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Browse by Category: Main > Optical & Optics
Class Information
Number: 356/446
Name: Optics: measuring and testing > Of light reflection (e.g., glass) > With diffusion
Description: Subject matter wherein the light reflected from the material or sample is scattered by reason of the surface irregularities of the material or sample alone; or wherein the reflected light is a combination of the scattered light and specularly reflected light; or wherein the reflected light is scattered from particles distributed on the surface of the material.


Patents under this class:
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Patent Number Title Of Patent Date Issued
7626709 Device for examining the optical properties of surfaces Dec. 1, 2009
7623239 Systems and methods for measurement of a specimen with vacuum ultraviolet light Nov. 24, 2009
7619740 Microgloss measurement of paper and board Nov. 17, 2009
7616317 Reflectometer and associated light source for use in a chemical analyzer Nov. 10, 2009
7601544 Method and apparatus for using infrared readings to detect misidentification of a diagnostic test strip in a reflectance spectrometer Oct. 13, 2009
7602497 Reflectance sensor for measuring liquid pigment preparations or solid pigmented surfaces Oct. 13, 2009
7599727 Lighting and imaging system including a flat light source with LED illumination Oct. 6, 2009
7586617 Controlling a dynamic signal range in an optical time domain reflectometry Sep. 8, 2009
7580131 Angularly resolved scatterometer and inspection method Aug. 25, 2009
7557922 Detection system for use in a sorting apparatus, a method for determining drift in the detection system and a sorting apparatus comprising such detection system Jul. 7, 2009
7557925 Optical instrument and parts thereof for optimally defining light pathways Jul. 7, 2009
7554665 Dual beam set-up for parousiameter Jun. 30, 2009
7548312 Measuring device for ingredient detection Jun. 16, 2009
7545502 Methods for detecting compression wood in lumber Jun. 9, 2009
7538865 Source and detector sensor arrangement May. 26, 2009
7538871 Colour measurement device with associated measurement head May. 26, 2009
7525647 Medical device probe with source and detector sensors Apr. 28, 2009
7522294 Measuring a process parameter of a semiconductor fabrication process using optical metrology Apr. 21, 2009
7521954 Method for determining a minority carrier diffusion length using surface photo voltage measurements Apr. 21, 2009
7508504 Automatic wafer edge inspection and review system Mar. 24, 2009
7508522 Reflected light measuring apparatus and reflected light measuring method Mar. 24, 2009
7499165 System of measuring light transmission and/or reflection Mar. 3, 2009
7499171 Methods for using light reflection patterns to determine diving angle of grain Mar. 3, 2009
7492461 Method and device for measuring reflected optical radiation Feb. 17, 2009
7483141 Diffuse reflectance readhead Jan. 27, 2009
7478638 Machine for manufacturing tobacco products Jan. 20, 2009
7480054 System and method for the deposition, imaging, detection and identification of threat agents Jan. 20, 2009
7477397 Self-calibrating optical reflectance probe system Jan. 13, 2009
7466403 Grain angle sensor Dec. 16, 2008
7443508 Spectrophotometric scanner Oct. 28, 2008
7436516 Reflection characteristic measuring apparatus Oct. 14, 2008
7433055 Device for the examination of optical properties of surfaces Oct. 7, 2008
7426020 System for print imaging with prism illumination optics Sep. 16, 2008
7405828 Method for measuring the degree of crosslinking of pressure sensitive adhesive Jul. 29, 2008
7399600 Optical detection and analysis of particles Jul. 15, 2008
7397565 Device and method for obtaining appearance information Jul. 8, 2008
7397566 Method and apparatus for optical interactance and transmittance measurements Jul. 8, 2008
7391582 Objective lens holder, objective lens driving device including same and optical disk read/write device Jun. 24, 2008
7391518 Device and method for the determination of the quality of surfaces Jun. 24, 2008
7382462 Device for measuring the reflection factor Jun. 3, 2008
7375335 Effect-particle orientation and apparatus therefor May. 20, 2008
7369243 Optical measuring apparatus and optical measuring method May. 6, 2008
7369244 Optical measuring apparatus, illumination system, and light detecting system May. 6, 2008
7362440 Far-field optical microscope with a nanometer-scale resolution based on the in-plane image magnification by surface plasmon polaritions Apr. 22, 2008
7362442 Far-field optical microscope with a nanometer-scale resolution based on the in-plane image magnification by surface plasmon polaritons Apr. 22, 2008
7362429 Opaque additive to block stray light in amorphous fluoropolymer light-guiding flowcells Apr. 22, 2008
7359056 Enhanced signal detection of optically encoded particles via flare Apr. 15, 2008
7355713 Method for inspecting a grating biochip Apr. 8, 2008
7355712 Apparatus for measuring goniometric reflection property of sample Apr. 8, 2008
7355688 Optical probe for optical imaging system Apr. 8, 2008

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