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Class Information
Number: 356/517
Name: Optics: measuring and testing > By light interference (e.g., interferometer) > For refractive indexing
Description: Measuring and testing by light interference wherein the beams are phased in accordance with a refractive index to be measured.










Sub-classes under this class:

Class Number Class Name Patents
356/518 Having schlieren effect 5


Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
8687204 Method and apparatus for measuring refractive index based on a ratio between a number of second fringes divided by a difference of the number of second fringes minus a number of first fringes Apr. 1, 2014
8665452 Method and apparatus for measuring the refractive index of air based on the laser synthetic wavelength interferometry Mar. 4, 2014
8593624 Refractive index measuring apparatus Nov. 26, 2013
8576148 Interferometric optical modulator with broadband reflection characteristics Nov. 5, 2013
8559015 Measuring apparatus Oct. 15, 2013
8520218 Measuring method of refractive index and measuring apparatus of refractive index Aug. 27, 2013
8508725 Refractive index distribution measuring method and apparatus using position measurement and a reference object Aug. 13, 2013
8488112 Method for contactless measurement of the density of a porous material, using a measurement of the refractive index of the material by optical coherence tomography Jul. 16, 2013
8477297 Refractive index distribution measuring method and apparatus, and method of producing optical element thereof, that use multiple transmission wavefronts of a test object immersed in at least o Jul. 2, 2013
8477316 Interferometer system and method for its operation Jul. 2, 2013
8472013 Refractive index distribution measurement method and apparatus that measure transmission wavefronts of a test object immersed in different media having refractive index lower than that of the Jun. 25, 2013
8405836 System and method for measuring an optical fiber Mar. 26, 2013
8374800 Determining parameters of the dielectric function of a substance in aqueous solution by self-referenced reflection THz spectroscopy Feb. 12, 2013
8310664 Refractive index distribution measuring method and refractive index distribution measuring apparatus Nov. 13, 2012
8237931 Optoacoustic convolver Aug. 7, 2012
8218152 Group refractive index reconstruction with broadband interferometric confocal microscopy Jul. 10, 2012
8101423 Label-free high-throughput optical technique for detecting biomolecular interactions Jan. 24, 2012
8089609 Lithographic apparatus and device manufacturing method Jan. 3, 2012
8077325 Methods, systems and computer program products for characterizing structures based on interferometric phase data Dec. 13, 2011
8072402 Interferometric optical modulator with broadband reflection characteristics Dec. 6, 2011
7978336 Three wavelength quantitative imaging systems Jul. 12, 2011
7864339 Method for the contactless measurement of three-dimensional objects with two layers by single-view backlit shadowgraphy Jan. 4, 2011
7843571 Sensing system Nov. 30, 2010
7835013 Interferometric detection system and method Nov. 16, 2010
7817276 Distinguishing objects Oct. 19, 2010
7812967 Microscopy method and microscope Oct. 12, 2010
7787129 Method and apparatus for measurement of optical properties in tissue Aug. 31, 2010
7777894 Immersion photolithography monitoring Aug. 17, 2010
7643156 Sensor, multichannel sensor, sensing apparatus, and sensing method Jan. 5, 2010
7633629 Tuning optical cavities Dec. 15, 2009
7545510 Method of characterizing transparent thin-films using differential optical sectioning interference microscopy Jun. 9, 2009
7460245 Apparatus and method for measurement and compensation of atmospheric turbulence effects in wavefront interferometry Dec. 2, 2008
7428055 Interferometer-based real time early fouling detection system and method Sep. 23, 2008
7422891 Label-free high-throughput optical technique for detecting biomolecular interactions Sep. 9, 2008
7420682 Sensor device for interference and plasmon-waveguide/interference spectroscopy Sep. 2, 2008
7420689 Method for determining the refractive index during interferometric length measurement and interferometric arrangement therefor Sep. 2, 2008
7403292 Fluid analysis element and fluid analysis apparatus Jul. 22, 2008
7388669 Method of generating interferometric information Jun. 17, 2008
7388676 Image processing apparatus and refractive index distribution measuring apparatus Jun. 17, 2008
7330276 Optical interference substrate, target detecting substrate, target detecting apparatus, and target detecting process Feb. 12, 2008
7286243 Beam profile complex reflectance system and method for thin film and critical dimension measurements Oct. 23, 2007
7268888 Compensation of refractivity perturbations in an interferometer path Sep. 11, 2007
7206078 Non-destructive testing system using a laser beam Apr. 17, 2007
7164480 Compensation for effects of mismatch in indices of refraction at a substrate-medium interface in non-confocal, confocal, and interferometric confocal microscopy Jan. 16, 2007
7130060 Refractive index determination by micro interferometric reflection detection Oct. 31, 2006
7103276 Optical band scanning monitor system and method Sep. 5, 2006
7094595 Label-free high-throughput optical technique for detecting biomolecular interactions Aug. 22, 2006
7062110 Sensor device Jun. 13, 2006
7050176 Sensor assembly May. 23, 2006
7046373 Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure May. 16, 2006

1 2 3 4










 
 
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