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Class Information
Number: 438/287
Name: Semiconductor device manufacturing: process > Making field effect device having pair of active regions separated by gate structure by formation or alteration of semiconductive active regions > Having insulated gate (e.g., igfet, misfet, mosfet, etc.) > Gate insulator structure constructed of diverse dielectrics (e.g., mnos, etc.) or of nonsilicon compound
Description: Process for making an insulated gate field effect transistor wherein the gate dielectric insulator is constructed of plural diverse dielectrics (e.g., nitride and oxide, etc.) or of a nonsilicon containing dielectric compound.










Patents under this class:

Patent Number Title Of Patent Date Issued
8709902 Sacrificial spacer approach for differential source/drain implantation spacers in transistors comprising a high-k metal gate electrode structure Apr. 29, 2014
8704205 Semiconductor structure with improved capacitance of bit line Apr. 22, 2014
8703567 Method for manufacturing a semiconductor device Apr. 22, 2014
8692312 Semiconductor memory device and method of manufacturing the same Apr. 8, 2014
8692311 Method for manufacturing semiconductor device Apr. 8, 2014
8692229 Replacement contacts for all-around contacts Apr. 8, 2014
8691645 Method of manufacturing convex shaped thin-film transistor device Apr. 8, 2014
8691643 Methods of forming semiconductor devices Apr. 8, 2014
8686490 Electron blocking layers for electronic devices Apr. 1, 2014
8679920 Semiconductor devices having stacked structures and a layer formed thereon tapered in direction opposite of a tapering of the stacked structures and methods of fabricating the same Mar. 25, 2014
8674457 Methods to reduce gate contact resistance for AC reff reduction Mar. 18, 2014
8673721 Three-dimensional semiconductor memory device and method for manufacturing the same Mar. 18, 2014
8659090 Resistive memory and methods for forming the same Feb. 25, 2014
8659071 Method and structure to improve the erasing speed operation of SONOS memory device having a graded silicon nitride layer Feb. 25, 2014
8658503 Semiconductor device and method of fabricating the same Feb. 25, 2014
8658501 Method and apparatus for flatband voltage tuning of high-k field effect transistors Feb. 25, 2014
8658490 Passivating point defects in high-K gate dielectric layers during gate stack formation Feb. 25, 2014
8652890 Methods for fabricating integrated circuits with narrow, metal filled openings Feb. 18, 2014
8637921 Nitridation oxidation of tunneling layer for improved SONOS speed and retention Jan. 28, 2014
8633534 Transistor channel mobility using alternate gate dielectric materials Jan. 21, 2014
8633118 Method of forming thin metal and semi-metal layers by thermal remote oxygen scavenging Jan. 21, 2014
8633098 Method of manufacturing a semiconductor device Jan. 21, 2014
8633079 Method for fabricating a SONOS memory Jan. 21, 2014
8629028 Metal oxide semiconductor field effect transistor (MOSFET) gate termination Jan. 14, 2014
8629025 Semiconductor device and method for fabricating semiconductor device Jan. 14, 2014
8629022 Asymmetric FET including sloped threshold voltage adjusting material layer and method of fabricating same Jan. 14, 2014
8629007 Method of improving replacement metal gate fill Jan. 14, 2014
8618534 Field-effect transistor with a dielectric layer having therein denatured albumen Dec. 31, 2013
8617954 Formation of nitrogen containing dielectric layers having an improved nitrogen distribution Dec. 31, 2013
8610200 Nitride read only memory device with buried diffusion spacers and method for making the same Dec. 17, 2013
8609510 Replacement metal gate diffusion break formation Dec. 17, 2013
8609496 Method of fabricating semiconductor device comprising a dummy well Dec. 17, 2013
8598002 Method for manufacturing metal gate stack structure in gate-first process Dec. 3, 2013
8598001 Method for manufacturing twin bit structure cell with hafnium oxide and nano-crystalline silicon layer Dec. 3, 2013
8592891 Methods for fabricating semiconductor memory with process induced strain Nov. 26, 2013
8592308 Silicided device with shallow impurity regions at interface between silicide and stressed liner Nov. 26, 2013
8586430 Method of forming dielectric film and capacitor manufacturing method using the same Nov. 19, 2013
8580639 Method of making ultrahigh density vertical NAND memory device Nov. 12, 2013
8575675 Nonvolatile memory device Nov. 5, 2013
8575012 Semiconductor device production method and semiconductor device Nov. 5, 2013
8574982 Implementing eDRAM stacked FET structure Nov. 5, 2013
8564067 Silicon-on-insulator (SOI) structure configured for reduced harmonics and method of forming the structure Oct. 22, 2013
8563383 Method of manufacturing a semiconductor device Oct. 22, 2013
8557651 Method of manufacturing a semiconductor device using an etchant Oct. 15, 2013
8557624 Pixel sensor cells with a split-dielectric transfer gate Oct. 15, 2013
8552523 Semiconductor device and method for manufacturing Oct. 8, 2013
8551842 Method of manufacturing semiconductor device Oct. 8, 2013
8551832 Method for manufacturing semiconductor device Oct. 8, 2013
8546226 SONOS non-volatile memory cell and fabricating method thereof Oct. 1, 2013
8546225 Method for manufacturing semiconductor device Oct. 1, 2013











 
 
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