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Class Information
Number: 374/131
Name: Thermal measuring and testing > Temperature measurement (e.g., thermometer) > In spaced noncontact relationship to specimen > By thermally emitted radiation > Optical system structure (e.g., lens) > With radiation conducting element
Description: Subject matter including a generally elongate element for conducting radiation from one end to the other within the confines of the outer surface of the elongate element.


Patents under this class:
1 2 3 4 5 6

Patent Number Title Of Patent Date Issued
7543982 Sensor and disturbance measurement method using the same Jun. 9, 2009
7537381 Measurement system and method May. 26, 2009
7520666 Method and system for detecting damage in layered structures Apr. 21, 2009
7515986 Methods and systems for controlling and adjusting heat distribution over a part bed Apr. 7, 2009
7509008 Method and apparatus for locating a localized temperature change in a workspace Mar. 24, 2009
7486388 Method and apparatus for standardization of a measuring instrument Feb. 3, 2009
7438468 Multiple band pass filtering for pyrometry in laser based annealing systems Oct. 21, 2008
7390124 Device for contact-free measurement of temperature Jun. 24, 2008
7374335 In situ optical surface temperature measuring techniques and devices May. 20, 2008
7306367 Emissivity-independent silicon surface temperature measurement Dec. 11, 2007
7255474 Parallel infrared spectroscopy apparatus and method Aug. 14, 2007
7234862 Apparatus for measuring temperatures of a wafer using specular reflection spectroscopy Jun. 26, 2007
7144154 System and method of measuring and controlling temperature of optical fiber tip in a laser system Dec. 5, 2006
7104683 Thermally compensated fluorescence decay rate temperature sensor and method of use Sep. 12, 2006
7080940 In situ optical surface temperature measuring techniques and devices Jul. 25, 2006
7077566 Methods and apparatus for temperature measurement and control in electromagnetic coils Jul. 18, 2006
7059765 Temperature measuring apparatus and related improvements Jun. 13, 2006
7036978 Pyrometer May. 2, 2006
7033070 Method and apparatus for measuring temperature Apr. 25, 2006
6997603 Instrumented fiber optic tow cable Feb. 14, 2006
6991368 Infrared thermometer Jan. 31, 2006
6964516 Device and method for measuring temperature in molten metals Nov. 15, 2005
6923573 Apparatus and method for measuring temperature of molten metal Aug. 2, 2005
6886977 Measuring temperature in stationary components of electrical machines using fiber optics May. 3, 2005
6885965 Processing system for remote chemical identification Apr. 26, 2005
6880968 Test element analysis system Apr. 19, 2005
6860634 Temperature measuring method, heat treating device and method, computer program, and radiation thermometer Mar. 1, 2005
6840669 Methods and devices for sensing temperature and another physical parameter with a single optical probe Jan. 11, 2005
6839507 Black reflector plate Jan. 4, 2005
6817759 Method of enhancing spatial resolution for distributed temperature measurement Nov. 16, 2004
6811307 DTS measurement of HV cable temperature profile Nov. 2, 2004
6811306 Infrared ear thermometer Nov. 2, 2004
6776522 Apparatus and system for monitoring temperature of high voltage conductors Aug. 17, 2004
6772085 Device for self-verifying temperature measurement and control Aug. 3, 2004
6749334 Ear thermometer probe structure Jun. 15, 2004
6746149 Rare earth optical temperature sensor Jun. 8, 2004
6709154 Radiation thermometer and radiation sensor with several sensor elements, method for determining temperature Mar. 23, 2004
6682216 Single-fiber multi-color pyrometry Jan. 27, 2004
6644848 Pipeline monitoring systems Nov. 11, 2003
6637931 Probe for use in an infrared thermometer Oct. 28, 2003
6632016 Method of stabilizing an infrared clinical thermometer and the apparatus thereof Oct. 14, 2003
6609823 Infrared radiation thermometer with variable exterior probe head for conforming to body cavity Aug. 26, 2003
6607300 Methods and devices for sensing temperature and oxygen pressure with a single optical probe Aug. 19, 2003
6579005 Utilization of pyrometer data to detect oxidation Jun. 17, 2003
6575622 Correction of wafer temperature drift in a plasma reactor based upon continuous wafer temperature measurements using an in-situ wafer temperature optical probe Jun. 10, 2003
6572264 Radiation clinical thermometer Jun. 3, 2003
6572265 In situ optical surface temperature measuring techniques and devices Jun. 3, 2003
6530687 Temperature measuring system Mar. 11, 2003
6513970 Infrared thermometer Feb. 4, 2003
6473708 Device and method for self-verifying temperature measurement and control Oct. 29, 2002

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