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Browse by Category: Main > Optical & Optics
Class Information
Number: 382/149
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Fault or defect detection
Description: Subject matter wherein a device is inspected for defects relating to dimensional tolerances, surface irregularities, etc.










Sub-classes under this class:

Class Number Class Name Patents
382/150 Faulty soldering 133


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

Patent Number Title Of Patent Date Issued
8712184 Method and system for filtering noises in an image scanned by charged particles Apr. 29, 2014
8712163 Pill identification and counterfeit detection method Apr. 29, 2014
8705841 Pattern inspection method, pattern inspection apparatus and pattern processing apparatus Apr. 22, 2014
8687873 Inspection method Apr. 1, 2014
8687874 Method of inspecting organic electroluminescence display device Apr. 1, 2014
8682466 Automatic virtual metrology for semiconductor wafer result prediction Mar. 25, 2014
8682058 Defect analysis method, apparatus, and recording medium using pattern dependence degree Mar. 25, 2014
8681222 Adaptation for clear path detection with additional classifiers Mar. 25, 2014
8670605 Identification method of data point distribution area on coordinate plane and recording medium Mar. 11, 2014
8666140 Defect inspection method for wafer and wafer defect inspection system using the same Mar. 4, 2014
8666159 Real time feature extraction Mar. 4, 2014
8660340 Defect classification method and apparatus, and defect inspection apparatus Feb. 25, 2014
8660336 Defect inspection system Feb. 25, 2014
8660335 Transient pixel defect detection and correction Feb. 25, 2014
8659654 Image verification with tiered tolerance Feb. 25, 2014
8649591 Pattern inspection apparatus and pattern inspection method Feb. 11, 2014
8644606 Method for visual image detection Feb. 4, 2014
8645875 Method for quantifying the manufacturing complexity of electrical designs Feb. 4, 2014
8639019 Method and apparatus for inspecting pattern defects Jan. 28, 2014
8620064 Method for imaging workpiece surfaces at high robot transfer speeds with reduction or prevention of motion-induced distortion Dec. 31, 2013
8620062 Apparatus and method of detecting a rotational setting of plastics material pre-forms Dec. 31, 2013
8619164 Complementary pixel reconstruction Dec. 31, 2013
8611639 Semiconductor device property extraction, generation, visualization, and monitoring methods Dec. 17, 2013
8611640 Inspection apparatus and inspection method Dec. 17, 2013
8605986 Burr detecting apparatus and burr detection method thereof Dec. 10, 2013
8606017 Method for inspecting localized image and system thereof Dec. 10, 2013
8588510 Image processing apparatus and image processing method Nov. 19, 2013
8588511 Method and apparatus for automatic measurement of pad geometry and inspection thereof Nov. 19, 2013
8584000 Abnormality detection system, abnormality detection method, and abnormality detection program storage medium Nov. 12, 2013
8582864 Fault inspection method Nov. 12, 2013
8577119 Wafer surface observing method and apparatus Nov. 5, 2013
8571269 Image quality defect detection via sensor characterization and halftone dot classification Oct. 29, 2013
8571704 Substrate transfer apparatus Oct. 29, 2013
8559000 Method of inspecting a semiconductor device and an apparatus thereof Oct. 15, 2013
8559698 Method of inspecting chip defects Oct. 15, 2013
8553294 Outlining method for properly representing curved line and straight line, and image compression method using the same Oct. 8, 2013
8551791 Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis Oct. 8, 2013
8548224 Method for inspecting measurement object Oct. 1, 2013
8542229 Identification method of data point distribution area on coordinate plane and recording medium Sep. 24, 2013
8542354 Inspection apparatus Sep. 24, 2013
8538167 Designating corridors to provide estimates of structures Sep. 17, 2013
8538165 Image measuring apparatus, program, and teaching method of image measuring apparatus Sep. 17, 2013
8538131 Defect inspection apparatus and method of defect inspection Sep. 17, 2013
8538127 Image processing method and image processing system Sep. 17, 2013
8532364 Apparatus and method for detecting defects in wafer manufacturing Sep. 10, 2013
8532365 Pattern detection apparatus, processing method thereof, and computer-readable storage medium Sep. 10, 2013
8532395 Pattern inspection method and semiconductor device manufacturing method Sep. 10, 2013
8526709 Methods and apparatus for detecting multiple objects Sep. 3, 2013
8526710 Defect review method and apparatus Sep. 3, 2013
8520077 Color-unevenness inspection apparatus and method Aug. 27, 2013

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