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Class Information
Number: 382/141
Name: Image analysis > Applications > Manufacturing or product inspection
Description: Subject matter wherein the image analysis* system has been designed for use in product manufacturing (e.g., integrated circuits or metal parts), including as part of automated inspection systems for recognizing defects or irregularities or as part of the system to control the manufacturing by image analysis*.


Sub-classes under this class:

Class Number Class Name Patents
382/142 Bottle inspection 73
382/143 Inspection of packaged consumer goods 78
382/145 Inspection of semiconductor device or printed circuit board 630
382/144 Mask inspection (e.g., semiconductor photomask) 389
382/152 Tool, workpiece, or mechanical component inspection 233


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

Patent Number Title Of Patent Date Issued
7403649 System and method of providing mask defect printability analysis Jul. 22, 2008
7403648 Apparatus for generating three-dimensional model data Jul. 22, 2008
7400759 Method for testing a plastic sleeve for an image cylinder or a blanket cylinder Jul. 15, 2008
7397939 Method and apparatus for automatic removal of optical artifacts in scanning Jul. 8, 2008
7397956 Pattern matching method selection Jul. 8, 2008
7394926 Magnified machine vision user interface Jul. 1, 2008
7394937 Vision system and method for process monitoring Jul. 1, 2008
7391898 Method and apparatus for programmable zoned array counter Jun. 24, 2008
7388978 Apparatus and methods for the inspection of objects Jun. 17, 2008
7388977 Test system and method for portable electronic apparatus Jun. 17, 2008
7386161 Method and apparatus for flat patterned media inspection Jun. 10, 2008
7372986 Method and apparatus for determining if an optical disk originated from a valid source May. 13, 2008
7369697 Process variable of interest monitoring and control May. 6, 2008
7366340 Method and system for optically determining perpendicularity of end surface of part formed from parallel channels Apr. 29, 2008
7366341 Electronic assembly video inspection system Apr. 29, 2008
7359999 Inputting method and device with a flat input having sensor capable of coordinate touch input wherein display is switchable based on touch pressure Apr. 15, 2008
7359577 Differential method for layer-to-layer registration Apr. 15, 2008
7359546 Defect inspection apparatus and defect inspection method Apr. 15, 2008
7356176 Mounting-error inspecting method and substrate inspecting apparatus using the method Apr. 8, 2008
7356175 Identifying defects in decorative wood panels Apr. 8, 2008
7355725 Measuring system Apr. 8, 2008
7352889 Automated storage and retrieval device and method Apr. 1, 2008
7346206 Optical object detector Mar. 18, 2008
7346409 Information processing apparatus, and information processing method Mar. 18, 2008
7343038 Method for evaluating contamination on surface of object and imaging box used for the method Mar. 11, 2008
7343034 Method of inspecting threaded fasteners and a system therefor Mar. 11, 2008
7340085 Rotating prism component inspection system Mar. 4, 2008
7340084 Quality assessment of product in bulk flow Mar. 4, 2008
7339664 System and method for inspecting a light-management film and method of making the light-management film Mar. 4, 2008
7336814 Method and apparatus for machine-vision Feb. 26, 2008
7336850 Method for concealing dark defect in image sensor Feb. 26, 2008
7330580 System and method for inspecting an LCD panel Feb. 12, 2008
7330579 Automated inspection of tinted ophthalmic parts Feb. 12, 2008
7327869 Computer aided quality assurance software system Feb. 5, 2008
7327870 Method for inspecting a region of interest Feb. 5, 2008
7324681 Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar Jan. 29, 2008
7324665 Method of multi-resolution adaptive correlation processing Jan. 29, 2008
7324712 Quality factor Jan. 29, 2008
7319782 Real-time imaging and analysis system Jan. 15, 2008
7315358 Evaluation apparatus and method of optical parts Jan. 1, 2008
7315644 Investigation of destroyed assemblies and identification of components thereof Jan. 1, 2008
7313270 Vision system and method for process monitoring Dec. 25, 2007
7308157 Method and apparatus for optical inspection of a display Dec. 11, 2007
7308142 System and methods for rogue can detection Dec. 11, 2007
7308128 Magnifying observation apparatus, method for observing magnified image, and computer-readable medium Dec. 11, 2007
7308127 Method for determining and evaluating defects in a sample surface Dec. 11, 2007
7305114 Human/machine interface for a machine vision sensor and method for installing and operating the same Dec. 4, 2007
7305117 Methods and tangible objects employing machine readable data Dec. 4, 2007
7305116 Extracting method of pattern contour, image processing method, searching method of pattern edge, scanning method of probe, manufacturing method of semiconductor device, pattern inspection appa Dec. 4, 2007
7305115 Method and system for improving ability of a machine vision system to discriminate features of a target Dec. 4, 2007

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