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Class Information
Number: 378/72
Name: X-ray or gamma ray systems or devices > Specific application > Diffraction, reflection, or scattering analysis > Diffractometry > Stress analysis
Description: Subject matter including detecting the presence or measuring the extent of stress within an analyte by analyzing the manner in which its X-ray diffraction pattern is modified when the X-rays are incident on a stressed area.

Patents under this class:
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Patent Number Title Of Patent Date Issued
8477905 Non-destructive testing systems and methods Jul. 2, 2013
8243878 High-resolution X-ray diffraction measurement with enhanced sensitivity Aug. 14, 2012
8119991 Method and apparatus for accurate calibration of VUV reflectometer Feb. 21, 2012
7769134 Measuring strain of epitaxial films using micro x-ray diffraction for in-line metrology Aug. 3, 2010
7583788 Measuring device for the shortwavelength x ray diffraction and a method thereof Sep. 1, 2009
7412131 Multilayer optic device and system and method for making same Aug. 12, 2008
7265754 Method for displaying material characteristic information Sep. 4, 2007
7260178 Diffractometer and method for diffraction analysis Aug. 21, 2007
7258485 X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer Aug. 21, 2007
7242744 X-ray diffraction apparatus and method Jul. 10, 2007
7236566 In-situ X-ray diffraction system using sources and detectors at fixed angular positions Jun. 26, 2007
7075073 Angle resolved x-ray detection Jul. 11, 2006
7003074 Stress measurement method using X-ray diffraction Feb. 21, 2006
6909773 Portable x-ray diffractometer Jun. 21, 2005
6874369 Stress measurement method using X-ray diffraction Apr. 5, 2005
6853706 X-ray diffraction apparatus and method Feb. 8, 2005
6782075 Method of making <200 nm wavelength fluoride crystal lithography/laser optical elements Aug. 24, 2004
6751287 Method and apparatus for x-ray analysis of particle size (XAPS) Jun. 15, 2004
6721393 X-ray diffraction apparatus and method Apr. 13, 2004
6715364 Method for determining the elasto-plastic behavior of components consisting of anisotropic material, and application of the process Apr. 6, 2004
6697453 Portable X-ray diffractometer Feb. 24, 2004
6493420 Apparatus and method for in-situ measurement of residual surface stresses Dec. 10, 2002
6449565 Method and apparatus for determining in real-time the fatigue life of a structure Sep. 10, 2002
6430432 Deriving dimensions of a detail of an object Aug. 6, 2002
6353656 Radioisotope based x-ray residual stress analysis apparatus Mar. 5, 2002
6238941 Characterizing of silicon-germanium areas on silicon May. 29, 2001
6219404 Method of determining if an alloy article has any remaining working life Apr. 17, 2001
6058160 Photo-sensor fiber-optic stress analysis system May. 2, 2000
5625664 Methods for the design, quality control, and management of fatigue-limited metal components Apr. 29, 1997
5490195 Method for measuring and extending the service life of fatigue-limited metal components Feb. 6, 1996
5442676 Method of determining a given characteristic of a material sample Aug. 15, 1995
5414747 Method and apparatus for in-process analysis of polycrystalline films and coatings by x-ray diffraction May. 9, 1995
5373545 Method for the on-line nondestructive measurement of a characteristic of a continuously produced Dec. 13, 1994
5272746 Method of evaluating a degree of fatigue in a structural material Dec. 21, 1993
5148458 Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction Sep. 15, 1992
5126587 Synchronization circuit configuration Jun. 30, 1992
5125016 Procedure and measuring apparatus based on X-ray diffraction for measuring stresses Jun. 23, 1992
5105454 Method for estimating the press formability of galvannealed steel sheets by X-ray diffraction Apr. 14, 1992
5008909 Diffractometer data collecting method and apparatus Apr. 16, 1991
4982417 Method and apparatus for texture analysis Jan. 1, 1991
4959548 Neutron apparatus for measuring strain in composites Sep. 25, 1990
4918711 Method for improve x-ray diffraction determinations of residual stress in nickel-base alloys Apr. 17, 1990
4916720 X-ray analyzer Apr. 10, 1990
4821302 Method and apparatus for transient unit cell measurement Apr. 11, 1989
4709383 Method for evaluating residual fatigue life of mechanical parts Nov. 24, 1987
4686631 Method for determining internal stresses in polycrystalline solids Aug. 11, 1987
4561062 Stress measurement by X-ray diffractometry Dec. 24, 1985
4489425 Means and method for determining residual stress on a polycrystalline sample by X-ray diffraction Dec. 18, 1984
4426718 X-Ray diffraction apparatus Jan. 17, 1984
4404682 Method for foreseeing residual life of structural member making use of X-ray Sep. 13, 1983

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