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Browse by Category: Main > Optical & Optics
Class Information
Number: 382/149
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Fault or defect detection
Description: Subject matter wherein a device is inspected for defects relating to dimensional tolerances, surface irregularities, etc.










Sub-classes under this class:

Class Number Class Name Patents
382/150 Faulty soldering 133


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

Patent Number Title Of Patent Date Issued
8515156 Image analysis device and method Aug. 20, 2013
8515153 System and method of image processing, and scanning electron microscope Aug. 20, 2013
8509517 Method and system for systematic defect identification Aug. 13, 2013
8501376 System and method for test pattern for lithography process Aug. 6, 2013
8503756 System and method for verifying manufacturing consistency of manufactured items Aug. 6, 2013
8498470 Method and system for evaluating an object Jul. 30, 2013
8493628 Reproduction of images onto surfaces Jul. 23, 2013
8483859 Image processing device and image processing method Jul. 9, 2013
8483476 Photovoltaic cell manufacturing Jul. 9, 2013
8483442 Measurement apparatus, measurement method, and feature identification apparatus Jul. 9, 2013
8472695 Method and apparatus for failure analysis of semiconductor integrated circuit devices Jun. 25, 2013
8472073 Validation of a print verification system Jun. 25, 2013
8472696 Observation condition determination support device and observation condition determination support method Jun. 25, 2013
8472697 Method and apparatus for visual inspection Jun. 25, 2013
8473223 Method for utilizing fabrication defect of an article Jun. 25, 2013
8467595 Defect review system and method, and program Jun. 18, 2013
8467594 Method and apparatus for inspecting patterns formed on a substrate Jun. 18, 2013
8467592 Substrate media distortion analysis Jun. 18, 2013
8461527 Scanning electron microscope and method for processing an image obtained by the scanning electron microscope Jun. 11, 2013
8452075 Range pattern matching for hotspots containing vias and incompletely specified range patterns May. 28, 2013
8452076 Defect classifier using classification recipe based on connection between rule-based and example-based classifiers May. 28, 2013
8452077 Method for imaging workpiece surfaces at high robot transfer speeds with correction of motion-induced distortion May. 28, 2013
RE44216 Microscope imaging system and method for emulating a high aperture imaging system, particularly for mask inspection May. 14, 2013
8437534 Defect classification method and apparatus, and defect inspection apparatus May. 7, 2013
8422761 Defect and critical dimension analysis systems and methods for a semiconductor lithographic process Apr. 16, 2013
8422759 Image processing method and image processing device Apr. 16, 2013
8421803 Information display system and information display method for quality control of component-mounted substrate Apr. 16, 2013
8417020 Method for detecting the line broken fault of common electrode lines of LCD Apr. 9, 2013
8410440 Specimen observation method Apr. 2, 2013
8406501 Method and system for inspection of tube width of heat exchanger Mar. 26, 2013
8395490 Blind spot display apparatus Mar. 12, 2013
8396281 Apparatus and method for inspecting substrate internal defects Mar. 12, 2013
8391588 Apparatus for examining pattern defects, a method thereof, and a computer-readable recording medium having recorded therein a program thereof Mar. 5, 2013
8392009 Advanced process control with novel sampling policy Mar. 5, 2013
8379965 Defect classification method, computer storage medium, and defect classification apparatus Feb. 19, 2013
8376549 Laser projection display and image distortion correction method for the same Feb. 19, 2013
8369603 Method for inspecting measurement object Feb. 5, 2013
8369651 Image processing apparatus and image processing program Feb. 5, 2013
8363922 IC layout pattern matching and classification system and method Jan. 29, 2013
8358831 Probe mark inspection Jan. 22, 2013
8358832 High accuracy beam placement for local area navigation Jan. 22, 2013
8355562 Pattern shape evaluation method Jan. 15, 2013
8355563 Photovoltaic devices inspection apparatus and method of determining defects in photovoltaic device Jan. 15, 2013
8351683 Inspection apparatus and inspection method Jan. 8, 2013
8345950 System and method for testing a multimeter Jan. 1, 2013
8346497 Method for testing semiconductor film, semiconductor device and manufacturing method thereof Jan. 1, 2013
8340395 Defect inspection method and apparatus therefor Dec. 25, 2012
8340396 Color trapping on a halftoned bi-level bitmap Dec. 25, 2012
8340457 Image analysis method, image analysis program and pixel evaluation system having the sames Dec. 25, 2012
8331651 Method and apparatus for inspecting defect of pattern formed on semiconductor device Dec. 11, 2012

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