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Class Information
Number: 438/19
Name: Semiconductor device manufacturing: process > Having integral power source (e.g., battery, etc.)
Description: Process for making a semiconductor electrical device having therewith an integral structure capable of chemically or radioactively generating electrical power.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7517709 |
Method of forming backside point contact structures for silicon solar cells |
Apr. 14, 2009 |
| RE40137 |
Methods for forming integrated circuits within substrates |
Mar. 4, 2008 |
| 7332363 |
Integrated battery pack with lead frame connection |
Feb. 19, 2008 |
| 7230321 |
Integrated circuit package with laminated power cell having coplanar electrode |
Jun. 12, 2007 |
| 7217582 |
Method for non-damaging charge injection and a system thereof |
May. 15, 2007 |
| 7205165 |
Method for determining the reliability of dielectric layers |
Apr. 17, 2007 |
| 7176543 |
Method of eliminating curl for devices on thin flexible substrates, and devices made thereby |
Feb. 13, 2007 |
| 7160741 |
Planar voltage contrast test structure and method |
Jan. 9, 2007 |
| 7138284 |
Method and apparatus for performing whole wafer burn-in |
Nov. 21, 2006 |
| 7125730 |
Power supply, a semiconductor making apparatus and a semiconductor wafer fabricating method using the same |
Oct. 24, 2006 |
| 7076375 |
Apparatus and method for incorporating the use of a processing device into a battery charger and tester |
Jul. 11, 2006 |
| 7045372 |
Apparatus and method for forming a battery in an integrated circuit |
May. 16, 2006 |
| 7023097 |
FBGA arrangement |
Apr. 4, 2006 |
| 7002215 |
Floating entrance guard for preventing electrical short circuits |
Feb. 21, 2006 |
| 6897571 |
Method for sawing wafers employing multiple indexing techniques for multiple die dimensions |
May. 24, 2005 |
| 6833281 |
On-chip substrate regulator test mode |
Dec. 21, 2004 |
| 6830940 |
Method and apparatus for performing whole wafer burn-in |
Dec. 14, 2004 |
| 6756242 |
Method of modifying an integrated circuit |
Jun. 29, 2004 |
| 6673657 |
Kill index analysis for automatic defect classification in semiconductor wafers |
Jan. 6, 2004 |
| 6650000 |
Apparatus and method for forming a battery in an integrated circuit |
Nov. 18, 2003 |
| 6608259 |
Ground plane for a semiconductor chip |
Aug. 19, 2003 |
| 6514781 |
Maintaining the state of a MEMS device in the event of a power failure |
Feb. 4, 2003 |
| 6391664 |
Selectively activatable solar cells for integrated circuit analysis |
May. 21, 2002 |
| 6344366 |
Fabrication of highly textured lithium cobalt oxide films by rapid thermal annealing |
Feb. 5, 2002 |
| 6329213 |
Methods for forming integrated circuits within substrates |
Dec. 11, 2001 |
| 6184048 |
Testing method and apparatus assuring semiconductor device quality and reliability |
Feb. 6, 2001 |
| 6159757 |
Process for producing a solar battery and a sheet material for protective covering thereof |
Dec. 12, 2000 |
| 6117697 |
Solid state magnetic field sensor method |
Sep. 12, 2000 |
| 6096569 |
Method of and apparatus for manufacturing thin solar battery |
Aug. 1, 2000 |
| 5787174 |
Remote identification of integrated circuit |
Jul. 28, 1998 |
| 5604162 |
Process of preparing tritiated porous silicon |
Feb. 18, 1997 |
| 5403782 |
Surface mountable integrated circuit package with integrated battery mount |
Apr. 4, 1995 |
| 5196374 |
Integrated circuit package with molded cell |
Mar. 23, 1993 |
| 5100821 |
Semiconductor AC switch |
Mar. 31, 1992 |
| 4323420 |
Process for manufacture of inertial confinement fusion targets and resulting product |
Apr. 6, 1982 |
| 4024420 |
Deep diode atomic battery |
May. 17, 1977 |
| 4010534 |
Process for making a deep diode atomic battery |
Mar. 8, 1977 |
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