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Browse by Category: Main > Optical & Optics
Class Information
Number: 382/147
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Inspecting printed circuit boards
Description: Subject matter wherein a printed circuit or printed wiring board is inspected to locate defects in conductors, holes, the presence or absence of components, etc.










Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
8670605 Identification method of data point distribution area on coordinate plane and recording medium Mar. 11, 2014
8654412 Component imaging method, component imaging device, and component mounting device having component imaging device Feb. 18, 2014
8655049 Identification method of data point distribution area on coordinate plane and recording medium Feb. 18, 2014
8611639 Semiconductor device property extraction, generation, visualization, and monitoring methods Dec. 17, 2013
8605986 Burr detecting apparatus and burr detection method thereof Dec. 10, 2013
8588511 Method and apparatus for automatic measurement of pad geometry and inspection thereof Nov. 19, 2013
8588510 Image processing apparatus and image processing method Nov. 19, 2013
8577124 Method and apparatus of pattern inspection and semiconductor inspection system using the same Nov. 5, 2013
8577125 Method and apparatus for image generation Nov. 5, 2013
8559697 Mask inspection apparatus and image generation method Oct. 15, 2013
8548224 Method for inspecting measurement object Oct. 1, 2013
8538165 Image measuring apparatus, program, and teaching method of image measuring apparatus Sep. 17, 2013
8532365 Pattern detection apparatus, processing method thereof, and computer-readable storage medium Sep. 10, 2013
8526707 Method of inspecting a mask Sep. 3, 2013
8520077 Color-unevenness inspection apparatus and method Aug. 27, 2013
8515153 System and method of image processing, and scanning electron microscope Aug. 20, 2013
8498471 Method for identifying a wafer serial number Jul. 30, 2013
8472695 Method and apparatus for failure analysis of semiconductor integrated circuit devices Jun. 25, 2013
8467592 Substrate media distortion analysis Jun. 18, 2013
8457411 Method and device for determining the position of an edge of a marker structure with subpixel accuracy in an image, having a plurality of pixels, of the marker structure Jun. 4, 2013
8442299 Evaluation of image processing algorithms May. 14, 2013
8428336 Inspecting method, inspecting system, and method for manufacturing electronic devices Apr. 23, 2013
8428338 Method of determining solder paste height and device for determining solder paste height Apr. 23, 2013
8421803 Information display system and information display method for quality control of component-mounted substrate Apr. 16, 2013
8406503 Mounted component inspection apparatus, component mounting machine comprising the mounted component inspection apparatus, and mounted component inspection method Mar. 26, 2013
8401273 Apparatus for evaluating degradation of pattern features Mar. 19, 2013
8401274 Image processing apparatus and method Mar. 19, 2013
8379229 Simulation of a printed dot-pattern bitmap Feb. 19, 2013
8379963 Visual inspection system Feb. 19, 2013
8369603 Method for inspecting measurement object Feb. 5, 2013
8363922 IC layout pattern matching and classification system and method Jan. 29, 2013
8358832 High accuracy beam placement for local area navigation Jan. 22, 2013
8355562 Pattern shape evaluation method Jan. 15, 2013
8351657 Method for the viewing of visual information with an electronic device Jan. 8, 2013
8351682 X-ray examination region setting method, X-ray examination apparatus and X-ray examination region setting program Jan. 8, 2013
8340393 Advanced roughness metrology Dec. 25, 2012
8318391 Process window signature patterns for lithography process control Nov. 27, 2012
8319962 Mask making decision for manufacturing (DFM) on mask quality control Nov. 27, 2012
8290239 Automatic repair of electric circuits Oct. 16, 2012
8285030 Determining calibration parameters for a lithographic process Oct. 9, 2012
8275188 System and method for inspecting chips in a tray Sep. 25, 2012
8264534 Method and apparatus for processing the image data of the surface of a wafer recorded by at least one camera Sep. 11, 2012
8264535 Method and apparatus for analyzing a group of photolithographic masks Sep. 11, 2012
8260034 Multi-modal data analysis for defect identification Sep. 4, 2012
8243134 Optical reader capable of changing the incident angle of dark field illumination Aug. 14, 2012
8233697 Method and device for generating digital still pictures of wafer-shaped elements during a production process Jul. 31, 2012
8229205 Pattern matching method in manufacturing semiconductor memory devices Jul. 24, 2012
8194969 Method and apparatus for visual inspection Jun. 5, 2012
8194089 On screen measurement tool Jun. 5, 2012
8184897 Method and apparatus for determining an optical threshold and a resist bias May. 22, 2012

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