Resources Contact Us Home
Browse by Category: Main > Physics
Class Information
Number: 378/86
Name: X-ray or gamma ray systems or devices > Specific application > Diffraction, reflection, or scattering analysis > Scatter analysis
Description: Subject matter including the measurement or analysis of X-rays that have been modulated in direction by an object under examination.

Sub-classes under this class:

Class Number Class Name Patents
378/88 Composition analysis 160
378/87 Imaging 238
378/89 Thickness or density analysis 148

Patents under this class:
1 2 3 4 5

Patent Number Title Of Patent Date Issued
8705692 Laser-based accelerator for interrogation of remote containers Apr. 22, 2014
8647859 Apparatus and method for analyzing bacteria Feb. 11, 2014
8649587 Methods, systems, and computer-program products for estimating scattered radiation in radiographic projections Feb. 11, 2014
8644577 Method for generating image data of an object under examination, projection data processing device, X-ray system and computer program Feb. 4, 2014
8644453 Scanning systems Feb. 4, 2014
8600004 Method for obtaining a structure factor of an amorphous material, in particular amorphous glass Dec. 3, 2013
8548121 X-ray analyzer Oct. 1, 2013
8515011 System and method for dose verification radiotherapy Aug. 20, 2013
8503610 X-ray inspection tool Aug. 6, 2013
8442186 Backscatter energy analysis for classification of materials based on positional non-commutativity May. 14, 2013
8433037 X-ray radar Apr. 30, 2013
8411820 3D x-ray microscopy imaging system Apr. 2, 2013
8411821 3D X-ray reflection microscopy imaging system Apr. 2, 2013
8401270 Examination of a region using dual-energy radiation Mar. 19, 2013
8366848 Thick doped adhesive tape to enhance backscatter X-ray detectability Feb. 5, 2013
8357894 Microcalorimetry for X-ray spectroscopy Jan. 22, 2013
8326011 Methods, systems, and computer-program products for estimating scattered radiation in radiographic projections Dec. 4, 2012
8306187 Optimal detector position for gamma backscatter Nov. 6, 2012
8270566 Adaptive scanning in an imaging system Sep. 18, 2012
8243880 Substrate measuring method and apparatus Aug. 14, 2012
8238513 Imaging system and method utilizing primary radiation Aug. 7, 2012
8194822 X-ray inspection based on scatter detection Jun. 5, 2012
8153418 Apparatus and method for analyzing bacteria Apr. 10, 2012
8149988 Use of nearly monochromatic and tunable photon sources with nuclear resonance fluorescence in non-intrusive inspection of containers for material detection and imaging Apr. 3, 2012
8119991 Method and apparatus for accurate calibration of VUV reflectometer Feb. 21, 2012
8121249 Multi-parameter X-ray computed tomography Feb. 21, 2012
8094782 X-ray backscatter system for imaging soft tissue regions Jan. 10, 2012
8094781 Portable X-ray back scattering imaging systems Jan. 10, 2012
8094780 Two dimensional small angle X-Ray scattering camera Jan. 10, 2012
8071938 Multi-modal particle detector Dec. 6, 2011
8068133 Image processing apparatus and image processing method Nov. 29, 2011
8023618 Methods and apparatus for the identification of molecular and crystalline materials by the doppler broadening of nuclear states bound in molecules, crystals and mixtures using nuclear resonanc Sep. 20, 2011
8023619 Adaptive scanning in an imaging system Sep. 20, 2011
8000435 Method and system for error compensation Aug. 16, 2011
8000444 Vertical/horizontal small angle X-ray scattering apparatus and method for measuring small angle X-ray scattering Aug. 16, 2011
7983387 Method and system to predict detectability and identify foreign objects Jul. 19, 2011
7957502 Method for scaling scattered ray intensity distribution in multi bulbs X-ray CT and multi bulbs X-ray CT apparatus Jun. 7, 2011
7933718 Method and tool for determination of fracture geometry in subterranean formations based on in-situ neutron activation analysis Apr. 26, 2011
7920676 CD-GISAXS system and method Apr. 5, 2011
7912679 Determining profile parameters of a structure formed on a semiconductor wafer using a dispersion function relating process parameter to dispersion Mar. 22, 2011
7907697 System to estimate X-ray scatter Mar. 15, 2011
7901136 Methods and system for calibrating and correcting a detection system Mar. 8, 2011
7856083 System and method to account for cross-talk among coherent scatter detectors Dec. 21, 2010
7847274 Localization of a radioactive source within a body of a subject Dec. 7, 2010
7835495 System and method for X-ray diffraction imaging Nov. 16, 2010
7835485 Method for scattered radiation correction in x-ray imaging devices Nov. 16, 2010
7831019 System and methods for characterizing a substance Nov. 9, 2010
7825376 Scintillator aspects for X-ray fluorescence visualizer, imager, or information provider Nov. 2, 2010
7820975 Achieving accurate time-of-flight calibrations with a stationary coincidence point source Oct. 26, 2010
7809104 Imaging system with long-standoff capability Oct. 5, 2010

1 2 3 4 5

  Recently Added Patents
Field device for determining or monitoring a physical or chemical process variable
Methods of synthesizing heteromultimeric polypeptides in yeast using a haploid mating strategy
System and method for outputting virtual textures in electronic devices
Architectural panel with millet and grass
Humidity indicator and method for fabricating the same
Digital fine delay processing
  Randomly Featured Patents
Method and apparatus for flanging tube ends
Method for driving plasma display panel
Method and system for supporting the evaluation of a picture of an eye
Hexa-cyclic compound
Telescoping display card holder
Method for testing and identifying microorganisms
Method and apparatus for improving dual-polarization optical communication performance
Document handling machine
Modular air gap device and faucet including same
Concrete anchor