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Class Information
Number: 356/457
Name: Optics: measuring and testing > By light interference (e.g., interferometer) > Holography
Description: Measuring and testing by light interference wherein at least one of the interference light beams is reconstructed from a record of phase and amplitude information of that light beam wavefront.

Sub-classes under this class:

Class Number Class Name Patents
356/458 For optical configuration 106

Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
8705043 Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope Apr. 22, 2014
8675201 Coherent anti-Stokes Raman holography Mar. 18, 2014
8654337 Turbidity sensor Feb. 18, 2014
8525998 Optical phase processing in a scattering medium Sep. 3, 2013
8526003 Interferometric system with spatial carrier frequency capable of imaging in polychromatic radiation Sep. 3, 2013
8508746 Interferometric systems having reflective chambers and related methods Aug. 13, 2013
8479310 Dynamic probe detection system Jul. 2, 2013
8462350 Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and Jun. 11, 2013
8451450 Near real time optical phase conjugation May. 28, 2013
8446458 Miniaturized all-reflective holographic fourier transform imaging spectrometer based on a new all-reflective interferometer May. 21, 2013
8427650 Reconstruction of nonlinear wave propagation Apr. 23, 2013
8416420 Computer generated hologram (ICGH) null Apr. 9, 2013
8390822 Intra-oral three-dimensional imaging system Mar. 5, 2013
8269975 Computer generated hologram system for wavefront measurement system calibration Sep. 18, 2012
8149416 Apparatus and method for dynamic cellular probing and diagnostics using holographic optical forcing array Apr. 3, 2012
8139228 Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materials Mar. 20, 2012
8139711 Radiation phase image radiographing apparatus Mar. 20, 2012
8115933 Interferometer for optically measuring an object Feb. 14, 2012
8111404 Method for determining the dynamic range of volume holographic Feb. 7, 2012
8107083 System aspects for a probe system that utilizes structured-light Jan. 31, 2012
8040521 Holographic condition assessment system for a structure including a semiconductor material Oct. 18, 2011
7978333 Holographic sensor having heterogeneous properties Jul. 12, 2011
7911618 Holographic interferometry for non-destructive testing of power sources Mar. 22, 2011
7880891 Total internal reflection holographic microscope Feb. 1, 2011
7817283 Determining electric field characteristics of laser pulses Oct. 19, 2010
7808646 Interferometer for optically measuring an object Oct. 5, 2010
7796271 Ear canal hologram for hearing apparatuses Sep. 14, 2010
7773230 Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal material Aug. 10, 2010
7733499 Method for optically testing semiconductor devices Jun. 8, 2010
7728958 Condition assessment method for a structure including a semiconductor material Jun. 1, 2010
7671843 Virtual holographic input method and device Mar. 2, 2010
7616320 Method and apparatus for recognition of microorganisms using holographic microscopy Nov. 10, 2009
7609391 Optical lattice microscopy Oct. 27, 2009
7609384 Device for generating a carrier in an interferogram Oct. 27, 2009
7601957 Electron microscope and combined illumination lens Oct. 13, 2009
7599514 Optical information reading device Oct. 6, 2009
7583425 High performance adaptive optics with a reconstructed coherent wave front Sep. 1, 2009
7505138 Holographically compensated, self-referenced interferometer Mar. 17, 2009
7486406 Variable tomographic scanning with wavelength scanning digital interface holography Feb. 3, 2009
7460240 Apparatus and method for detecting deformability of cells using spatially modulated optical force microscopy Dec. 2, 2008
7456973 Method and device for the contour and/or deformation measurement, particularly the interference measurement, of an object Nov. 25, 2008
7420687 Condition assessment system for a structure including a semiconductor material Sep. 2, 2008
7400411 Method for optically testing semiconductor devices Jul. 15, 2008
7379186 Chirp indicator of ultrashort optical pulse May. 27, 2008
7289253 System and methods for shearless hologram acquisition Oct. 30, 2007
7283231 Compressive sampling and signal inference Oct. 16, 2007
7148969 Apparatus for direct-to-digital spatially-heterodyned holography Dec. 12, 2006
7116425 Faster processing of multiple spatially-heterodyned direct to digital holograms Oct. 3, 2006
7068375 Direct-to-digital holography reduction of reference hologram noise and fourier space smearing Jun. 27, 2006
7002691 Spatially-heterodyned holography Feb. 21, 2006

1 2 3

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