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Class Information
Number: 365/201
Name: Static information storage and retrieval > Read/write circuit > Testing
Description: Subject matter including the specifics of the memory which are tested for defects or erroneous information.










Patents under this class:

Patent Number Title Of Patent Date Issued
8713404 Controller interface providing improved data reliability Apr. 29, 2014
8712580 Transferring storage devices within storage device testing systems Apr. 29, 2014
8711646 Architecture, system and method for testing resistive type memory Apr. 29, 2014
8711645 Victim port-based design for test area overhead reduction in multiport latch-based memories Apr. 29, 2014
8711641 Memory device, test operation method thereof, and system including the same Apr. 29, 2014
8711240 Data recording apparatus with recording control based on defect block and control method thereof Apr. 29, 2014
8705301 System and method for controlling timing of output signals Apr. 22, 2014
8705300 Memory array circuitry with stability enhancement features Apr. 22, 2014
8705296 Memory controller and control method Apr. 22, 2014
8705279 Nonvolatile memory device and reading method thereof Apr. 22, 2014
8705268 Quantifying the read and write margins of memory bit cells Apr. 22, 2014
8705264 Method and apparatus for increasing yield Apr. 22, 2014
8693271 Method of stressing static random access memories for pass transistor defects Apr. 8, 2014
8687447 Semiconductor memory apparatus and test method using the same Apr. 1, 2014
8687446 Semiconductor device with self refresh test mode Apr. 1, 2014
8687444 Semiconductor device and manufacturing method thereof Apr. 1, 2014
8687443 Semiconductor apparatus Apr. 1, 2014
8687441 Method for searching optimum value of memory Apr. 1, 2014
8683456 Test partitioning for a non-volatile memory Mar. 25, 2014
8683276 Apparatus and method for repairing an integrated circuit Mar. 25, 2014
8675432 Semiconductor device capable of being tested after packaging Mar. 18, 2014
8675431 Semiconductor memory device and defective cell relieving method Mar. 18, 2014
8675430 Semiconductor storage device Mar. 18, 2014
8671329 Low overhead and timing improved architecture for performing error checking and correction for memories and buses in system-on-chips, and other circuits, systems and processes Mar. 11, 2014
8670283 Controller to detect malfunctioning address of memory device Mar. 11, 2014
8670272 Memory with weighted multi-page read Mar. 11, 2014
8670269 Resistive memory device and method of writing data using multi-mode switching current Mar. 11, 2014
8670263 Data holding device Mar. 11, 2014
8667345 Burn-in method for embedded multi media card, and test board using the same, and embedded multi media card tested by the same Mar. 4, 2014
8665627 Built-in self test for one-time-programmable memory Mar. 4, 2014
8659969 Semiconductor device Feb. 25, 2014
8659962 Semiconductor device, semiconductor system having the same and operating method thereof Feb. 25, 2014
8654603 Test operation for a low-power double-data-rate (LPDDR) nonvolatile memory device Feb. 18, 2014
8654598 Redundancy system for non-volatile memory Feb. 18, 2014
8653824 Delta temperature test method and system Feb. 18, 2014
8650447 Apparatus and methods for controlled error injection Feb. 11, 2014
8649235 Semiconductor memory device and operating method thereof Feb. 11, 2014
8645773 Estimating temporal degradation of non-volatile solid-state memory Feb. 4, 2014
8644099 Apparatus and method for determining a read level of a flash memory after an inactive period of time Feb. 4, 2014
8644098 Dynamic random access memory address line test technique Feb. 4, 2014
8644092 Multi-chip package and method of operating the same Feb. 4, 2014
8638634 Apparatus and method to measure energy capacity of a backup power supply without compromising power delivery Jan. 28, 2014
8638632 Access line management in a memory device Jan. 28, 2014
8638631 Semiconductor device Jan. 28, 2014
8638626 Row address control circuit semiconductor memory device including the same and method of controlling row address Jan. 28, 2014
8638596 Non-volatile memory saving cell information in a non-volatile memory array Jan. 28, 2014
RE44726 Data inversion register technique for integrated circuit memory testing Jan. 21, 2014
8634269 Data output circuit of semiconductor memory apparatus Jan. 21, 2014
8634264 Apparatuses, integrated circuits, and methods for measuring leakage current Jan. 21, 2014
8634263 Integrated circuit having memory repair information storage and method therefor Jan. 21, 2014











 
 
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