| |
 |
|
Class Information
Number: 382/147
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Inspecting printed circuit boards
Description: Subject matter wherein a printed circuit or printed wiring board is inspected to locate defects in conductors, holes, the presence or absence of components, etc.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7606410 |
Miniaturized imaging module construction technique |
Oct. 20, 2009 |
| 7598504 |
Writing error diagnosis method for charged particle beam photolithography apparatus and charged particle beam photolithography apparatus |
Oct. 6, 2009 |
| 7590279 |
Appearance inspection apparatus for inspecting inspection piece |
Sep. 15, 2009 |
| 7583833 |
Method and apparatus for manufacturing data indexing |
Sep. 1, 2009 |
| 7580558 |
Screen printing apparatus |
Aug. 25, 2009 |
| 7580557 |
Method of design analysis of existing integrated circuits |
Aug. 25, 2009 |
| 7560940 |
Method and installation for analyzing an integrated circuit |
Jul. 14, 2009 |
| 7553678 |
Method for detecting semiconductor manufacturing conditions |
Jun. 30, 2009 |
| 7539338 |
Bump inspection apparatus and method for IC component, bump forming method for IC component, and mounting method for IC component |
May. 26, 2009 |
| 7526405 |
Statistical signatures used with multivariate statistical analysis for fault detection and isolation and abnormal condition prevention in a process |
Apr. 28, 2009 |
| 7519216 |
Systems and methods of maintaining equipment for manufacturing semiconductor devices |
Apr. 14, 2009 |
| 7507961 |
Method and apparatus of pattern inspection and semiconductor inspection system using the same |
Mar. 24, 2009 |
| 7505619 |
System and method for conducting adaptive fourier filtering to detect defects in dense logic areas of an inspection surface |
Mar. 17, 2009 |
| 7498181 |
Method of preparing an integrated circuit die for imaging |
Mar. 3, 2009 |
| 7483561 |
Miniaturized imaging module construction technique |
Jan. 27, 2009 |
| 7463763 |
Apparatus, method, and program for assisting in selection of pattern element for pattern matching |
Dec. 9, 2008 |
| 7457453 |
Pattern inspection method and apparatus |
Nov. 25, 2008 |
| 7450748 |
Mask inspection process accounting for mask writer proximity correction |
Nov. 11, 2008 |
| 7428328 |
Method of forming a three-dimensional image of a pattern to be inspected and apparatus for performing the same |
Sep. 23, 2008 |
| 7428326 |
Method for improving reliability in a component placement machine by vacuum nozzle inspection |
Sep. 23, 2008 |
| 7424145 |
Device and method for inspecting photomasks and products fabricated using the same |
Sep. 9, 2008 |
| 7410737 |
System and method for process variation monitor |
Aug. 12, 2008 |
| 7406191 |
Inspection data producing method and board inspection apparatus using the method |
Jul. 29, 2008 |
| 7372632 |
Apparatus and methods for the inspection of microvias in printed circuit boards |
May. 13, 2008 |
| 7366321 |
System and method for performing automated optical inspection of objects |
Apr. 29, 2008 |
| 7336814 |
Method and apparatus for machine-vision |
Feb. 26, 2008 |
| 7324685 |
Inspection systems and methods |
Jan. 29, 2008 |
| 7317522 |
Verification of non-recurring defects in pattern inspection |
Jan. 8, 2008 |
| 7315641 |
Pattern correcting method of mask for manufacturing a semiconductor device and recording medium having recorded its pattern correcting method |
Jan. 1, 2008 |
| 7295695 |
Defect detection via multiscale wavelets-based algorithms |
Nov. 13, 2007 |
| 7283660 |
Multi-layer printed circuit board fabrication system and method |
Oct. 16, 2007 |
| 7266232 |
Apparatus and method for inspecting pattern |
Sep. 4, 2007 |
| 7266235 |
Pattern inspection method and apparatus |
Sep. 4, 2007 |
| 7251348 |
Land appearance inspecting device, and land appearance inspecting method |
Jul. 31, 2007 |
| 7228257 |
Architecture for general purpose programmable semiconductor processing system and methods therefor |
Jun. 5, 2007 |
| 7218771 |
Cam reference for inspection of contour images |
May. 15, 2007 |
| 7218772 |
Method for non-referential defect characterization using fractal encoding and active contours |
May. 15, 2007 |
| 7213447 |
Method and apparatus for detecting topographical features of microelectronic substrates |
May. 8, 2007 |
| 7181058 |
Method and system for inspecting electronic components mounted on printed circuit boards |
Feb. 20, 2007 |
| 7167583 |
Image processing system for use with inspection systems |
Jan. 23, 2007 |
| 7155052 |
Method for pattern inspection |
Dec. 26, 2006 |
| 7133550 |
Pattern inspection method and apparatus |
Nov. 7, 2006 |
| 7116817 |
Method and apparatus for inspecting a semiconductor device |
Oct. 3, 2006 |
| 7116814 |
Image-based container defects detector |
Oct. 3, 2006 |
| 7113629 |
Pattern inspecting apparatus and method |
Sep. 26, 2006 |
| 7110591 |
System and method for recognizing markers on printed circuit boards |
Sep. 19, 2006 |
| 7106896 |
ID recognition apparatus and ID recognition sorter system for semiconductor wafer |
Sep. 12, 2006 |
| 7064845 |
Method for measuring the geometry of an object by means of a co-ordination measuring device |
Jun. 20, 2006 |
| 7062080 |
Method of inspecting curved surface and device for inspecting printed circuit board |
Jun. 13, 2006 |
| 7050686 |
Fiber optic article with inner region |
May. 23, 2006 |
|
|
|
