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Class Information
Number: 365/201
Name: Static information storage and retrieval > Read/write circuit > Testing
Description: Subject matter including the specifics of the memory which are tested for defects or erroneous information.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7627795 |
Pipelined data processor with deterministic signature generation |
Dec. 1, 2009 |
| 7627792 |
Memory built-in self repair (MBISR) circuits/devices and method for repairing a memory comprising a memory built-in self repair (MBISR) structure |
Dec. 1, 2009 |
| 7626876 |
Semiconductor memory device and its test method |
Dec. 1, 2009 |
| 7626875 |
Multi-wordline test control circuit and controlling method thereof |
Dec. 1, 2009 |
| 7626874 |
Method and apparatus for testing a memory device with a redundant self repair feature |
Dec. 1, 2009 |
| 7626852 |
Adaptive voltage control for SRAM |
Dec. 1, 2009 |
| 7624319 |
Performance monitoring system |
Nov. 24, 2009 |
| 7624317 |
Parallel bit test circuit and method for semiconductor memory device |
Nov. 24, 2009 |
| 7624315 |
Adapter card for connection to a data bus in a data processing unit and method for operating a DDR memory module |
Nov. 24, 2009 |
| 7624313 |
TCAM BIST with redundancy |
Nov. 24, 2009 |
| 7624001 |
Analysis method, program for performing the method, and information processing apparatus |
Nov. 24, 2009 |
| 7623403 |
NAND flash memory device and method of operating the same |
Nov. 24, 2009 |
| 7623391 |
Data transfer verification systems and methods |
Nov. 24, 2009 |
| 7619946 |
Active driver for use in semiconductor device |
Nov. 17, 2009 |
| 7619943 |
Circuit and method for controlling self-refresh cycle |
Nov. 17, 2009 |
| 7619938 |
Repairing advanced-memory buffer (AMB) with redundant memory buffer for repairing DRAM on a fully-buffered memory-module |
Nov. 17, 2009 |
| 7619937 |
Semiconductor memory device with reset during a test mode |
Nov. 17, 2009 |
| 7619936 |
System that prevents reduction in data retention |
Nov. 17, 2009 |
| 7617425 |
Method for at-speed testing of memory interface using scan |
Nov. 10, 2009 |
| 7616509 |
Dynamic voltage adjustment for memory |
Nov. 10, 2009 |
| 7613968 |
Device and method for JTAG test |
Nov. 3, 2009 |
| 7613960 |
Semiconductor device test apparatus and method |
Nov. 3, 2009 |
| 7613031 |
System, apparatus, and method to increase read and write stability of scaled SRAM memory cells |
Nov. 3, 2009 |
| 7610532 |
Serializer/de-serializer bus controller interface |
Oct. 27, 2009 |
| 7610528 |
Configuring flash memory |
Oct. 27, 2009 |
| 7610525 |
Defective memory block identification in a memory device |
Oct. 27, 2009 |
| 7610523 |
Method and template for physical-memory allocation for implementing an in-system memory test |
Oct. 27, 2009 |
| 7610423 |
Service interface to a memory system |
Oct. 27, 2009 |
| 7609543 |
Method and implementation of stress test for MRAM |
Oct. 27, 2009 |
| 7607055 |
Semiconductor memory device and method of testing the same |
Oct. 20, 2009 |
| 7606103 |
Semiconductor memory device for controlling reservoir capacitor |
Oct. 20, 2009 |
| 7606092 |
Testing for SRAM memory data retention |
Oct. 20, 2009 |
| 7606091 |
Method for non-volatile memory with reduced erase/write cycling during trimming of initial programming voltage |
Oct. 20, 2009 |
| 7606077 |
Non-volatile memory with reduced erase/write cycling during trimming of initial programming voltage |
Oct. 20, 2009 |
| 7605434 |
Semiconductor memory device to which test data is written |
Oct. 20, 2009 |
| 7603603 |
Configurable memory architecture with built-in testing mechanism |
Oct. 13, 2009 |
| 7603596 |
Memory device capable of detecting its failure |
Oct. 13, 2009 |
| 7603595 |
Memory test circuit and method |
Oct. 13, 2009 |
| 7603592 |
Semiconductor device having a sense amplifier array with adjacent ECC |
Oct. 13, 2009 |
| 7603493 |
Dynamically setting burst length of memory device by applying signal to at least one external pin during a read or write transaction |
Oct. 13, 2009 |
| 7603246 |
Data interface calibration |
Oct. 13, 2009 |
| 7600167 |
Flip-flop, shift register, and scan test circuit |
Oct. 6, 2009 |
| 7599242 |
Test circuit for multi-port memory device |
Oct. 6, 2009 |
| 7599236 |
In-circuit Vt distribution bit counter for non-volatile memory devices |
Oct. 6, 2009 |
| 7599235 |
Memory correction system and method |
Oct. 6, 2009 |
| 7599206 |
Non-volatile semiconductor storage device |
Oct. 6, 2009 |
| 7598749 |
Integrated circuit with fuse programming damage detection |
Oct. 6, 2009 |
| 7596729 |
Memory device testing system and method using compressed fail data |
Sep. 29, 2009 |
| 7596728 |
Built-in self repair circuit for a multi-port memory and method thereof |
Sep. 29, 2009 |
| 7596042 |
Semiconductor memory device having a plurality of chips and capability of outputting a busy signal |
Sep. 29, 2009 |
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