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Class Information
Number: 438/12
Name: Semiconductor device manufacturing: process > Including control responsive to sensed condition > Electrical characteristic sensed > And removal of defect
Description: Process wherein a defect detected by the electrical sensing step is thereafter removed.

Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
8679862 Method and device for manufacturing thin film photoelectric conversion module Mar. 25, 2014
8673657 Semiconductor device including a circuit area and a monitor area having a plurality of monitor layers and method for manufacturing the same Mar. 18, 2014
8532395 Pattern inspection method and semiconductor device manufacturing method Sep. 10, 2013
8494817 Methods for yield variability benchmarking, assessment, quantification, and localization Jul. 23, 2013
8481341 Epitaxial film growth in retrograde wells for semiconductor devices Jul. 9, 2013
8445906 Method for sorting and acquiring semiconductor element, method for producing semiconductor device, and semiconductor device May. 21, 2013
8383429 Method and apparatus for thermal treatment of semiconductor workpieces Feb. 26, 2013
8378698 Integrated circuit testing apparatus and method Feb. 19, 2013
8349623 Method and apparatus for manufacturing thin film photoelectric conversion module Jan. 8, 2013
8344520 Stacked structure of chips Jan. 1, 2013
8304791 Nitride-based semiconductor light emitting device and methods of manufacturing the same Nov. 6, 2012
8193006 Method of chip repair by stacking a plurality of bad dies Jun. 5, 2012
8137995 Double-sided semiconductor device and method of forming top-side and bottom-side interconnect structures Mar. 20, 2012
8111902 Method and apparatus for inspecting defects of circuit patterns Feb. 7, 2012
8092268 Repairing methods of pixel structure and organic electro-luminescence displaying unit Jan. 10, 2012
8053898 Connection for off-chip electrostatic discharge protection Nov. 8, 2011
8000928 Methods and apparatus for data analysis Aug. 16, 2011
7993938 Highly doped III-nitride semiconductors Aug. 9, 2011
7985671 Structures and methods for improving solder bump connections in semiconductor devices Jul. 26, 2011
7981700 Semiconductor oxidation apparatus and method of producing semiconductor element Jul. 19, 2011
7944047 Method and structure of expanding, upgrading, or fixing multi-chip package May. 17, 2011
7935549 Seminconductor device May. 3, 2011
7927892 Thermal treatment apparatus, thermal treatment method and method of manufacturing semiconductor device Apr. 19, 2011
7901951 Thin film transistor array substrate and method for fabricating same Mar. 8, 2011
7844857 Writing data processing control apparatus, writing method, and writing apparatus Nov. 30, 2010
7807480 Test cells for semiconductor yield improvement Oct. 5, 2010
7795046 Method and apparatus for monitoring endcap pullback Sep. 14, 2010
7749778 Addressable hierarchical metal wire test methodology Jul. 6, 2010
7736915 Method for neutralizing trapped charge in a charge accumulation layer of a semiconductor structure Jun. 15, 2010
7687298 Microelectromechanical device with integrated conductive shield Mar. 30, 2010
7662672 Manufacturing process of leadframe-based BGA packages Feb. 16, 2010
7477773 Method for inspecting a pattern and method for manufacturing a semiconductor chip having a circuit pattern Jan. 13, 2009
7465977 Method for producing a packaged integrated circuit Dec. 16, 2008
7449348 Feedback control of imprint mask feature profile using scatterometry and spacer etchback Nov. 11, 2008
7421358 Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering Sep. 2, 2008
7399657 Ball grid array packages with thermally conductive containers Jul. 15, 2008
7396760 Method and system for reducing inter-layer capacitance in integrated circuits Jul. 8, 2008
7395518 Back end of line clone test vehicle Jul. 1, 2008
7384804 Method and apparatus for electronically aligning capacitively coupled mini-bars Jun. 10, 2008
7378288 Systems and methods for producing light emitting diode array May. 27, 2008
7378290 Isolation circuit May. 27, 2008
7338817 Body bias compensation for aged transistors Mar. 4, 2008
7236847 Systems and methods for closed loop defect reduction Jun. 26, 2007
7220603 Method for manufacturing display device and manufacturing apparatus May. 22, 2007
7214549 Correcting device, exposure apparatus, device production method, and device produced by the device production method May. 8, 2007
7153709 Method and apparatus for calibrating degradable components using process state data Dec. 26, 2006
7138282 Correcting device, exposure apparatus, device production method, and device produced by the device production method Nov. 21, 2006
7125729 Method for opening the plastic housing of an electronic module Oct. 24, 2006
7105877 Conductive line structure Sep. 12, 2006
7107158 Inspection system and apparatus Sep. 12, 2006

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