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Class Information
Number: 382/150
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Fault or defect detection > Faulty soldering
Description: Subject matter wherein means or process is provided for inspecting printed circuit board packages containing IC or other devices to identify defective or missing soldering or bonding points.

Patents under this class:
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Patent Number Title Of Patent Date Issued
8681211 High speed optical inspection system with adaptive focusing Mar. 25, 2014
8670031 High speed optical inspection system with camera array and compact, integrated illuminator Mar. 11, 2014
8670605 Identification method of data point distribution area on coordinate plane and recording medium Mar. 11, 2014
8659654 Image verification with tiered tolerance Feb. 25, 2014
8644590 Method of measuring measurement target Feb. 4, 2014
8611639 Semiconductor device property extraction, generation, visualization, and monitoring methods Dec. 17, 2013
8611636 High speed method of aligning components having a plurality of non-uniformly spaced features Dec. 17, 2013
8611669 Image processing apparatus, image processing method and computer-readable medium Dec. 17, 2013
8605986 Burr detecting apparatus and burr detection method thereof Dec. 10, 2013
8588510 Image processing apparatus and image processing method Nov. 19, 2013
8553970 System and method for generating spatial signatures Oct. 8, 2013
8538165 Image measuring apparatus, program, and teaching method of image measuring apparatus Sep. 17, 2013
8520077 Color-unevenness inspection apparatus and method Aug. 27, 2013
8428339 System and method for alignment and inspection of ball grid array devices Apr. 23, 2013
8421803 Information display system and information display method for quality control of component-mounted substrate Apr. 16, 2013
8358832 High accuracy beam placement for local area navigation Jan. 22, 2013
8300923 Process control method, data registration program, and method for manufacturing electronic device Oct. 30, 2012
8290239 Automatic repair of electric circuits Oct. 16, 2012
8264534 Method and apparatus for processing the image data of the surface of a wafer recorded by at least one camera Sep. 11, 2012
8264535 Method and apparatus for analyzing a group of photolithographic masks Sep. 11, 2012
8254661 System and method for generating spatial signatures Aug. 28, 2012
8184898 Analysis of leaded components May. 22, 2012
8144973 Multi-modal imaging Mar. 27, 2012
8131060 Process control method, data registration program, and method for manufacturing electronic device Mar. 6, 2012
8131061 Apparatus for inspecting solder printing Mar. 6, 2012
8036445 Pattern matching method, program and semiconductor device manufacturing method Oct. 11, 2011
8014587 Pattern test method of testing, in only specific region, defect of pattern on sample formed by charged beam lithography apparatus Sep. 6, 2011
7933452 System and methods of image retrieval Apr. 26, 2011
7894919 Fully automated paste dispense system for dispensing small dots and lines Feb. 22, 2011
7887874 Fully automated paste dispense system for dispensing small dots and lines Feb. 15, 2011
7865012 Semiconductor failure analysis apparatus which acquires a failure observed image, failure analysis method, and failure analysis program Jan. 4, 2011
7844103 Microscopic inspection apparatus for reducing image smear using a pulsed light source and a linear-periodic superpositioned scanning scheme to provide extended pulse duration, and methods usef Nov. 30, 2010
7844100 Method for filtering nuisance defects Nov. 30, 2010
7817847 Robot system with vision sensor Oct. 19, 2010
7801353 Method for defect detection using computer aided design data Sep. 21, 2010
7760930 Translation engine of defect pattern recognition Jul. 20, 2010
7751610 Image recognition method and image recognition apparatus Jul. 6, 2010
7715616 PC board inspecting method and apparatus and inspection logic setting method and apparatus May. 11, 2010
7664311 Component mounting board inspecting apparatus Feb. 16, 2010
7641099 Solder joint determination method, solder inspection method, and solder inspection device Jan. 5, 2010
7637413 X-ray inspection device and X-ray inspection method Dec. 29, 2009
7539338 Bump inspection apparatus and method for IC component, bump forming method for IC component, and mounting method for IC component May. 26, 2009
7505149 Apparatus for surface inspection and method and apparatus for inspecting substrate Mar. 17, 2009
7471819 Position detecting apparatus, a position detecting method and an electronic component carrying apparatus Dec. 30, 2008
7450748 Mask inspection process accounting for mask writer proximity correction Nov. 11, 2008
7336816 Method and apparatus for measuring shape of bumps Feb. 26, 2008
7327870 Method for inspecting a region of interest Feb. 5, 2008
7308129 Characteristic amount calculating device for soldering inspection Dec. 11, 2007
7239740 Image processing apparatus and method, medium storing program for image processing, and inspection apparatus Jul. 3, 2007
7213447 Method and apparatus for detecting topographical features of microelectronic substrates May. 8, 2007

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