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Class Information
Number: 382/148
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > At plural magnifications or resolutions
Description: Subject matter wherein inspection is performed at more than one image magnification or resolution.

Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
8705794 Data processing apparatus and data processing method Apr. 22, 2014
8675948 Mask inspection apparatus and mask inspection method Mar. 18, 2014
8643835 Active planar autofocus Feb. 4, 2014
8645875 Method for quantifying the manufacturing complexity of electrical designs Feb. 4, 2014
8577124 Method and apparatus of pattern inspection and semiconductor inspection system using the same Nov. 5, 2013
8538165 Image measuring apparatus, program, and teaching method of image measuring apparatus Sep. 17, 2013
8520077 Color-unevenness inspection apparatus and method Aug. 27, 2013
8483515 Image processing method, image processor, integrated circuit, and recording medium Jul. 9, 2013
8472695 Method and apparatus for failure analysis of semiconductor integrated circuit devices Jun. 25, 2013
8462259 Focusing image display device and method for displaying same Jun. 11, 2013
8426223 Wafer edge inspection Apr. 23, 2013
8421803 Information display system and information display method for quality control of component-mounted substrate Apr. 16, 2013
8400549 Imaging and display apparatus and method Mar. 19, 2013
8401269 System and method for automatic measurements and calibration of computerized magnifying instruments Mar. 19, 2013
8395677 Aberration correction apparatus, aberration correction method, and program Mar. 12, 2013
8395490 Blind spot display apparatus Mar. 12, 2013
8379229 Simulation of a printed dot-pattern bitmap Feb. 19, 2013
8373890 Printing processing apparatus, method, and system, and computer readable recording medium for processing at various resolutions Feb. 12, 2013
8368774 Imaging geometries for scanning optical detectors with overlapping fields of regard and methods for providing and utilizing same Feb. 5, 2013
8358832 High accuracy beam placement for local area navigation Jan. 22, 2013
8320658 Unevenness inspection method, method for manufacturing display panel, and unevenness inspection apparatus Nov. 27, 2012
8264534 Method and apparatus for processing the image data of the surface of a wafer recorded by at least one camera Sep. 11, 2012
8264535 Method and apparatus for analyzing a group of photolithographic masks Sep. 11, 2012
8260034 Multi-modal data analysis for defect identification Sep. 4, 2012
8200004 Method for inspecting a surface of a wafer with regions of different detection sensitivity Jun. 12, 2012
8194969 Method and apparatus for visual inspection Jun. 5, 2012
8180110 Road lane marker detection apparatus and road lane marker detection method May. 15, 2012
8111900 Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle Feb. 7, 2012
8089661 Embedding authentication information to prevent document spoofing Jan. 3, 2012
8090190 Method and apparatus for reviewing defects Jan. 3, 2012
8043772 Manufacturing method and manufacturing system of semiconductor device Oct. 25, 2011
8036445 Pattern matching method, program and semiconductor device manufacturing method Oct. 11, 2011
8031932 Pattern inspection apparatus and method Oct. 4, 2011
8027529 System for improving critical dimension uniformity Sep. 27, 2011
8014587 Pattern test method of testing, in only specific region, defect of pattern on sample formed by charged beam lithography apparatus Sep. 6, 2011
7957580 Workpiece picking device Jun. 7, 2011
7932493 Method and system for observing a specimen using a scanning electron microscope Apr. 26, 2011
7933452 System and methods of image retrieval Apr. 26, 2011
7925072 Methods for identifying array areas in dies formed on a wafer and methods for setting up such methods Apr. 12, 2011
7916913 System and method for reconstructing a diagnostic trajectory Mar. 29, 2011
7885480 Correlation peak finding method for image correlation displacement sensing Feb. 8, 2011
7872650 Remotely viewing large tiled image datasets Jan. 18, 2011
7844099 Inspection method for protecting image sensor devices with front surface protection Nov. 30, 2010
7844103 Microscopic inspection apparatus for reducing image smear using a pulsed light source and a linear-periodic superpositioned scanning scheme to provide extended pulse duration, and methods usef Nov. 30, 2010
7817847 Robot system with vision sensor Oct. 19, 2010
7769225 Methods and systems for detecting defects in a reticle design pattern Aug. 3, 2010
7760930 Translation engine of defect pattern recognition Jul. 20, 2010
7760929 Grouping systematic defects with feedback from electrical inspection Jul. 20, 2010
7751610 Image recognition method and image recognition apparatus Jul. 6, 2010
7738093 Methods for detecting and classifying defects on a reticle Jun. 15, 2010

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