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Browse by Category: Main > Optical & Optics
Class Information
Number: 382/149
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Fault or defect detection
Description: Subject matter wherein a device is inspected for defects relating to dimensional tolerances, surface irregularities, etc.










Sub-classes under this class:

Class Number Class Name Patents
382/150 Faulty soldering 133


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

Patent Number Title Of Patent Date Issued
6760473 Optical proximity correction serif measurement technique Jul. 6, 2004
6760472 Identification method for an article using crystal defects Jul. 6, 2004
6757421 Method and apparatus for detecting defects Jun. 29, 2004
6754593 Method and apparatus for measuring defects Jun. 22, 2004
6748103 Mechanisms for making and inspecting reticles Jun. 8, 2004
6748104 Methods and apparatus for machine vision inspection using single and multiple templates or patterns Jun. 8, 2004
6748124 Image processing device using line sensor Jun. 8, 2004
6741734 Appearance inspection method and appearance inspection apparatus having high inspection processing speed May. 25, 2004
6741733 Drawing pattern verifying method May. 25, 2004
6738504 Inspection apparatus for semiconductor device and parts mounter using same May. 18, 2004
6730444 Needle comb reticle pattern for critical dimension and registration measurements using a registration tool and methods for using same May. 4, 2004
6724929 Wafer inspecting apparatus Apr. 20, 2004
6721461 Method and apparatus using image subtraction and dynamic thresholding Apr. 13, 2004
6717142 Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same Apr. 6, 2004
6714670 Methods and apparatuses to determine the state of elements Mar. 30, 2004
6714671 Method of detecting pattern defects Mar. 30, 2004
6707936 Method and apparatus for predicting device yield from a semiconductor wafer Mar. 16, 2004
6701004 Detecting defects on photomasks Mar. 2, 2004
6697516 Method for inspecting the surface of a moving strip by prior classification of the detected surface irregularity Feb. 24, 2004
6697517 Particle detection and embedded vision system to enhance substrate yield and throughput Feb. 24, 2004
6697154 Microvia inspection system Feb. 24, 2004
6693278 Particle-optical inspection device especially for semiconductor wafers Feb. 17, 2004
6693664 Method and system for fast on-line electro-optical detection of wafer defects Feb. 17, 2004
6687397 System and method for dynamic image recognition Feb. 3, 2004
6684164 True defect monitoring through repeating defect deletion Jan. 27, 2004
6681038 Electronic assembly video inspection system Jan. 20, 2004
6674890 Defect inspection method and apparatus therefor Jan. 6, 2004
6674889 Pattern inspection method and pattern inspection apparatus Jan. 6, 2004
6671398 Method and apparatus for inspection of patterned semiconductor wafers Dec. 30, 2003
6656647 Method for examining structures on a wafer Dec. 2, 2003
6656648 Pattern inspection apparatus, pattern inspection method and mask manufacturing method Dec. 2, 2003
6658145 Fast high-accuracy multi-dimensional pattern inspection Dec. 2, 2003
6654488 Fill pattern inspection Nov. 25, 2003
6650769 Review station and appearance inspection device for checking semiconductor wafers Nov. 18, 2003
6650768 Using time resolved light emission from VLSI circuit devices for navigation on complex systems Nov. 18, 2003
6650770 System and method for creating a knowledge base Nov. 18, 2003
6642726 Apparatus and methods for reliable and efficient detection of voltage contrast defects Nov. 4, 2003
6643394 Visual inspection apparatus and method Nov. 4, 2003
6643395 Defect information processing apparatus and method Nov. 4, 2003
6636625 Optical member inspecting apparatus and method of inspection thereof Oct. 21, 2003
6636634 Systems and methods for locating a pattern in an image Oct. 21, 2003
6628817 Inspection data analyzing system Sep. 30, 2003
6629051 Defect inspection data processing system Sep. 30, 2003
6628818 Method for recognizing images of fine work pieces and pickup apparatus employing the method Sep. 30, 2003
6614923 Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof Sep. 2, 2003
6614925 System and method for performing basic training Sep. 2, 2003
6614924 Adaptive mask technique for defect inspection Sep. 2, 2003
6606739 Scaling method for a digital photolithography system Aug. 12, 2003
6603873 Defect detection using gray level signatures Aug. 5, 2003
6603874 Method and system for imaging an object or pattern Aug. 5, 2003

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