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Class Information
Number: 382/147
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Inspecting printed circuit boards
Description: Subject matter wherein a printed circuit or printed wiring board is inspected to locate defects in conductors, holes, the presence or absence of components, etc.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7410737 |
System and method for process variation monitor |
Aug. 12, 2008 |
| 7406191 |
Inspection data producing method and board inspection apparatus using the method |
Jul. 29, 2008 |
| 7372632 |
Apparatus and methods for the inspection of microvias in printed circuit boards |
May. 13, 2008 |
| 7366321 |
System and method for performing automated optical inspection of objects |
Apr. 29, 2008 |
| 7336814 |
Method and apparatus for machine-vision |
Feb. 26, 2008 |
| 7324685 |
Inspection systems and methods |
Jan. 29, 2008 |
| 7317522 |
Verification of non-recurring defects in pattern inspection |
Jan. 8, 2008 |
| 7315641 |
Pattern correcting method of mask for manufacturing a semiconductor device and recording medium having recorded its pattern correcting method |
Jan. 1, 2008 |
| 7295695 |
Defect detection via multiscale wavelets-based algorithms |
Nov. 13, 2007 |
| 7283660 |
Multi-layer printed circuit board fabrication system and method |
Oct. 16, 2007 |
| 7266232 |
Apparatus and method for inspecting pattern |
Sep. 4, 2007 |
| 7266235 |
Pattern inspection method and apparatus |
Sep. 4, 2007 |
| 7251348 |
Land appearance inspecting device, and land appearance inspecting method |
Jul. 31, 2007 |
| 7228257 |
Architecture for general purpose programmable semiconductor processing system and methods therefor |
Jun. 5, 2007 |
| 7218771 |
Cam reference for inspection of contour images |
May. 15, 2007 |
| 7218772 |
Method for non-referential defect characterization using fractal encoding and active contours |
May. 15, 2007 |
| 7213447 |
Method and apparatus for detecting topographical features of microelectronic substrates |
May. 8, 2007 |
| 7181058 |
Method and system for inspecting electronic components mounted on printed circuit boards |
Feb. 20, 2007 |
| 7167583 |
Image processing system for use with inspection systems |
Jan. 23, 2007 |
| 7155052 |
Method for pattern inspection |
Dec. 26, 2006 |
| 7133550 |
Pattern inspection method and apparatus |
Nov. 7, 2006 |
| 7116814 |
Image-based container defects detector |
Oct. 3, 2006 |
| 7116817 |
Method and apparatus for inspecting a semiconductor device |
Oct. 3, 2006 |
| 7113629 |
Pattern inspecting apparatus and method |
Sep. 26, 2006 |
| 7110591 |
System and method for recognizing markers on printed circuit boards |
Sep. 19, 2006 |
| 7106896 |
ID recognition apparatus and ID recognition sorter system for semiconductor wafer |
Sep. 12, 2006 |
| 7064845 |
Method for measuring the geometry of an object by means of a co-ordination measuring device |
Jun. 20, 2006 |
| 7062080 |
Method of inspecting curved surface and device for inspecting printed circuit board |
Jun. 13, 2006 |
| 7050686 |
Fiber optic article with inner region |
May. 23, 2006 |
| 7035448 |
Method of defect inspection of graytone mask and apparatus doing the same |
Apr. 25, 2006 |
| 7031510 |
Region segmentation of color image |
Apr. 18, 2006 |
| 7027639 |
High speed optical image acquisition system with extended dynamic range |
Apr. 11, 2006 |
| 7020321 |
Pattern data converting method and apparatus |
Mar. 28, 2006 |
| 7016526 |
Pixel based machine for patterned wafers |
Mar. 21, 2006 |
| 6990227 |
Method for printed circuit board inspection |
Jan. 24, 2006 |
| 6987894 |
Appearance inspection apparatus and method in which plural threads are processed in parallel |
Jan. 17, 2006 |
| 6987875 |
Probe mark inspection method and apparatus |
Jan. 17, 2006 |
| 6985618 |
Overlay marks, methods of overlay mark design and methods of overlay measurements |
Jan. 10, 2006 |
| 6973209 |
Defect inspection system |
Dec. 6, 2005 |
| 6954272 |
Apparatus and method for die placement using transparent plate with fiducials |
Oct. 11, 2005 |
| 6952492 |
Method and apparatus for inspecting a semiconductor device |
Oct. 4, 2005 |
| 6950548 |
Creating geometric model descriptions for use in machine vision inspection systems |
Sep. 27, 2005 |
| 6923045 |
Method and apparatus for detecting topographical features of microelectronic substrates |
Aug. 2, 2005 |
| 6925203 |
Position detection apparatus and exposure apparatus |
Aug. 2, 2005 |
| 6922482 |
Hybrid invariant adaptive automatic defect classification |
Jul. 26, 2005 |
| 6917699 |
Image processing method, an image processing device and a bonding apparatus |
Jul. 12, 2005 |
| 6898305 |
Circuit pattern inspection method and apparatus |
May. 24, 2005 |
| 6898304 |
Hardware configuration for parallel data processing without cross communication |
May. 24, 2005 |
| 6880387 |
Acoustic micro imaging method providing improved information derivation and visualization |
Apr. 19, 2005 |
| 6870948 |
Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image |
Mar. 22, 2005 |
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