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Class Information
Number: 378/82
Name: X-ray or gamma ray systems or devices > Specific application > Diffraction, reflection, or scattering analysis > Spatial energy dispersion
Description: Subject matter including means for physically spreading out an X-ray beam into its various energy components by diffraction, e.g., spectrometers and monochromators.










Sub-classes under this class:

Class Number Class Name Patents
378/83 Composition analysis 93
378/84 Monochromator or focusing device 386


Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
8693631 Craser device, imaging system and method Apr. 8, 2014
8675816 X-ray spectrometer Mar. 18, 2014
8600004 Method for obtaining a structure factor of an amorphous material, in particular amorphous glass Dec. 3, 2013
8537967 Short working distance spectrometer and associated devices, systems, and methods Sep. 17, 2013
8401270 Examination of a region using dual-energy radiation Mar. 19, 2013
8357894 Microcalorimetry for X-ray spectroscopy Jan. 22, 2013
8243879 Source grating for X-rays, imaging apparatus for X-ray phase contrast image and X-ray computed tomography system Aug. 14, 2012
8233682 Methods and systems for improving spatial and temporal resolution of computed images of moving objects Jul. 31, 2012
8155270 Synergistic energy-dispersive and wavelength-dispersive X-ray spectrometry Apr. 10, 2012
8119991 Method and apparatus for accurate calibration of VUV reflectometer Feb. 21, 2012
8068582 Methods and systems for the directing and energy filtering of X-rays for non-intrusive inspection Nov. 29, 2011
7995706 Electromagnetic wave/particle beam spectroscopic method and electromagnetic wave/particle beam spectroscopic instrument Aug. 9, 2011
7924973 Interferometer device and method Apr. 12, 2011
7847274 Localization of a radioactive source within a body of a subject Dec. 7, 2010
7796726 Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation Sep. 14, 2010
7742565 Method and apparatus for analysis using X-ray spectra Jun. 22, 2010
7729743 Method and arrangement for tracking a medical instrument Jun. 1, 2010
7688946 Method and device for measuring bond energy Mar. 30, 2010
7643604 Stationary inspection system for three-dimensional imaging employing electronic modulation of spectral data from Compton-scattered gammas Jan. 5, 2010
7592591 X-ray analyzer using electron beam Sep. 22, 2009
7499520 X-ray imaging apparatus and method with an X-ray interferometer Mar. 3, 2009
7469037 Method for detecting a mass density image of an object Dec. 23, 2008
7412022 Non-invasive stationary system for three-dimensional imaging of density fields using periodic flux modulation of compton-scattered gammas Aug. 12, 2008
7394890 Optimized x-ray energy for high resolution imaging of integrated circuits structures Jul. 1, 2008
7358494 Material composition analysis system and method Apr. 15, 2008
7352845 Energy dispersion type X-ray diffraction/spectral device Apr. 1, 2008
7346145 X-ray imaging system Mar. 18, 2008
7330530 Diffraction enhanced imaging method using a line x-ray source Feb. 12, 2008
7321652 Multi-detector EDXRD Jan. 22, 2008
7242746 Method for manufacturing a reflector for X-ray radiation Jul. 10, 2007
7231071 Abnormal shadow detecting system Jun. 12, 2007
7130376 X-ray reflectometry of thin film layers with enhanced accuracy Oct. 31, 2006
7103142 Material analysis using multiple X-ray reflectometry models Sep. 5, 2006
7076025 Method for detecting a mass density image of an object Jul. 11, 2006
7062015 Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector Jun. 13, 2006
7062013 X-ray reflectometry of thin film layers with enhanced accuracy Jun. 13, 2006
7003075 Optical measuring device Feb. 21, 2006
6947521 Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays Sep. 20, 2005
6907108 Dual-wavelength x-ray monochromator Jun. 14, 2005
6898270 X-ray optical system with collimator in the focus of an X-ray mirror May. 24, 2005
6829327 Total-reflection x-ray fluorescence apparatus and method using a doubly-curved optic Dec. 7, 2004
6809864 Multi-layer structure with variable bandpass for monochromatization and spectroscopy Oct. 26, 2004
6754305 Measurement of thin films and barrier layers on patterned wafers with X-ray reflectometry Jun. 22, 2004
6744850 X-ray reflectance measurement system with adjustable resolution Jun. 1, 2004
6639968 X-ray reflectometer Oct. 28, 2003
6597763 Spectrometer arrangement Jul. 22, 2003
6577708 Diffraction enhanced x-ray imaging of articular cartilage Jun. 10, 2003
6574305 Device and method for the inspection of the condition of a sample Jun. 3, 2003
6546070 Adaptable energy-resolved detection of ionizing radiation Apr. 8, 2003
6535575 Pulsed X-ray reflectometer Mar. 18, 2003

1 2 3










 
 
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