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Class Information
Number: 374/9
Name: Thermal measuring and testing > Emissivity determination
Description: Subject matter for determining the ability of an object to radiate energy in accordance with its temperature.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7425896 |
Tag testing device, tag testing method, and tag testing program |
Sep. 16, 2008 |
| 7407325 |
Method and apparatus for measuring thermophysical properties |
Aug. 5, 2008 |
| 7390123 |
Variable emittance surfaces |
Jun. 24, 2008 |
| 7318671 |
Heat-flux based emissivity/absorptivity measurement |
Jan. 15, 2008 |
| 7316505 |
Method of defining the emission coefficient of a surface to be heated |
Jan. 8, 2008 |
| 7118271 |
Calibrating temperature sensors of weathering devices by means of contactless temperature measurement |
Oct. 10, 2006 |
| 7037733 |
Method for measuring temperature, annealing method and method for fabricating semiconductor device |
May. 2, 2006 |
| 6796144 |
System and method for glass processing and temperature sensing |
Sep. 28, 2004 |
| 6461036 |
System and method for determining stray light in a thermal processing system |
Oct. 8, 2002 |
| 6379038 |
Temperature determining device and process |
Apr. 30, 2002 |
| 6375348 |
System and method for the real time determination of the in situ emissivity and temperature of a workpiece during processing |
Apr. 23, 2002 |
| 6369363 |
Method of measuring electromagnetic radiation |
Apr. 9, 2002 |
| 6183127 |
System and method for the real time determination of the in situ emissivity of a workpiece during processing |
Feb. 6, 2001 |
| 6156148 |
Process for producing a protective cap for an infrared radiation thermometer that can be introduced into a body cavity |
Dec. 5, 2000 |
| 6056434 |
Apparatus and method for determining the temperature of objects in thermal processing chambers |
May. 2, 2000 |
| 5993059 |
Combined emissivity and radiance measurement for determination of temperature of radiant object |
Nov. 30, 1999 |
| 5868496 |
Non-contact surface temperature, emissivity, and area estimation |
Feb. 9, 1999 |
| 5864776 |
Apparatus and method for detecting an error in the placement of a lead frame on a surface of a die mold |
Jan. 26, 1999 |
| 5822222 |
Multi-wavelength imaging pyrometer |
Oct. 13, 1998 |
| 5785426 |
Self-calibrated active pyrometer for furnace temperature measurements |
Jul. 28, 1998 |
| 5772323 |
Temperature determining device and process |
Jun. 30, 1998 |
| 5769540 |
Non-contact optical techniques for measuring surface conditions |
Jun. 23, 1998 |
| 5738440 |
Combined emissivity and radiance measurement for the determination of the temperature of a radiant object |
Apr. 14, 1998 |
| 5727017 |
Method and apparatus for determining emissivity of semiconductor material |
Mar. 10, 1998 |
| 5690430 |
Apparatus and method for measuring temperature and/or emissivity of steel strip during a coating process |
Nov. 25, 1997 |
| 5601366 |
Method for temperature measurement in rapid thermal process systems |
Feb. 11, 1997 |
| 5597237 |
Apparatus for measuring the emissivity of a semiconductor wafer |
Jan. 28, 1997 |
| 5564830 |
Method and arrangement for determining the layer-thickness and the substrate temperature during coating |
Oct. 15, 1996 |
| 5505543 |
Emissivity measurement apparatus and method |
Apr. 9, 1996 |
| 5501637 |
Temperature sensor and method |
Mar. 26, 1996 |
| 5481112 |
Method and apparatus for process control of material emitting radiation |
Jan. 2, 1996 |
| 5460451 |
Pyrometer including an emissivity meter |
Oct. 24, 1995 |
| 5443315 |
Multi-zone real-time emissivity correction system |
Aug. 22, 1995 |
| 5347128 |
Directional emittance surface measurement system and process |
Sep. 13, 1994 |
| 5326172 |
Multiwavelength pyrometer for gray and non-gray surfaces in the presence of interfering radiation |
Jul. 5, 1994 |
| 5326173 |
Apparatus and method for remote temperature measurement |
Jul. 5, 1994 |
| 5318362 |
Non-contact techniques for measuring temperature of radiation-heated objects |
Jun. 7, 1994 |
| 5310260 |
Non-contact optical techniques for measuring surface conditions |
May. 10, 1994 |
| 5308161 |
Pyrometer apparatus for use in rapid thermal processing of semiconductor wafers |
May. 3, 1994 |
| 5272340 |
Infrared imaging system for simultaneous generation of temperature, emissivity and fluorescence images |
Dec. 21, 1993 |
| 5239488 |
Apparatus and method for determining high temperature surface emissivity through reflectance and radiance measurements |
Aug. 24, 1993 |
| 5165791 |
Method and apparatus for measuring temperature based on infrared light |
Nov. 24, 1992 |
| 5154512 |
Non-contact techniques for measuring temperature or radiation-heated objects |
Oct. 13, 1992 |
| 5098195 |
Directional spectral emissivity measurement system |
Mar. 24, 1992 |
| 5099121 |
Temperature measuring method using infrared sensors and processor |
Mar. 24, 1992 |
| 5021980 |
Remote measurement of temperature |
Jun. 4, 1991 |
| 5011295 |
Method and apparatus to simultaneously measure emissivities and thermodynamic temperatures of remote objects |
Apr. 30, 1991 |
| 4979133 |
Pyrometer |
Dec. 18, 1990 |
| 4974182 |
Method and system for optically measuring simultaneously the emissivity and temperature of objects |
Nov. 27, 1990 |
| 4956538 |
Method and apparatus for real-time wafer temperature measurement using infrared pyrometry in advanced lamp-heated rapid thermal processors |
Sep. 11, 1990 |
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