Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Browse by Category: Main > Optical & Optics
Class Information
Number: 382/149
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Fault or defect detection
Description: Subject matter wherein a device is inspected for defects relating to dimensional tolerances, surface irregularities, etc.










Sub-classes under this class:

Class Number Class Name Patents
382/150 Faulty soldering 133


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

Patent Number Title Of Patent Date Issued
7693324 Optical surface inspection Apr. 6, 2010
7692144 Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus Apr. 6, 2010
7689020 Method for examining defect in prestressed tendon and apparatus therefor Mar. 30, 2010
7689029 Apparatus and method for inspecting pattern Mar. 30, 2010
7689030 Methods and apparatus for testing a component Mar. 30, 2010
7689948 System and method for model-based scoring and yield prediction Mar. 30, 2010
7676078 Inspection method, processor and method for manufacturing a semiconductor device Mar. 9, 2010
7664614 Method of inspecting photomask defect Feb. 16, 2010
7664608 Defect inspection method and apparatus Feb. 16, 2010
7664562 Automatic defect review and classification system Feb. 16, 2010
7664311 Component mounting board inspecting apparatus Feb. 16, 2010
7664308 Photomask inspection apparatus comparing optical proximity correction patterns to minimum and maximum limits Feb. 16, 2010
7657077 Detecting defects by three-way die-to-die comparison with false majority determination Feb. 2, 2010
7657078 Method and apparatus for reviewing defects Feb. 2, 2010
7652792 Virtual ink desk and method of using same Jan. 26, 2010
7650028 Vicinal light inspection of translucent materials Jan. 19, 2010
7647132 Method and system for problem case packaging Jan. 12, 2010
7646908 Defect detection apparatus and defect detection method Jan. 12, 2010
7646906 Computer-implemented methods for detecting defects in reticle design data Jan. 12, 2010
7643138 Method of inspecting a semiconductor device and an apparatus thereof Jan. 5, 2010
7643667 Image recording apparatus, and abnormal recording element determination method Jan. 5, 2010
7643668 Workpiece inspection apparatus, workpiece inspection method and computer-readable recording medium storing program Jan. 5, 2010
7639863 Die-to-database photomask defect detection using region data to modify inspection thresholds Dec. 29, 2009
7639860 Substrate inspection device Dec. 29, 2009
7636649 Automated process control of a fabrication tool using a dispersion function relating process parameter to dispersion Dec. 22, 2009
7632616 Controlling system and method for operating the same Dec. 15, 2009
7634131 Image recognition apparatus and image recognition method, and teaching apparatus and teaching method of the image recognition apparatus Dec. 15, 2009
7634151 Imaging systems, articles of manufacture, and imaging methods Dec. 15, 2009
7630535 Die-to-die photomask defect detection using region data to modify inspection thresholds Dec. 8, 2009
7626691 Apparatus and method for inspecting overlay patterns in semiconductor device Dec. 1, 2009
7627164 Pattern inspection method and apparatus with high-accuracy pattern image correction capability Dec. 1, 2009
7627165 Pattern inspection method and apparatus using linear predictive model-based image correction technique Dec. 1, 2009
7623698 Method of learning a knowledge-based database used in automatic defect classification Nov. 24, 2009
7623699 Apparatus and method for the automated marking of defects on webs of material Nov. 24, 2009
7618755 Method and system for automatically detecting exposed substrates having a high probability for defocused exposure fields Nov. 17, 2009
7620233 Process for checking a laser weld seam Nov. 17, 2009
7620503 Signal processing fault detection system Nov. 17, 2009
7616805 Pattern defect inspection method and apparatus Nov. 10, 2009
7609874 System and method for prediction of pitting corrosion growth Oct. 27, 2009
7602962 Method of classifying defects using multiple inspection machines Oct. 13, 2009
7602963 Method and apparatus for finding anomalies in finished parts and/or assemblies Oct. 13, 2009
7602964 Method and apparatus for detection of failures in a wafer using transforms and cluster signature analysis Oct. 13, 2009
7598490 SEM-type reviewing apparatus and a method for reviewing defects using the same Oct. 6, 2009
7598504 Writing error diagnosis method for charged particle beam photolithography apparatus and charged particle beam photolithography apparatus Oct. 6, 2009
7596423 Method and apparatus for verifying a site-dependent procedure Sep. 29, 2009
7596555 Fuzzy recipient and contact search for email workflow and groupware applications Sep. 29, 2009
7588870 Dual layer workpiece masking and manufacturing process Sep. 15, 2009
7584012 Automatic defect review and classification system Sep. 1, 2009
7583833 Method and apparatus for manufacturing data indexing Sep. 1, 2009
7577288 Sample inspection apparatus, image alignment method, and program-recorded readable recording medium Aug. 18, 2009

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20










 
 
  Recently Added Patents
Thermoforming sheet loading apparatus and method
Plants and seeds of hybrid corn variety CH979678
Method and apparatus for analysis of histopathology images and its application to cancer diagnosis and grading
Hybrid fin field-effect transistor structures and related methods
Presenting a link to a user
Methods and apparatus to perform time zone determination by a mobile station
Load balancing for parallel tasks
  Randomly Featured Patents
Panel arrangement
Foam molding assembly
Network device
Functionalized polymers and tires made therefrom
Particles, aqueous dispersion and film of titanium oxide, and preparation thereof
Printing apparatus with a cash drawer control function, and a control method therefor
Light emitting diode
Apparatus for selecting fixture conductors and method for rapidly wiring said fixtures
Measuring arrangement for detecting a 1/rotary momentum of an engine rotor, and associated method
Process and assembly for non-destructive surface inspections