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Class Information
Number: 438/17
Name: Semiconductor device manufacturing: process > With measuring or testing > Electrical characteristic sensed
Description: Process wherein the sensed condition is an electrical characteristic of the process or of the device made thereby.

Sub-classes under this class:

Class Number Class Name Patents
438/18 Utilizing integral test element 865

Patents under this class:

Patent Number Title Of Patent Date Issued
8712571 Method and apparatus for wireless transmission of diagnostic information Apr. 29, 2014
8710859 Method for testing multi-chip stacked packages Apr. 29, 2014
8709834 Methods of fabricating semiconductor device Apr. 29, 2014
8709833 Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variations Apr. 29, 2014
8709832 Chip on film (COF) package having test line for testing electrical function of chip and method for manufacturing same Apr. 29, 2014
8704224 Semiconductor test structures Apr. 22, 2014
8692367 Wafer-level packaged device having self-assembled resilient leads Apr. 8, 2014
8691684 Layout and pad floor plan of power transistor for good performance of SPU and STOG Apr. 8, 2014
8691600 Method for testing through-silicon-via (TSV) structures Apr. 8, 2014
8691599 Parameter extraction method for semiconductor device Apr. 8, 2014
8686750 Method for evaluating semiconductor device Apr. 1, 2014
8683406 Method of defining shape and position of dummy active region by processing data using a patterning apparatus Mar. 25, 2014
8680881 Test method and interposer used therefor Mar. 25, 2014
8674355 Integrated circuit test units with integrated physical and electrical test regions Mar. 18, 2014
8669497 Apparatus and method for predictive temperature correction during thermal processing Mar. 11, 2014
8664014 High productivity combinatorial workflow for photoresist strip applications Mar. 4, 2014
8658438 Measurement of lateral diffusion of implanted ions in doped well region of semiconductor devices Feb. 25, 2014
8658437 Package method for electronic components by thin substrate Feb. 25, 2014
8654191 Defect inspection device and defect inspection method for silicon wafer Feb. 18, 2014
8650002 Determining plasma processing system readiness without generating plasma Feb. 11, 2014
8647894 Method for generating graphene structures Feb. 11, 2014
8637944 Multifunctional nanoscopy for imaging cells Jan. 28, 2014
8637328 Integrated circuit having doped semiconductor body and method Jan. 28, 2014
8633038 Manufacturing method of semiconductor integrated circuit device Jan. 21, 2014
8629435 Methods of extracting fin heights and overlap capacitance and structures for performing the same Jan. 14, 2014
8614108 Electronic device having thermally managed electron path and method of thermal management of very cold electrons Dec. 24, 2013
8614105 Production flow and reusable testing method Dec. 24, 2013
8609473 Method for fabricating a neo-layer using stud bumped bare die Dec. 17, 2013
8604568 Multi-chip package Dec. 10, 2013
8603839 In-line metrology system Dec. 10, 2013
8587037 Test structure to monitor the in-situ channel temperature of field effect transistors Nov. 19, 2013
8586983 Semiconductor chip embedded with a test circuit Nov. 19, 2013
8575007 Selective electromigration improvement for high current C4s Nov. 5, 2013
8546904 Integrated circuit with temperature increasing element and electronic system having the same Oct. 1, 2013
8546168 Method and apparatus for detecting nucleotides Oct. 1, 2013
8546153 Resin dispensing apparatus for light emitting device package and method of manufacturing light emitting device package using the same Oct. 1, 2013
8535957 Dopant metrology with information feedforward and feedback Sep. 17, 2013
8535956 Chip attach frame Sep. 17, 2013
8530246 Method for controlling threshold voltage of semiconductor element Sep. 10, 2013
8525169 Reliable physical unclonable function for device authentication Sep. 3, 2013
8524513 Measuring floating body voltage in silicon-on-insulator (SOI) metal-oxide-semiconductor-field-effect-transistor (MOSFET) Sep. 3, 2013
8519724 Electrode for use in measuring dielectric properties of parts Aug. 27, 2013
8519388 Embedded structure for passivation integrity testing Aug. 27, 2013
8518723 Method of fabricating semiconductor integrated circuit device Aug. 27, 2013
8518721 Dopant marker for precise recess control Aug. 27, 2013
8513971 Zener diode detecting circuit Aug. 20, 2013
8513042 Method of forming an electromechanical transducer device Aug. 20, 2013
8513033 Method, design apparatus, and design program of semiconductor device, and semiconductor device Aug. 20, 2013
8507297 Packaging and testing of multiple MEMS devices on a wafer Aug. 13, 2013
8502553 Semiconductor package test apparatus Aug. 6, 2013

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