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Browse by Category: Main > Optical & Optics
Class Information
Number: 356/630
Name: Optics: measuring and testing > Dimension > Thickness
Description: Subject matter comprising means to measure the distance between opposite surfaces in a direction perpendicular to the length and breath of an object.










Sub-classes under this class:

Class Number Class Name Patents
356/631 By triangulation 76
356/632 Of light permeable material 328


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13

Patent Number Title Of Patent Date Issued
8681345 System and method for measuring photovoltaic module thickness Mar. 25, 2014
8654353 Measuring method for topography of moving specimen and a measuring apparatus thereof Feb. 18, 2014
8643842 Method and system for use in monitoring properties of patterned structures Feb. 4, 2014
8645099 Depth sensor, depth estimation method using the same, and depth estimation device including the same Feb. 4, 2014
8625110 Methods of inspecting structures Jan. 7, 2014
8625111 Optical film thickness meter and thin film forming apparatus provided with optical film thickness meter Jan. 7, 2014
8625112 Thickness measuring system for measuring a thickness of a plate-shaped member Jan. 7, 2014
8619268 Apparatus and method for thickness detection Dec. 31, 2013
8580374 Resin molded body Nov. 12, 2013
8582122 Polishing monitoring method, polishing method, and polishing monitoring apparatus Nov. 12, 2013
8582123 Apparatus for determining thickness of a banknote Nov. 12, 2013
8582124 Optical characteristic measuring apparatus and optical characteristic measuring method Nov. 12, 2013
8576280 Image measuring apparatus Nov. 5, 2013
8564793 Thin films measurement method and system Oct. 22, 2013
8559008 Ellipsometer focusing system Oct. 15, 2013
8554351 Spectrographic monitoring of a substrate during processing using index values Oct. 8, 2013
8546760 Apparatus and method for checking thickness dimensions of an element while it is being machined Oct. 1, 2013
8537363 Picosecond ultrasonic system incorporating an optical cavity Sep. 17, 2013
8535115 Gathering spectra from multiple optical heads Sep. 17, 2013
8520220 Apparatus for measuring the dimensions of an object Aug. 27, 2013
8520222 System and method for in situ monitoring of top wafer thickness in a stack of wafers Aug. 27, 2013
8520223 Wet paint coating thickness measurement and instrument Aug. 27, 2013
8508750 Friction-coefficient estimating device and friction-coefficient estimating method Aug. 13, 2013
8507079 Structural color body Aug. 13, 2013
8502979 Methods and systems for determining a critical dimension and overlay of a specimen Aug. 6, 2013
8482744 Thin-film inspection apparatus and method therefor Jul. 9, 2013
8446247 Safety system May. 21, 2013
8440294 Structural color body May. 14, 2013
8441639 Metrology systems and methods May. 14, 2013
8416399 Optical measuring instrument using both reflectometry and white-light interferometry Apr. 9, 2013
8394490 Structural color body Mar. 12, 2013
8379227 Optical metrology on textured samples Feb. 19, 2013
8379228 Apparatus for measuring thin film refractive index and thickness with a spectrophotometer Feb. 19, 2013
8369978 Adjusting polishing rates by using spectrographic monitoring of a substrate during processing Feb. 5, 2013
8339617 Film thickness measuring device and film thickness measuring method Dec. 25, 2012
8334986 Methods and apparatus for the measurement of film thickness Dec. 18, 2012
8332183 Detection and analysis apparatus for membrane filtration process Dec. 11, 2012
8311771 Inspection method of SOI wafer Nov. 13, 2012
8310686 Method for measuring the thickness or curvature of thin films Nov. 13, 2012
8310665 Inspecting method and inspecting apparatus for substrate surface Nov. 13, 2012
8310664 Refractive index distribution measuring method and refractive index distribution measuring apparatus Nov. 13, 2012
8300232 Method of measuring coating thickness using infrared light Oct. 30, 2012
8295150 Optical information medium measurement method, optical information method, optical information medium, recording apparatus, and reproducing apparatus Oct. 23, 2012
8289515 Method and system for use in monitoring properties of patterned structures Oct. 16, 2012
8282096 Automatic document feeder Oct. 9, 2012
8279453 Method and device for measuring thickness of multilayer film Oct. 2, 2012
8274663 Thickness detecting mechanism Sep. 25, 2012
8260446 Spectrographic monitoring of a substrate during processing using index values Sep. 4, 2012
8233155 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method Jul. 31, 2012
8233158 Method and apparatus for determining the layer thickness and the refractive index of a sample Jul. 31, 2012

1 2 3 4 5 6 7 8 9 10 11 12 13










 
 
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