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Browse by Category: Main > Optical & Optics
Class Information
Number: 382/149
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Fault or defect detection
Description: Subject matter wherein a device is inspected for defects relating to dimensional tolerances, surface irregularities, etc.










Sub-classes under this class:

Class Number Class Name Patents
382/150 Faulty soldering 133


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

Patent Number Title Of Patent Date Issued
6215896 System for enabling the real-time detection of focus-related defects Apr. 10, 2001
6208751 Cluster tool Mar. 27, 2001
6205239 System and method for circuit repair Mar. 20, 2001
6201892 System and method for arithmetic operations for electronic package inspection Mar. 13, 2001
6200823 Method for isolation of optical defect images Mar. 13, 2001
6195454 Component mounting apparatus Feb. 27, 2001
6192287 Method and apparatus for fault detection and control Feb. 20, 2001
6188785 Pattern inspecting apparatus and inspecting method Feb. 13, 2001
6188402 Manufacturing control station Feb. 13, 2001
6185324 Semiconductor failure analysis system Feb. 6, 2001
6175646 Apparatus for detecting defective integrated circuit dies in wafer form Jan. 16, 2001
6175645 Optical inspection method and apparatus Jan. 16, 2001
6174632 Wafer defect detection method utilizing wafer with development residue attracting area Jan. 16, 2001
6171737 Low cost application of oxide test wafer for defect monitor in photolithography process Jan. 9, 2001
6169282 Defect inspection method and apparatus therefor Jan. 2, 2001
6167150 Method and apparatus for detecting extended defects in an object Dec. 26, 2000
6163619 Method of image processing Dec. 19, 2000
6154561 Method and apparatus for detecting Mura defects Nov. 28, 2000
6148099 Method and apparatus for incremental concurrent learning in automatic semiconductor wafer and liquid crystal display defect classification Nov. 14, 2000
6148098 Method and apparatus for electro-optically determining the contact pattern on tooth flanks of gears Nov. 14, 2000
6128404 Method of detecting defects in semiconductor package leads Oct. 3, 2000
6122397 Method and apparatus for maskless semiconductor and liquid crystal display inspection Sep. 19, 2000
6111424 Testing method and apparatus for flat panel displays using infrared imaging Aug. 29, 2000
6111637 Apparatus and method for examining wafers Aug. 29, 2000
6091996 Printed circuit board analysis and repair system Jul. 18, 2000
6091846 Method and system for anomaly detection Jul. 18, 2000
6091847 Automated visual inspection apparatus for detecting defects and for measuring defect size Jul. 18, 2000
6087673 Method of inspecting pattern and apparatus thereof Jul. 11, 2000
6075883 Method and system for imaging an object or pattern Jun. 13, 2000
6072915 Process for pattern searching and a device for positioning of a mask to a workpiece Jun. 6, 2000
6072899 Method and device of inspecting three-dimensional shape defect Jun. 6, 2000
6072897 Dimension error detection in object Jun. 6, 2000
6072900 Automated visual inspection apparatus for detecting defects and for measuring defect size Jun. 6, 2000
6070160 Non-linear database set searching apparatus and method May. 30, 2000
6068955 Methods of inspecting for mask-defined, feature dimensional conformity between multiple masks May. 30, 2000
6070004 Method of maximizing chip yield for semiconductor wafers May. 30, 2000
6061086 Apparatus and method for automated visual inspection of objects May. 9, 2000
6061476 Method and apparatus using image subtraction and dynamic thresholding May. 9, 2000
6057068 Method for determining the efficiency of a planarization process May. 2, 2000
6052478 Automated photomask inspection apparatus Apr. 18, 2000
6051348 Method for detecting malfunction in photolithographic fabrication track Apr. 18, 2000
6028948 Surface anomaly-detection and analysis method Feb. 22, 2000
6028664 Method and system for establishing a common reference point on a semiconductor wafer inspected by two or more scanning mechanisms Feb. 22, 2000
6005966 Method and apparatus for multi-stream detection of high density metalization layers of multilayer structures having low contrast Dec. 21, 1999
6002792 Semiconductor device inspection system Dec. 14, 1999
5999003 Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification Dec. 7, 1999
5987161 Apparatus and method for identifying defective objects Nov. 16, 1999
5985497 Method for reducing defects in a semiconductor lithographic process Nov. 16, 1999
5982922 Pattern inspection apparatus and method Nov. 9, 1999
5970167 Integrated circuit failure analysis using color voltage contrast Oct. 19, 1999

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