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Class Information
Number: 382/150
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Fault or defect detection > Faulty soldering
Description: Subject matter wherein means or process is provided for inspecting printed circuit board packages containing IC or other devices to identify defective or missing soldering or bonding points.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7539338 |
Bump inspection apparatus and method for IC component, bump forming method for IC component, and mounting method for IC component |
May. 26, 2009 |
| 7505149 |
Apparatus for surface inspection and method and apparatus for inspecting substrate |
Mar. 17, 2009 |
| 7471819 |
Position detecting apparatus, a position detecting method and an electronic component carrying apparatus |
Dec. 30, 2008 |
| 7450748 |
Mask inspection process accounting for mask writer proximity correction |
Nov. 11, 2008 |
| 7336816 |
Method and apparatus for measuring shape of bumps |
Feb. 26, 2008 |
| 7327870 |
Method for inspecting a region of interest |
Feb. 5, 2008 |
| 7308129 |
Characteristic amount calculating device for soldering inspection |
Dec. 11, 2007 |
| 7239740 |
Image processing apparatus and method, medium storing program for image processing, and inspection apparatus |
Jul. 3, 2007 |
| 7213447 |
Method and apparatus for detecting topographical features of microelectronic substrates |
May. 8, 2007 |
| 7159754 |
Apparatus and method for corrective soldering |
Jan. 9, 2007 |
| 7149344 |
Systems and methods for detecting defects in printed solder paste |
Dec. 12, 2006 |
| 7139421 |
Methods and apparatuses for detecting similar features within an image |
Nov. 21, 2006 |
| 7136714 |
Procedure for determining modifications made to an electronic card and methods of fabricating an electronic card and an item equipment provided with an electronic card |
Nov. 14, 2006 |
| 7079689 |
Image processing apparatus and its method, and program |
Jul. 18, 2006 |
| 7072503 |
Systems and methods for detecting defects in printed solder paste |
Jul. 4, 2006 |
| 7046377 |
Method for determining corresponding points in three-dimensional measurement |
May. 16, 2006 |
| 7027639 |
High speed optical image acquisition system with extended dynamic range |
Apr. 11, 2006 |
| 7019826 |
Optical inspection system, apparatus and method for reconstructing three-dimensional images for printed circuit board and electronics manufacturing inspection |
Mar. 28, 2006 |
| 7013038 |
Method for inspecting a BGA joint |
Mar. 14, 2006 |
| 6993193 |
Method and system of object classification employing dimension reduction |
Jan. 31, 2006 |
| 6947151 |
Surface state inspecting method and substrate inspecting apparatus |
Sep. 20, 2005 |
| 6923045 |
Method and apparatus for detecting topographical features of microelectronic substrates |
Aug. 2, 2005 |
| 6907824 |
Screen printing apparatus and method of the same |
Jun. 21, 2005 |
| 6895073 |
High-speed x-ray inspection apparatus and method |
May. 17, 2005 |
| 6891967 |
Systems and methods for detecting defects in printed solder paste |
May. 10, 2005 |
| 6787378 |
Method for measuring height of sphere or hemisphere |
Sep. 7, 2004 |
| 6779386 |
Method and apparatus for detecting topographical features of microelectronic substrates |
Aug. 24, 2004 |
| 6771805 |
Perspective viewing inspection system |
Aug. 3, 2004 |
| 6768812 |
Method for locating features on an object using varied illumination |
Jul. 27, 2004 |
| 6765666 |
System and method for inspecting bumped wafers |
Jul. 20, 2004 |
| 6738505 |
Method and apparatus for detecting solder paste deposits on substrates |
May. 18, 2004 |
| 6614926 |
Methods and apparatuses for generating from an image a model of an object |
Sep. 2, 2003 |
| 6608921 |
Inspection of solder bump lighted with rays of light intersecting at predetermined angle |
Aug. 19, 2003 |
| 6606402 |
System and method for in-line inspection of stencil aperture blockage |
Aug. 12, 2003 |
| 6549647 |
Inspection system with vibration resistant video capture |
Apr. 15, 2003 |
| 6529624 |
Apparatus for inspecting cream solder on PCB and method thereof |
Mar. 4, 2003 |
| 6516086 |
Method and apparatus for distinguishing regions where a material is present on a surface |
Feb. 4, 2003 |
| 6442291 |
Machine vision methods and articles of manufacture for ball grid array |
Aug. 27, 2002 |
| 6396942 |
Method and apparatus for locating ball grid array packages from two-dimensional image data |
May. 28, 2002 |
| 6385335 |
Apparatus and method for estimating background tilt and offset |
May. 7, 2002 |
| 6342266 |
Method for monitoring solder paste printing process |
Jan. 29, 2002 |
| 6330354 |
Method of analyzing visual inspection image data to find defects on a device |
Dec. 11, 2001 |
| 6289117 |
Analysis of an image of a pattern of discrete objects |
Sep. 11, 2001 |
| 6272204 |
Integrated X-ray and visual inspection systems |
Aug. 7, 2001 |
| 6249598 |
Solder testing apparatus |
Jun. 19, 2001 |
| 6177682 |
Inspection of ball grid arrays (BGA) by using shadow images of the solder balls |
Jan. 23, 2001 |
| 6167149 |
Inspecting apparatus of mounting state of component or printing state of cream solder in mounting line of electronic component |
Dec. 26, 2000 |
| 6151406 |
Method and apparatus for locating ball grid array packages from two-dimensional image data |
Nov. 21, 2000 |
| 6130959 |
Analyzing an image of an arrangement of discrete objects |
Oct. 10, 2000 |
| 6118893 |
Analysis of an image of a pattern of discrete objects |
Sep. 12, 2000 |
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