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Class Information
Number: 356/495
Name: Optics: measuring and testing > By light interference (e.g., interferometer) > Having polarization > For dimensional measurement > Contour or profile
Description: Dimensional measurement including means for determining a contour, profile, or shape of a surface.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7576866 |
Optical tomography system |
Aug. 18, 2009 |
| 7561279 |
Scanning simultaneous phase-shifting interferometer |
Jul. 14, 2009 |
| 7551292 |
Interferometric Height Measurement |
Jun. 23, 2009 |
| 7551291 |
Interferometric height measurement |
Jun. 23, 2009 |
| 7545504 |
Imaging systems using unpolarized light and related methods and controllers |
Jun. 9, 2009 |
| 7545570 |
System for selectively blocking electromagnetic energy |
Jun. 9, 2009 |
| 7499178 |
Oblique incidence interferometer |
Mar. 3, 2009 |
| 7486402 |
Optical image measuring apparatus |
Feb. 3, 2009 |
| 7483147 |
Apparatus and method for measuring thickness and profile of transparent thin film using white-light interferometer |
Jan. 27, 2009 |
| 7468798 |
System and method for polarization characteristic measurement of optical systems via centroid analysis |
Dec. 23, 2008 |
| 7466426 |
Phase shifting imaging module and method of imaging |
Dec. 16, 2008 |
| 7460248 |
Tissue imaging system |
Dec. 2, 2008 |
| 7453577 |
Apparatus and method for inspecting a patterned part of a sample |
Nov. 18, 2008 |
| 7440112 |
Method and an apparatus for shape measurement, and a frequency comb light generator |
Oct. 21, 2008 |
| 7405830 |
Vibration-insensitive interferometer |
Jul. 29, 2008 |
| 7397569 |
Method and system for interferometric height measurement |
Jul. 8, 2008 |
| 7379188 |
Phase shift interferometer |
May. 27, 2008 |
| 7372578 |
Optical image measuring apparatus |
May. 13, 2008 |
| 7327464 |
System and method for coherent optical inspection |
Feb. 5, 2008 |
| 7324209 |
Apparatus and method for ellipsometric measurements with high spatial resolution |
Jan. 29, 2008 |
| 7321430 |
Vibration resistant interferometry |
Jan. 22, 2008 |
| 7315381 |
Monolithic quadrature detector |
Jan. 1, 2008 |
| 7312876 |
Optical image measuring apparatus |
Dec. 25, 2007 |
| 7304746 |
Common-path point-diffraction phase-shifting interferometer |
Dec. 4, 2007 |
| 7289222 |
Interferometer apparatus and method of processing a substrate having an optical surface |
Oct. 30, 2007 |
| 7289223 |
Method and apparatus for spatially resolved polarimetry |
Oct. 30, 2007 |
| 7286239 |
Laser scanner with amplitude and phase detection |
Oct. 23, 2007 |
| 7283250 |
Measurement of object deformation with optical profiler |
Oct. 16, 2007 |
| 7280221 |
High efficiency low coherence interferometry |
Oct. 9, 2007 |
| 7230718 |
Simultaneous phase-shifting fizeau interferometer |
Jun. 12, 2007 |
| 7230717 |
Pixelated phase-mask interferometer |
Jun. 12, 2007 |
| 7221459 |
Method and system for interferometric height measurement |
May. 22, 2007 |
| 7221458 |
Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method |
May. 22, 2007 |
| 7212290 |
Differential interferometers creating desired beam patterns |
May. 1, 2007 |
| 7209239 |
System and method for coherent optical inspection |
Apr. 24, 2007 |
| 7113707 |
Dynamic optical interconnect |
Sep. 26, 2006 |
| 7106452 |
Measuring device and measuring method |
Sep. 12, 2006 |
| 7106456 |
Common-path point-diffraction phase-shifting interferometer |
Sep. 12, 2006 |
| 7092100 |
Quadrature phase shift interferometer (QPSI) decoder and method of decoding |
Aug. 15, 2006 |
| 7084980 |
SPR interferometer |
Aug. 1, 2006 |
| 7064841 |
Method and arrangement for topographically characterizing a surface of a hard disk with distortion due to disk modes removed |
Jun. 20, 2006 |
| 7057737 |
Common optical-path testing of high-numerical-aperture wavefronts |
Jun. 6, 2006 |
| 7057738 |
Simultaneous phase-shifting Fizeau interferometer |
Jun. 6, 2006 |
| 7050173 |
Method and arrangement for removing noise and measurements of head-media spacing modulation for digital recording |
May. 23, 2006 |
| 7034947 |
Compact interference measuring apparatus for detecting the magnitude and direction of positional deviation |
Apr. 25, 2006 |
| 7019840 |
Dual-beam interferometer for ultra-smooth surface topographical measurements |
Mar. 28, 2006 |
| 7006234 |
Common-path point-diffraction phase-shifting interferometer incorporating a birefringent polymer membrane |
Feb. 28, 2006 |
| 7006231 |
Diffraction grating based interferometric systems and methods |
Feb. 28, 2006 |
| 6989904 |
Method of determining local structures in optical crystals |
Jan. 24, 2006 |
| 6968080 |
Method and apparatus for generating part programs for use in image-measuring instruments, and image-measuring instrument and method of displaying measured results therefrom |
Nov. 22, 2005 |
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