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Class Information
Number: 374/126
Name: Thermal measuring and testing > Temperature measurement (e.g., thermometer) > In spaced noncontact relationship to specimen > By thermally emitted radiation > Having emissivity compensating or specified radiating surface
Description: Subject matter including an arrangement to provide, or to compensate for departure from, a fourth power dependence of the emitted radiation on the absolute temperature, or from the amount of radiation emitted by a completely black surface with an emissivity of one.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7591586 |
Method of temperature measurement and temperature-measuring device using the same |
Sep. 22, 2009 |
| 7346386 |
Temporal artery temperature detector |
Mar. 18, 2008 |
| 7313501 |
Method and system for determining the location of a potential defect in a device based on a temperature profile |
Dec. 25, 2007 |
| 7231307 |
Temperature measuring apparatus, and temperature correction processing device |
Jun. 12, 2007 |
| 7169717 |
Method of producing a calibration wafer |
Jan. 30, 2007 |
| 7037733 |
Method for measuring temperature, annealing method and method for fabricating semiconductor device |
May. 2, 2006 |
| 6964515 |
Temperature determining device, temperature correcting method, and image forming apparatus |
Nov. 15, 2005 |
| 6847012 |
Apparatus and method for measuring the temperature of substrates |
Jan. 25, 2005 |
| 6839507 |
Black reflector plate |
Jan. 4, 2005 |
| 6815235 |
Methods of controlling formation of metal silicide regions, and system for performing same |
Nov. 9, 2004 |
| 6756591 |
Method and device for photothermal imaging tiny particles immersed in a given medium |
Jun. 29, 2004 |
| 6682216 |
Single-fiber multi-color pyrometry |
Jan. 27, 2004 |
| 6641302 |
Thermal process apparatus for a semiconductor substrate |
Nov. 4, 2003 |
| 6585410 |
Radiant temperature nulling radiometer |
Jul. 1, 2003 |
| 6584426 |
Electronic thermometer |
Jun. 24, 2003 |
| 6572264 |
Radiation clinical thermometer |
Jun. 3, 2003 |
| 6561694 |
Method and device for calibrating measurements of temperatures independent of emissivity |
May. 13, 2003 |
| 6530687 |
Temperature measuring system |
Mar. 11, 2003 |
| 6517238 |
Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection |
Feb. 11, 2003 |
| 6488407 |
Radiation temperature measuring method and radiation temperature measuring system |
Dec. 3, 2002 |
| 6447160 |
Blackbody cavity for calibration of infrared thermometers |
Sep. 10, 2002 |
| 6402371 |
Axillary infrared thermometer and method of use |
Jun. 11, 2002 |
| 6398406 |
Temperature determination using pyrometry |
Jun. 4, 2002 |
| 6379038 |
Temperature determining device and process |
Apr. 30, 2002 |
| 6375350 |
Range pyrometer |
Apr. 23, 2002 |
| 6369363 |
Method of measuring electromagnetic radiation |
Apr. 9, 2002 |
| 6349270 |
Method and apparatus for measuring the temperature of objects on a fast moving holder |
Feb. 19, 2002 |
| 6332090 |
Thermally isolated probe for biomedical apparatus and method of communicating energy there through |
Dec. 18, 2001 |
| 6299346 |
Active pyrometry with emissivity extrapolation and compensation |
Oct. 9, 2001 |
| 6293696 |
System and process for calibrating pyrometers in thermal processing chambers |
Sep. 25, 2001 |
| 6292685 |
Temporal artery temperature detector |
Sep. 18, 2001 |
| 6283630 |
Temperature measuring method using radiation thermometer |
Sep. 4, 2001 |
| 6241384 |
Axillary infrared thermometer and method of use |
Jun. 5, 2001 |
| 6217212 |
Method and device for detecting an incorrect position of a semiconductor wafer |
Apr. 17, 2001 |
| 6203193 |
Radiation thermometer and method for adjusting the same |
Mar. 20, 2001 |
| 6200634 |
Thermal processing system with supplemental resistive heater and shielded optical pyrometry |
Mar. 13, 2001 |
| 6191392 |
Method of measuring electromagnetic radiation |
Feb. 20, 2001 |
| 6183127 |
System and method for the real time determination of the in situ emissivity of a workpiece during processing |
Feb. 6, 2001 |
| 6179466 |
Method and apparatus for measuring substrate temperatures |
Jan. 30, 2001 |
| 6155712 |
Radiation clinical thermometer |
Dec. 5, 2000 |
| 6132081 |
Method for calibrating optical sensor used to measure the temperature of a substrate during rapid thermal process |
Oct. 17, 2000 |
| 6132084 |
Infrared non-contact temperature measurement for household appliances |
Oct. 17, 2000 |
| 6086246 |
Two-element plasma resistant lightpipe assembly |
Jul. 11, 2000 |
| 6072164 |
Heat-treating method and radiant heating device |
Jun. 6, 2000 |
| 6062729 |
Rapid IR transmission thermometry for wafer temperature sensing |
May. 16, 2000 |
| 6056434 |
Apparatus and method for determining the temperature of objects in thermal processing chambers |
May. 2, 2000 |
| 6027244 |
Apparatus for determining the temperature of a semi-transparent radiating body |
Feb. 22, 2000 |
| 6012840 |
Single-fiber multi-color pyrometry |
Jan. 11, 2000 |
| 5997175 |
Method for determining the temperature of a semi-transparent radiating body |
Dec. 7, 1999 |
| 5993059 |
Combined emissivity and radiance measurement for determination of temperature of radiant object |
Nov. 30, 1999 |
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