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Class Information
Number: 382/146
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Measuring external leads
Description: Subject matter wherein external leads of a component are inspected, such as for coplanarity, shape, or alignment prior to insertion into a printed circuit board or the like.

Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
8653846 Electronic device mounting apparatus and method of mounting electronic device Feb. 18, 2014
8605986 Burr detecting apparatus and burr detection method thereof Dec. 10, 2013
8538165 Image measuring apparatus, program, and teaching method of image measuring apparatus Sep. 17, 2013
8538128 Method for determining the location of an additive in an article Sep. 17, 2013
8520077 Color-unevenness inspection apparatus and method Aug. 27, 2013
8421803 Information display system and information display method for quality control of component-mounted substrate Apr. 16, 2013
8379963 Visual inspection system Feb. 19, 2013
8358832 High accuracy beam placement for local area navigation Jan. 22, 2013
8305447 Security threat detection system Nov. 6, 2012
8290239 Automatic repair of electric circuits Oct. 16, 2012
8264534 Method and apparatus for processing the image data of the surface of a wafer recorded by at least one camera Sep. 11, 2012
8264535 Method and apparatus for analyzing a group of photolithographic masks Sep. 11, 2012
8253077 Substrate processing method, computer-readable storage medium and substrate processing system Aug. 28, 2012
8184898 Analysis of leaded components May. 22, 2012
8144971 Pattern matching processing system and computer readable medium Mar. 27, 2012
8121394 Method for manufacturing electronic device Feb. 21, 2012
8055055 Method for inspecting a foreign matter on mirror-finished substrate Nov. 8, 2011
8036445 Pattern matching method, program and semiconductor device manufacturing method Oct. 11, 2011
8014587 Pattern test method of testing, in only specific region, defect of pattern on sample formed by charged beam lithography apparatus Sep. 6, 2011
7988297 Non-rigidly coupled, overlapping, non-feedback, optical systems for spatial filtering of fourier transform optical patterns and image shape content characterization Aug. 2, 2011
7985516 Substrate processing method, computer-readable storage medium and substrate processing system Jul. 26, 2011
7933452 System and methods of image retrieval Apr. 26, 2011
7844103 Microscopic inspection apparatus for reducing image smear using a pulsed light source and a linear-periodic superpositioned scanning scheme to provide extended pulse duration, and methods usef Nov. 30, 2010
7844099 Inspection method for protecting image sensor devices with front surface protection Nov. 30, 2010
7817847 Robot system with vision sensor Oct. 19, 2010
7801353 Method for defect detection using computer aided design data Sep. 21, 2010
7769225 Methods and systems for detecting defects in a reticle design pattern Aug. 3, 2010
7760930 Translation engine of defect pattern recognition Jul. 20, 2010
7756318 Pattern inspection apparatus and method with local critical dimension error detectability Jul. 13, 2010
7751610 Image recognition method and image recognition apparatus Jul. 6, 2010
7734081 Grinding method and system with non-contact real-time detection of workpiece thinkness Jun. 8, 2010
7724939 Method and apparatus for inspecting reticles implementing parallel processing May. 25, 2010
7715616 PC board inspecting method and apparatus and inspection logic setting method and apparatus May. 11, 2010
7653237 Method of manufacturing ball array devices using an inspection apparatus having two or more cameras and ball array devices produced according to the method Jan. 26, 2010
7590278 Measurement of corner roundness Sep. 15, 2009
7570798 Method of manufacturing ball array devices using an inspection apparatus having one or more cameras and ball array devices produced according to the method Aug. 4, 2009
7539339 Part recognition data creation method and apparatus, electronic part mounting apparatus, and recorded medium May. 26, 2009
7453777 Method and device for optical form measurement and/or estimation Nov. 18, 2008
7324685 Inspection systems and methods Jan. 29, 2008
7218771 Cam reference for inspection of contour images May. 15, 2007
7076094 Method and apparatus for detecting position of lead of electric component, and electric-component mounting method Jul. 11, 2006
7062080 Method of inspecting curved surface and device for inspecting printed circuit board Jun. 13, 2006
7058216 Apparatus for detecting lead coplanarity, apparatus for detecting condition of electronic component, and system for mounting electronic component Jun. 6, 2006
7027637 Adaptive threshold determination for ball grid array component modeling Apr. 11, 2006
6990226 Pattern recognition method Jan. 24, 2006
6990227 Method for printed circuit board inspection Jan. 24, 2006
6987875 Probe mark inspection method and apparatus Jan. 17, 2006
6980687 Chip inspecting apparatus and method Dec. 27, 2005
6950548 Creating geometric model descriptions for use in machine vision inspection systems Sep. 27, 2005
6922482 Hybrid invariant adaptive automatic defect classification Jul. 26, 2005

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