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Class Information
Number: 356/605
Name: Optics: measuring and testing > Shape or surface configuration > Triangulation > Projection of structured light pattern > Pattern is series of non-intersecting lines > Moire
Description: Subject matter wherein an image of the projected pattern of lines is viewed through a grating to create a moire pattern.

Patents under this class:
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Patent Number Title Of Patent Date Issued
8532340 Projecting patterns for high resolution texture extraction Sep. 10, 2013
8411284 Method for simultaneous hue phase-shifting and system for 3-D surface profilometry using the same Apr. 2, 2013
8325331 Method for obtaining incident angle Dec. 4, 2012
8064684 Methods and apparatus for visualizing volumetric data using deformable physical object Nov. 22, 2011
8054471 System and method for analyzing displacements and contouring of surfaces Nov. 8, 2011
8009298 Method and apparatus for acquiring reference grating of three-dimensional measurement system using moire Aug. 30, 2011
7957007 Apparatus and method for illuminating a scene with multiplexed illumination for motion capture Jun. 7, 2011
7901096 Illumination for projecting an image Mar. 8, 2011
7852492 Device for tomographic scanning objects Dec. 14, 2010
7684052 Three-dimensional shape measuring apparatus, program, computer-readable recording medium, and three-dimensional shape measuring method Mar. 23, 2010
7619751 High-accuracy pattern shape evaluating method and apparatus Nov. 17, 2009
7548324 Three-dimensional shape measurement apparatus and method for eliminating 2.pi. ambiguity of moire principle and omitting phase shifting means Jun. 16, 2009
7545516 Full-field three-dimensional measurement method Jun. 9, 2009
7480061 3D shape measurement apparatus and method using stereo moire technique Jan. 20, 2009
7453580 Three-dimensional image measuring apparatus Nov. 18, 2008
7440119 Three-dimensional shape detecting device, image capturing device, and three-dimensional shape detecting method Oct. 21, 2008
7433058 System and method for simultaneous 3D height measurements on multiple sides of an object Oct. 7, 2008
7433255 Information carrier, and system for positioning such an information carrier in an apparatus Oct. 7, 2008
7433256 Information carrier, and system for positioning such an information carrier in a reading and/or writing apparatus Oct. 7, 2008
7430049 Method and device for analyzing the surface of a substrate Sep. 30, 2008
7430052 Method for correlating the line width roughness of gratings and method for measurement Sep. 30, 2008
7417747 Method and a device for measuring the three dimension surface shape by projecting moire interference fringe Aug. 26, 2008
7405835 High-accuracy pattern shape evaluating method and apparatus Jul. 29, 2008
7400413 Three-dimensional shape measuring apparatus using shadow moire Jul. 15, 2008
7388679 Pattern light irradiation device, three dimensional shape measuring device, and method pattern light irradiation Jun. 17, 2008
7385709 Microscopy imaging apparatus and method for generating an image Jun. 10, 2008
7373270 Diagnosing device for stereo camera mounted on robot, and diagnostic method of stereo camera mounted on robot apparatus May. 13, 2008
7298499 Method and system for characterizing structural damage from observing surface distortions Nov. 20, 2007
7286246 Method and apparatus for non-contact three-dimensional surface measurement Oct. 23, 2007
7230723 High-accuracy pattern shape evaluating method and apparatus Jun. 12, 2007
7230722 Shadow moire using non-zero talbot distance Jun. 12, 2007
7119911 Moire deflectometer including non-mechanical, transparent, spatial light modulators for demonstrating two-axis rulings Oct. 10, 2006
6940609 Method and system for measuring the topography of a sample Sep. 6, 2005
6940608 Method and apparatus for surface configuration measurement Sep. 6, 2005
6906809 Surface shape measuring system Jun. 14, 2005
6873421 Method and apparatus for measuring the three-dimensional shape of an object using a moire equipment Mar. 29, 2005
6867871 Moire grating noise eliminating method Mar. 15, 2005
6809803 Surface topology inspection Oct. 26, 2004
6781704 Automatic installation and process for taking measurements and acquiring shapes Aug. 24, 2004
6765684 Surface shape measurement apparatus Jul. 20, 2004
6763133 Moire image capturing apparatus and method therefor Jul. 13, 2004
6731391 Shadow moire surface measurement using Talbot effect May. 4, 2004
6717661 Fourier moire wavefront sensor Apr. 6, 2004
6690474 Apparatus and methods for surface contour measurement Feb. 10, 2004
6636255 Three-dimensional image scanner and heat-insulating device for optical apparatus Oct. 21, 2003
6577405 Phase profilometry system with telecentric projector Jun. 10, 2003
6078396 Non-contact deformation measurement Jun. 20, 2000
6075893 Computer controlled optical system for angular alignment of structures using moire patterns Jun. 13, 2000
5991004 Lens focus shift sensor Nov. 23, 1999
5847832 Moire topographic measurement Dec. 8, 1998

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