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Class Information
Number: 365/185.22
Name: Static information storage and retrieval > Floating gate > Particular biasing > Reference signal (e.g., dummy cell) > Verify signal
Description: Subject matter under 185.2 including the use of any circuitry, procedure, or other means to verify that the data signal has been properly written or erased from a memory cell.


Patents under this class:

Patent Number Title Of Patent Date Issued
7630256 Erase operation in a flash drive memory Dec. 8, 2009
7630255 Method for erasing data of NAND flash memory device Dec. 8, 2009
7630246 Programming rate identification and control in a solid state memory Dec. 8, 2009
RE41021 Multi-state EEPROM having write-verify control circuit Dec. 1, 2009
RE41020 Multi-state EEPROM having write-verify control circuit Dec. 1, 2009
RE41019 Multi-state EEPROM having write-verify control circuit Dec. 1, 2009
7626868 Level verification and adjustment for multi-level cell (MLC) non-volatile memory (NVM) Dec. 1, 2009
7623390 Programming method for non-volatile memory and non-volatile memory-based programmable logic device Nov. 24, 2009
7623388 Method for detecting erroneous word lines of a memory array and device thereof Nov. 24, 2009
7623377 Flash memory device having single page buffer structure and related programming operations Nov. 24, 2009
7623374 Non-volatile memory devices and methods of programming the same Nov. 24, 2009
7619938 Repairing advanced-memory buffer (AMB) with redundant memory buffer for repairing DRAM on a fully-buffered memory-module Nov. 17, 2009
7619934 Method and apparatus for adaptive memory cell overerase compensation Nov. 17, 2009
7619932 Algorithm for charge loss reduction and Vt distribution improvement Nov. 17, 2009
7619931 Program-verify method with different read and verify pass-through voltages Nov. 17, 2009
7619930 Dynamic verify based on threshold voltage distribution Nov. 17, 2009
7619925 Virtual ground array memory and programming method thereof Nov. 17, 2009
7619922 Method for non-volatile memory with background data latch caching during erase operations Nov. 17, 2009
7616499 Retention margin program verification Nov. 10, 2009
7616496 Charge trap type non-volatile memory device and program method thereof Nov. 10, 2009
7616481 Memories with alternate sensing techniques Nov. 10, 2009
7613046 Nonvolatile semiconductor memory device carrying out simultaneous programming of memory cells Nov. 3, 2009
7609560 Sensing of memory cells in a solid state memory device by fixed discharge of a bit line Oct. 27, 2009
7609557 Non-volatile memory cell read failure reduction Oct. 27, 2009
7609556 Non-volatile memory with improved program-verify operations Oct. 27, 2009
7609552 Non-volatile memory with background data latch caching during erase operations Oct. 27, 2009
7609548 Method of programming a multi level cell Oct. 27, 2009
7606100 Erasing non-volatile memory using individual verification and additional erasing of subsets of memory cells Oct. 20, 2009
7606084 Programming differently sized margins and sensing with compensations at select states for improved read operations in non-volatile memory Oct. 20, 2009
7606080 Erase verifying method of NAND flash memory device Oct. 20, 2009
7606079 Reducing power consumption during read operations in non-volatile storage Oct. 20, 2009
7606078 Method for programming of memory cells, in particular of the flash type, and corresponding programming architecture Oct. 20, 2009
7606077 Non-volatile memory with reduced erase/write cycling during trimming of initial programming voltage Oct. 20, 2009
7606072 Non-volatile storage with compensation for source voltage drop Oct. 20, 2009
7606071 Compensating source voltage drop in non-volatile storage Oct. 20, 2009
7602652 Systems for programming differently sized margins and sensing with compensations at select states for improved read operations in non-volatile memory Oct. 13, 2009
7602650 Flash memory device and method for programming multi-level cells in the same Oct. 13, 2009
7599225 Method of programming and erasing a non-volatile memory array Oct. 6, 2009
7599224 Systems for coarse/fine program verification in non-volatile memory using different reference levels for improved sensing Oct. 6, 2009
7599223 Non-volatile memory with linear estimation of initial programming voltage Oct. 6, 2009
7599222 Semiconductor memory device using pipelined-buffer programming and related method Oct. 6, 2009
7599219 Flash memory devices that support incremental step-pulse programming using nonuniform verify time intervals Oct. 6, 2009
7596037 Independent bi-directional margin control per level and independently expandable reference cell levels for flash memory sensing Sep. 29, 2009
7596036 Memory control circuit, microcomputer, and data rewriting method Sep. 29, 2009
7596031 Faster programming of highest multi-level state for non-volatile memory Sep. 29, 2009
7593267 Method of writing data to a semiconductor memory device Sep. 22, 2009
7593266 Semiconductor memory device and method of verifying the same Sep. 22, 2009
7593265 Low noise sense amplifier array and method for nonvolatile memory Sep. 22, 2009
7593260 Semiconductor memory device for storing multivalued data Sep. 22, 2009
7590007 Nonvolatile semiconductor memory device Sep. 15, 2009



 
 
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