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Class Information
Number: 382/146
Name: Image analysis > Applications > Manufacturing or product inspection > Inspection of semiconductor device or printed circuit board > Measuring external leads
Description: Subject matter wherein external leads of a component are inspected, such as for coplanarity, shape, or alignment prior to insertion into a printed circuit board or the like.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7324685 |
Inspection systems and methods |
Jan. 29, 2008 |
| 7218771 |
Cam reference for inspection of contour images |
May. 15, 2007 |
| 7076094 |
Method and apparatus for detecting position of lead of electric component, and electric-component mounting method |
Jul. 11, 2006 |
| 7062080 |
Method of inspecting curved surface and device for inspecting printed circuit board |
Jun. 13, 2006 |
| 7058216 |
Apparatus for detecting lead coplanarity, apparatus for detecting condition of electronic component, and system for mounting electronic component |
Jun. 6, 2006 |
| 7027637 |
Adaptive threshold determination for ball grid array component modeling |
Apr. 11, 2006 |
| 6990227 |
Method for printed circuit board inspection |
Jan. 24, 2006 |
| 6990226 |
Pattern recognition method |
Jan. 24, 2006 |
| 6987875 |
Probe mark inspection method and apparatus |
Jan. 17, 2006 |
| 6980687 |
Chip inspecting apparatus and method |
Dec. 27, 2005 |
| 6950548 |
Creating geometric model descriptions for use in machine vision inspection systems |
Sep. 27, 2005 |
| 6922482 |
Hybrid invariant adaptive automatic defect classification |
Jul. 26, 2005 |
| 6917699 |
Image processing method, an image processing device and a bonding apparatus |
Jul. 12, 2005 |
| 6810728 |
Kit-based wire evaluation |
Nov. 2, 2004 |
| 6813377 |
Methods and apparatuses for generating a model of an object from an image of the object |
Nov. 2, 2004 |
| 6801652 |
Method for checking the presentation of components to an automatic onserting unit |
Oct. 5, 2004 |
| 6795573 |
Inspection method and apparatus |
Sep. 21, 2004 |
| 6787378 |
Method for measuring height of sphere or hemisphere |
Sep. 7, 2004 |
| 6789240 |
Method of controlling bond process quality by measuring wire bond features |
Sep. 7, 2004 |
| 6738504 |
Inspection apparatus for semiconductor device and parts mounter using same |
May. 18, 2004 |
| 6713311 |
Method for screening semiconductor devices for contact coplanarity |
Mar. 30, 2004 |
| 6690819 |
Method and apparatus for recognizing components |
Feb. 10, 2004 |
| 6681151 |
System and method for servoing robots based upon workpieces with fiducial marks using machine vision |
Jan. 20, 2004 |
| 6647132 |
Methods and apparatuses for identifying regions of similar texture in an image |
Nov. 11, 2003 |
| 6617602 |
Edge detecting apparatus having a control device which selectively operates the light emitting elements |
Sep. 9, 2003 |
| 6608921 |
Inspection of solder bump lighted with rays of light intersecting at predetermined angle |
Aug. 19, 2003 |
| 6587580 |
Stencil printing process optimization for circuit pack assembly using neural network modeling |
Jul. 1, 2003 |
| 6578175 |
Method and apparatus for evaluating and correcting errors in integrated circuit chip designs |
Jun. 10, 2003 |
| 6571006 |
Methods and apparatuses for measuring an extent of a group of objects within an image |
May. 27, 2003 |
| 6526165 |
Methods and apparatuses for refining a geometric description of an object having a plurality of extensions |
Feb. 25, 2003 |
| 6510240 |
Automatic detection of die absence on the wire bonding machine |
Jan. 21, 2003 |
| 6442291 |
Machine vision methods and articles of manufacture for ball grid array |
Aug. 27, 2002 |
| 6375336 |
Spread illumination apparatus |
Apr. 23, 2002 |
| 6292261 |
Rotary sensor system with at least two detectors |
Sep. 18, 2001 |
| 6278797 |
Apparatus for inspecting land-attached circuit board |
Aug. 21, 2001 |
| 6275604 |
Method and apparatus for generating semiconductor exposure data |
Aug. 14, 2001 |
| 6249598 |
Solder testing apparatus |
Jun. 19, 2001 |
| 6205238 |
Apparatus and method for inspecting leads of an IC |
Mar. 20, 2001 |
| 6201892 |
System and method for arithmetic operations for electronic package inspection |
Mar. 13, 2001 |
| 6188784 |
Split optics arrangement for vision inspection/sorter module |
Feb. 13, 2001 |
| 6133579 |
Method and apparatus for slanted attitude testing and/or for co-planarity testing of a contact for SMD components |
Oct. 17, 2000 |
| 6118524 |
Arc illumination apparatus and method |
Sep. 12, 2000 |
| 6072898 |
Method and apparatus for three dimensional inspection of electronic components |
Jun. 6, 2000 |
| 6067376 |
Classifying pixels of an image |
May. 23, 2000 |
| 6064756 |
Apparatus for three dimensional inspection of electronic components |
May. 16, 2000 |
| 6061466 |
Apparatus and method for inspecting an LSI device in an assembling process, capable of detecting connection failure of individual flexible leads |
May. 9, 2000 |
| 6055054 |
Three dimensional inspection system |
Apr. 25, 2000 |
| 6028319 |
Calibration standard for lead configurations and method of using |
Feb. 22, 2000 |
| 6026176 |
Machine vision methods and articles of manufacture for ball grid array inspection |
Feb. 15, 2000 |
| 5995220 |
Semiconductor package inspection apparatus |
Nov. 30, 1999 |
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