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Class Information
Number: 382/149
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Fault or defect detection
Description: Subject matter wherein a device is inspected for defects relating to dimensional tolerances, surface irregularities, etc.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 5717780 |
Checking apparatus for flat type display panels |
Feb. 10, 1998 |
| 5701362 |
Wire breakage detecting method |
Dec. 23, 1997 |
| 5686959 |
Image quality inspection system and image synthesis method |
Nov. 11, 1997 |
| 5672886 |
Surface inspection system for detecting various surface faults |
Sep. 30, 1997 |
| 5663569 |
Defect inspection method and apparatus, and defect display method |
Sep. 2, 1997 |
| 5659630 |
Advanced manufacturing inspection system |
Aug. 19, 1997 |
| 5641960 |
Circuit pattern inspecting device and method and circuit pattern arrangement suitable for the method |
Jun. 24, 1997 |
| 5631733 |
Large area defect monitor tool for manufacture of clean surfaces |
May. 20, 1997 |
| 5621813 |
Pattern recognition alignment system |
Apr. 15, 1997 |
| 5621811 |
Learning method and apparatus for detecting and controlling solder defects |
Apr. 15, 1997 |
| 5619588 |
Apparatus and method for comparing and aligning two digital representations of an image |
Apr. 8, 1997 |
| 5607800 |
Method and arrangement for characterizing micro-size patterns |
Mar. 4, 1997 |
| 5608816 |
Apparatus for inspecting a wiring pattern according to a micro-inspection and a macro-inspection performed in parallel |
Mar. 4, 1997 |
| 5574800 |
Pattern defect inspection method and apparatus |
Nov. 12, 1996 |
| 5570431 |
Process and apparatus for automatically characterizing, optimizing and checking a crack detection analysis method |
Oct. 29, 1996 |
| 5568564 |
Image processing apparatus and method for inspecting defects of enclosures of semiconductor devices |
Oct. 22, 1996 |
| 5568563 |
Method and apparatus of pattern recognition |
Oct. 22, 1996 |
| 5553158 |
Device for the data processing of linear images of generatrices of an article having an axis of revolution |
Sep. 3, 1996 |
| 5544256 |
Automated defect classification system |
Aug. 6, 1996 |
| 5541547 |
Test generator system for controllably inducing power pin latch-up and signal pin latch-up in a CMOS device |
Jul. 30, 1996 |
| 5539656 |
Crack monitoring apparatus |
Jul. 23, 1996 |
| 5528371 |
Measurement apparatus for measuring dimensions of semiconductor device and method of measuring the same |
Jun. 18, 1996 |
| 5513099 |
Circuit board repair and rework apparatus |
Apr. 30, 1996 |
| 5513275 |
Automated direct patterned wafer inspection |
Apr. 30, 1996 |
| 5459795 |
Wiring pattern inspection apparatus for printed circuit board |
Oct. 17, 1995 |
| 5455870 |
Apparatus and method for inspection of high component density printed circuit board |
Oct. 3, 1995 |
| 5331407 |
Method and apparatus for detecting a circuit pattern |
Jul. 19, 1994 |
| 5325443 |
Vision system for inspecting a part having a substantially flat reflective surface |
Jun. 28, 1994 |
| 5321767 |
Method of forming a mask in image processing operation |
Jun. 14, 1994 |
| 5311598 |
Method and apparatus for surface inspection |
May. 10, 1994 |
| 5309108 |
Method of inspecting thin film transistor liquid crystal substrate and apparatus therefor |
May. 3, 1994 |
| 5301129 |
Video web inspection system employing filtering and thresholding to determine surface anomalies |
Apr. 5, 1994 |
| 5220617 |
Method and apparatus for object inspection |
Jun. 15, 1993 |
| 5216485 |
Advanced via inspection tool (AVIT) |
Jun. 1, 1993 |
| 5214712 |
Pattern inspection system for inspecting defect of land pattern for through-hole on printed board |
May. 25, 1993 |
| 5150422 |
Method of and apparatus for inspecting conductive pattern on printed board |
Sep. 22, 1992 |
| 5146509 |
Method of inspecting defects in circuit pattern and system for carrying out the method |
Sep. 8, 1992 |
| 5144681 |
Method of and apparatus for inspecting conductive pattern on printed board |
Sep. 1, 1992 |
| 5129009 |
Method for automatic semiconductor wafer inspection |
Jul. 7, 1992 |
| 5127064 |
High resolution image compression methods and apparatus |
Jun. 30, 1992 |
| 5091963 |
Method and apparatus for inspecting surfaces for contrast variations |
Feb. 25, 1992 |
| 5076697 |
Apparatus and method for inspecting defect of mounted component with slit light |
Dec. 31, 1991 |
| 5058177 |
Method for inspection of protruding features |
Oct. 15, 1991 |
| 5047851 |
Process and device for detecting and evaluating surface cracks in workpieces |
Sep. 10, 1991 |
| 5046110 |
Comparator error filtering for pattern inspector |
Sep. 3, 1991 |
| 5027417 |
Method of and apparatus for inspecting conductive pattern on printed board |
Jun. 25, 1991 |
| 5023917 |
Method and apparatus for pattern inspection |
Jun. 11, 1991 |
| 5012524 |
Automatic inspection method |
Apr. 30, 1991 |
| 4985927 |
Method of detecting and reviewing pattern defects |
Jan. 15, 1991 |
| 4984282 |
Parallel processing of reference and guardband data |
Jan. 8, 1991 |
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