon thin film transistor and method of manufacturing the same Oct. 23, 2001
6180495 Silicon carbide transistor and method therefor Jan. 30, 2001
6171934 Recovery of electronic properties in process-damaged ferroelectrics by voltage-cycling Jan. 9, 2001
6069024 Method for producing a semiconductor device May. 30, 2000
5914189 Protected thermal barrier coating composite with multiple coatings Jun. 22, 1999
5753540 Apparatus and method for programming antifuse structures May. 19, 1998
5679275 Circuit and method of modifying characteristics of a utilization circuit Oct. 21, 1997
5559058 Method for producing native oxides on compound semiconductors Sep. 24, 1996
5466484 Resistor structure and method of setting a resistance value Nov. 14, 1995
5466484 Resistor structure and method of setting a resistance value Nov. 14, 1995
5445718 Electrochemical etch-stop on n-type silicon by injecting holes from a shallow p-type layer Aug. 29, 1995
5429984 Method of discharge processing of semiconductor Jul. 4, 1995
5360981 Amorphous silicon memory Nov. 1, 1994
5126282 Methods of reducing anti-fuse resistance during programming Jun. 30, 1992
4874711 Method for altering characteristics of active semiconductor devices Oct. 17, 1989
4820657 Method for altering characteristics of junction semiconductor devices Apr. 11, 1989
4570332 Method of forming contact to thin film semiconductor device Feb. 18, 1986
4400256 Method of making layered semiconductor laser Aug. 23, 1983
4360964 Nondestructive testing of semiconductor materials Nov. 30, 1982

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