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Class Information
Number: 374/128
Name: Thermal measuring and testing > Temperature measurement (e.g., thermometer) > In spaced noncontact relationship to specimen > By thermally emitted radiation > Having significant signal handling circuitry (e.g., linearizing, emissivity compensation)
Description: Subject matter having details of a circuit which processes the sensed signal.


Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
7340293 Methods and apparatus for a remote, noninvasive technique to detect core body temperature in a subject via thermal imaging Mar. 4, 2008
7329044 Infrared clinical thermometer and temperature state estimation method, information notification method, and measurement operation method thereof Feb. 12, 2008
7313501 Method and system for determining the location of a potential defect in a device based on a temperature profile Dec. 25, 2007
7304272 Systems and methods for adjusting parameters of a temperature sensor for settling time reduction Dec. 4, 2007
7192186 Multimeter with non-contact temperature measurement Mar. 20, 2007
7056012 Multimeter with non-contact temperature measurement Jun. 6, 2006
7052176 Remote temperature measuring system for hostile industrial environments using microwave radiometry May. 30, 2006
6939038 Electronic ear thermometer with multiple measurement and memory function Sep. 6, 2005
6871999 Method for the correction of the output signal of an infra red radiation multiple element sensor Mar. 29, 2005
6839651 Probe tip thermal isolation and fast prediction algorithm Jan. 4, 2005
6839507 Black reflector plate Jan. 4, 2005
6821016 Infrared clinical thermometer and temperature state estimation method, information notification method, and measurement operation method thereof Nov. 23, 2004
6815235 Methods of controlling formation of metal silicide regions, and system for performing same Nov. 9, 2004
6756591 Method and device for photothermal imaging tiny particles immersed in a given medium Jun. 29, 2004
6682216 Single-fiber multi-color pyrometry Jan. 27, 2004
6538238 Long term calibration of sensor assembly for glass-ceramic cooktop appliance Mar. 25, 2003
6402371 Axillary infrared thermometer and method of use Jun. 11, 2002
6398406 Temperature determination using pyrometry Jun. 4, 2002
6379038 Temperature determining device and process Apr. 30, 2002
6375350 Range pyrometer Apr. 23, 2002
6374150 Method and apparatus for monitoring and/or end point detecting a process Apr. 16, 2002
6299346 Active pyrometry with emissivity extrapolation and compensation Oct. 9, 2001
6283630 Temperature measuring method using radiation thermometer Sep. 4, 2001
6267501 Ambient temperature micro-bolometer control, calibration, and operation Jul. 31, 2001
6217212 Method and device for detecting an incorrect position of a semiconductor wafer Apr. 17, 2001
6183127 System and method for the real time determination of the in situ emissivity of a workpiece during processing Feb. 6, 2001
6179466 Method and apparatus for measuring substrate temperatures Jan. 30, 2001
6155712 Radiation clinical thermometer Dec. 5, 2000
6132081 Method for calibrating optical sensor used to measure the temperature of a substrate during rapid thermal process Oct. 17, 2000
6132084 Infrared non-contact temperature measurement for household appliances Oct. 17, 2000
6086246 Two-element plasma resistant lightpipe assembly Jul. 11, 2000
6072164 Heat-treating method and radiant heating device Jun. 6, 2000
6062729 Rapid IR transmission thermometry for wafer temperature sensing May. 16, 2000
6056434 Apparatus and method for determining the temperature of objects in thermal processing chambers May. 2, 2000
6012840 Single-fiber multi-color pyrometry Jan. 11, 2000
5993059 Combined emissivity and radiance measurement for determination of temperature of radiant object Nov. 30, 1999
5967661 Temperature calibration substrate Oct. 19, 1999
5868496 Non-contact surface temperature, emissivity, and area estimation Feb. 9, 1999
5860740 Thermometer Jan. 19, 1999
5823681 Multipoint temperature monitoring apparatus for semiconductor wafers during processing Oct. 20, 1998
5820263 Apparatus and method for monitoring the temperature of a region of human tissue Oct. 13, 1998
5785426 Self-calibrated active pyrometer for furnace temperature measurements Jul. 28, 1998
5769540 Non-contact optical techniques for measuring surface conditions Jun. 23, 1998
5764684 Infrared thermocouple improvements Jun. 9, 1998
5755511 Method and apparatus for measuring substrate temperatures May. 26, 1998
5743644 Temperature measuring apparatus Apr. 28, 1998
5738440 Combined emissivity and radiance measurement for the determination of the temperature of a radiant object Apr. 14, 1998
5717608 Electro-optical board assembly for measuring the temperature of an object surface from infra-red emissions thereof, including an automatic gain control therefore Feb. 10, 1998
5696703 Method and apparatus for non-contact temperature measurement Dec. 9, 1997
5690429 Method and apparatus for emissivity independent self-calibrating of a multiwavelength pyrometer Nov. 25, 1997

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