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Browse by Category: Main > Optical & Optics
Class Information
Number: 356/634
Name: Optics: measuring and testing > Dimension > Length
Description: Subject matter comprising means to measure the largest dimension of an article, or if the article is moving, the dimension in the direction of movement.










Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
8610904 Apparatus and method for inspecting a tampon Dec. 17, 2013
8467073 Lay length and ratio measuring device for electrical cable Jun. 18, 2013
8457361 Optical semi-quantitative 100% filling check of pharmaceutical capsules on capsule-filling machines Jun. 4, 2013
8358424 Distance measuring apparatus, distance measuring method, distance measurement program and computer readable recording medium Jan. 22, 2013
8355122 Non-contacting aligning method for planes in three-dimensional environment Jan. 15, 2013
8314931 Method and system for standardizing microscope instruments Nov. 20, 2012
8294897 Method for imaging a sample using a microscope, and microscope and data storage center Oct. 23, 2012
8279454 Method of measuring a length of sections of extrados or intrados curves of an elongated workpiece, and relevant length measuring instrument Oct. 2, 2012
8248620 Object detection device Aug. 21, 2012
8072617 Method and arrangement for measuring timber piece Dec. 6, 2011
8035824 Differential critical dimension and overlay metrology apparatus and measurement method Oct. 11, 2011
8004559 Apparatus for measuring three dimensional shape Aug. 23, 2011
7973943 Determining track origin Jul. 5, 2011
7969582 Laser scanning microscope apparatus, and surface shape measuring method thereof Jun. 28, 2011
7853426 Device for automatically determining a category of mail to which a mailpiece delivered to a franking system belongs Dec. 14, 2010
7826048 Apparatus for measuring doctor blade geometric deviations Nov. 2, 2010
7821652 System and method for focusing discrete points on an under-measured object Oct. 26, 2010
7804588 Measuring device for optical and spectroscopic examination of a sample Sep. 28, 2010
7700247 Differential critical dimension and overlay metrology apparatus and measurement method Apr. 20, 2010
7684059 Device for determining the position of an object movable along at least one displacement direction Mar. 23, 2010
7684061 Electronic component mounting apparatus, height detection method for electronic component, and optical-axis adjustment method for component height detection unit Mar. 23, 2010
7609393 Filling test method and device Oct. 27, 2009
7595482 Standard component for length measurement, method for producing the same, and electron beam metrology system using the same Sep. 29, 2009
7593115 Determining a length of a carrier line deployed into a well based on an optical signal Sep. 22, 2009
7578068 Detecting apparatus for workpiece Aug. 25, 2009
7580137 Method and apparatus for determining one or more physical properties of a rolled smoking article or filter rod Aug. 25, 2009
7573587 Method and device for continuously measuring silicon island elevation Aug. 11, 2009
7570369 Method and a device for measurement of edges Aug. 4, 2009
7543371 Apparatus for a disk drive actuator pivot set height tooling with an active servo compensation Jun. 9, 2009
7524105 Optical dilatometer Apr. 28, 2009
RE40676 Scanner unit for an optical position measuring device Mar. 24, 2009
7505155 Apparatus and method for inspecting poly-silicon Mar. 17, 2009
7485859 Charged beam apparatus and method that provide charged beam aerial dimensional map Feb. 3, 2009
7477400 Range and speed finder Jan. 13, 2009
7468800 Method and apparatus for determining surface properties Dec. 23, 2008
7466431 Method and apparatus of measuring a length of a band-shaped member Dec. 16, 2008
7435568 Optical cell guidance method and apparatus Oct. 14, 2008
7423269 Automated feature analysis with off-axis tilting Sep. 9, 2008
7414734 Image position detecting device and image forming apparatus using the same Aug. 19, 2008
7397252 Measurement of critical dimension and quantification of electron beam size at real time using electron beam induced current Jul. 8, 2008
7391524 System and method for efficient characterization of diffracting structures with incident plane parallel to grating lines Jun. 24, 2008
7349106 Apparatus and method for thin-layer metrology Mar. 25, 2008
7297930 Device for measuring width by light attenuation difference Nov. 20, 2007
7284604 Methods for measurement of a dimensional characteristic and methods of predictive modeling related thereto Oct. 23, 2007
7285781 Characterizing resist line shrinkage due to CD-SEM inspection Oct. 23, 2007
7164481 Coefficient of linear expansion measuring apparatus and coefficient of linear expansion measuring method Jan. 16, 2007
7161688 Mass scanning and dimensioning system Jan. 9, 2007
7110911 Devices relating to rolled product Sep. 19, 2006
7038767 Three-dimensional micropattern profile measuring system and method May. 2, 2006
7032740 Device for sensing the wear state of wheels or rollers Apr. 25, 2006

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