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Class Information
Number: 382/141
Name: Image analysis > Applications > Manufacturing or product inspection
Description: Subject matter wherein the image analysis* system has been designed for use in product manufacturing (e.g., integrated circuits or metal parts), including as part of automated inspection systems for recognizing defects or irregularities or as part of the system to control the manufacturing by image analysis*.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 5353357 |
Methods and apparatus for inspecting the appearance of substantially circular objects |
Oct. 4, 1994 |
| 5351308 |
Method and apparatus for measuring crimp frequency of a web |
Sep. 27, 1994 |
| 5351316 |
Image processing apparatus |
Sep. 27, 1994 |
| 5345515 |
Method and apparatus for inspecting the cleanliness of top slibers |
Sep. 6, 1994 |
| 5341436 |
Nondestructive analysis of dispersion and loading of reinforcing material in a composite material |
Aug. 23, 1994 |
| 5335293 |
Product inspection method and apparatus |
Aug. 2, 1994 |
| 5317645 |
Method and apparatus for the recognition and counting of discrete objects |
May. 31, 1994 |
| 5311289 |
Picture processing method in optical measuring apparatus |
May. 10, 1994 |
| 5311599 |
Method and apparatus for optical testing of samples |
May. 10, 1994 |
| 5305894 |
Center shot sorting system and method |
Apr. 26, 1994 |
| 5293426 |
Printing cylinder engraver calibration system and method |
Mar. 8, 1994 |
| 5293220 |
Method for inspecting stripped condition of electric wire |
Mar. 8, 1994 |
| 5293324 |
Method and apparatus for inspecting solder portions using fuzzy inference |
Mar. 8, 1994 |
| 5291564 |
System and method for acquiring an optical target |
Mar. 1, 1994 |
| 5280433 |
Shape adaptive process apparatus |
Jan. 18, 1994 |
| 5280542 |
XYZ coordinates measuring system |
Jan. 18, 1994 |
| 5274713 |
Real-time apparatus for detecting surface defects on objects |
Dec. 28, 1993 |
| 5272649 |
Video method and apparatus for measuring and controlling dimensional stability |
Dec. 21, 1993 |
| 5268968 |
Defect judgement method |
Dec. 7, 1993 |
| 5268999 |
Modeling method and system using solid data having functional structure and normal projection drawing dimensional format |
Dec. 7, 1993 |
| 5267033 |
Hollow body inspection system, hollow body inspection apparatus and signal transmission apparatus |
Nov. 30, 1993 |
| 5233669 |
Device for and method of detecting positioning marks for cutting ceramic laminated body |
Aug. 3, 1993 |
| 5208766 |
Automated evaluation of painted surface quality |
May. 4, 1993 |
| 5189514 |
Guidance system for automatic riveters |
Feb. 23, 1993 |
| 5189711 |
Automatic detection of elliptical shapes |
Feb. 23, 1993 |
| 5186887 |
Apparatus for inspecting peripheral surfaces of nuclear fuel pellets |
Feb. 16, 1993 |
| 5184217 |
System for automatically inspecting a flat sheet part |
Feb. 2, 1993 |
| 5175772 |
Automated test for displays using display patterns |
Dec. 29, 1992 |
| 5172421 |
Automated method of classifying optical fiber flaws |
Dec. 15, 1992 |
| 5157735 |
Chipping detection system and method |
Oct. 20, 1992 |
| 5142588 |
Method of and apparatus for measuring track displacement on a magnetic tape |
Aug. 25, 1992 |
| 5134573 |
Method to extend the linear range of images captured on film |
Jul. 28, 1992 |
| 5132791 |
Optical sheet inspection system |
Jul. 21, 1992 |
| 5129010 |
System for measuring shapes and dimensions of gaps and flushnesses on three dimensional surfaces of objects |
Jul. 7, 1992 |
| 5128753 |
Method and apparatus for scaning objects and generating image information |
Jul. 7, 1992 |
| 5127063 |
Processor for pattern data, measured process information, and image information |
Jun. 30, 1992 |
| 5125035 |
Five axis generated hole inspection system |
Jun. 23, 1992 |
| 5121438 |
Apparatus for inspecting articles |
Jun. 9, 1992 |
| 5121439 |
Image processor for detecting incomplete articles such as wiring harnesses |
Jun. 9, 1992 |
| 5111411 |
Object sorting system |
May. 5, 1992 |
| 5093867 |
Candidate article recognition with assignation of reference points and respective relative weights |
Mar. 3, 1992 |
| 5081687 |
Method and apparatus for testing LCD panel array prior to shorting bar removal |
Jan. 14, 1992 |
| 5077806 |
Machine vision analysis apparatus |
Dec. 31, 1991 |
| 5073951 |
Method of inspecting an adhesive to fasten a center hub to a magnetic disk |
Dec. 17, 1991 |
| H999 |
Transparency distortion measurement process |
Dec. 3, 1991 |
| 5048093 |
Defect counting method and apparatus |
Sep. 10, 1991 |
| 5046120 |
Method of and apparatus for increasing the processing speed in the scanning inspection of circuit boards and other objects |
Sep. 3, 1991 |
| 5040228 |
Method and apparatus for automatically focusing an image-acquisition device |
Aug. 13, 1991 |
| 5033095 |
Scanning image analyzer for accumulating quantifiable contaminants of webs |
Jul. 16, 1991 |
| 5016281 |
Image analysis counting system |
May. 14, 1991 |
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