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Class Information
Number: 438/468
Name: Semiconductor device manufacturing: process > Direct application of electrical current > Electromigration
Description: Process involving the movement of atoms (usually dopant atoms) under the influence of an electric field.










Patents under this class:
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Patent Number Title Of Patent Date Issued
8709858 Tailoring the band gap of solar cells made of liquid silane by adding germanium Apr. 29, 2014
8704041 Methods and compositions for targeted polynucleotide modification Apr. 22, 2014
8704210 Boundary-modulated nanoparticle junctions and a method for manufacture thereof Apr. 22, 2014
8642376 Methods for depositing a material atop a substrate Feb. 4, 2014
8633092 Quantum well device Jan. 21, 2014
8575727 Gate structures Nov. 5, 2013
8575007 Selective electromigration improvement for high current C4s Nov. 5, 2013
8569116 Integrated circuit with a fin-based fuse, and related fabrication method Oct. 29, 2013
8569755 Secure anti-fuse with low voltage programming through localized diffusion heating Oct. 29, 2013
8445362 Apparatus and method for programming an electronically programmable semiconductor fuse May. 21, 2013
8436330 Electrically actuated devices May. 7, 2013
8410560 Electromigration reduction in micro-hotplates Apr. 2, 2013
8350264 Secure anti-fuse with low voltage programming through localized diffusion heating Jan. 8, 2013
8323990 Reliability test structure for multilevel interconnect Dec. 4, 2012
8278173 Method of fabricating gate structures Oct. 2, 2012
8089060 Non-volatile memory cell and fabrication method thereof Jan. 3, 2012
8040604 Imaging system and method for providing extended depth of focus, range extraction and super resolved imaging Oct. 18, 2011
7981771 Structures and methods to enhance Cu interconnect electromigration (EM) performance Jul. 19, 2011
7935630 Wiring structure and wiring designing method May. 3, 2011
7915144 Methods for forming thermotunnel generators having closely-spaced electrodes Mar. 29, 2011
7855098 Method of forming, modifying, or repairing a semiconductor device using field-controlled diffusion Dec. 21, 2010
7846816 Method for producing a multilayer structure comprising a separating layer Dec. 7, 2010
7838330 Method of field-controlled diffusion and devices formed thereby Nov. 23, 2010
7818655 Method for quantitative detection of multiple electromigration failure modes Oct. 19, 2010
7781827 Semiconductor device with a vertical MOSFET including a superlattice and related methods Aug. 24, 2010
7772047 Method of fabricating a semiconductor die having a redistribution layer Aug. 10, 2010
7741147 Method of field-controlled diffusion and devices formed thereby Jun. 22, 2010
7671444 Empty vias for electromigration during electronic-fuse re-programming Mar. 2, 2010
7646549 Imaging system and method for providing extended depth of focus, range extraction and super resolved imaging Jan. 12, 2010
7589257 Genes for enhancing nitrogen utilization efficiency in crop plants Sep. 15, 2009
7465661 High aspect ratio microelectrode arrays Dec. 16, 2008
7301239 Wiring structure to minimize stress induced void formation Nov. 27, 2007
7232771 Method and apparatus for depositing charge and/or nanoparticles Jun. 19, 2007
7148105 Method for forming polysilicon floating gate Dec. 12, 2006
7026225 Semiconductor component and method for precluding stress-induced void formation in the semiconductor component Apr. 11, 2006
6933591 Electrically-programmable integrated circuit fuses and sensing circuits Aug. 23, 2005
6881594 Method of using scatterometry for analysis of electromigration, and structures for performing same Apr. 19, 2005
6881261 Method for fabricating semiconductor device Apr. 19, 2005
6867056 System and method for current-enhanced stress-migration testing of interconnect Mar. 15, 2005
6844245 Method of preparing a self-passivating Cu laser fuse Jan. 18, 2005
6784000 Method for measurement of electromigration in semiconductor integrated circuits Aug. 31, 2004
6777314 Method of forming electrolytic contact pads including layers of copper, nickel, and gold Aug. 17, 2004
6756258 Method of manufacturing a semiconductor device Jun. 29, 2004
6624499 System for programming fuse structure by electromigration of silicide enhanced by creating temperature gradient Sep. 23, 2003
6593213 Synthesis of layers, coatings or films using electrostatic fields Jul. 15, 2003
6548377 Method for forming a line of semiconductor device Apr. 15, 2003
6513000 Simulation method of wiring temperature rise Jan. 28, 2003
6417053 Fabrication method for a silicon nitride read-only memory Jul. 9, 2002
6362079 Semiconductor device and method of anodization for the semiconductor device Mar. 26, 2002
6306732 Method and apparatus for simultaneously improving the electromigration reliability and resistance of damascene vias using a controlled diffusivity barrier Oct. 23, 2001

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