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Class Information
Number: 356/445
Name: Optics: measuring and testing > Of light reflection (e.g., glass)
Description: Subject matter which includes either a material or a sample designed to be placed next to or upon a material or sample to be examined on the basis of reflected light intensity; and which includes either light generating and optical means to direct the generated light, or optical means to direct natural light onto the material or sample to be examined, so that the light is reflected therefrom for examination by visual or photosensitive means to indicate or record, when so desired, the intensity or differences of intensity of the reflected light.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6576430 |
Detection of ligands by refractive surface methods |
Jun. 10, 2003 |
| 6577384 |
Spatial averaging technique for ellipsometry and reflectometry |
Jun. 10, 2003 |
| 6577396 |
Surface plasmon sensor |
Jun. 10, 2003 |
| 6573984 |
Apparatus and method for measuring optical characteristics of teeth |
Jun. 3, 2003 |
| 6573995 |
Sensor device for detecting a degree of wetting and/or soiling of a vehicle pane, and a method of producing the sensor device |
Jun. 3, 2003 |
| 6570656 |
Illumination fluence regulation system and method for use in thermal processing employed in the fabrication of reduced-dimension integrated circuits |
May. 27, 2003 |
| 6570657 |
Arrangement for surface plasmon resonance spectroscopy |
May. 27, 2003 |
| 6563575 |
Optical sensing system for detecting welds and defects in metal |
May. 13, 2003 |
| 6563586 |
Wafer metrology apparatus and method |
May. 13, 2003 |
| 6556302 |
Apparatus for and method of determining information record medium |
Apr. 29, 2003 |
| 6552794 |
Optical detection method for improved sensitivity |
Apr. 22, 2003 |
| 6545765 |
Method and apparatus for measuring thickness of transparent films |
Apr. 8, 2003 |
| 6541288 |
Method of determining semiconductor laser facet reflectivity after facet reflectance modification |
Apr. 1, 2003 |
| 6529277 |
Optical devices based on resonant configurational effects |
Mar. 4, 2003 |
| 6512586 |
Ultrasonic generator and detector using an optical mask having a grating for launching a plurality of spatially distributed, time varying strain pulses in a sample |
Jan. 28, 2003 |
| 6509964 |
Multi-beam apparatus for measuring surface quality |
Jan. 21, 2003 |
| 6510297 |
Toner density sensor |
Jan. 21, 2003 |
| 6507402 |
SPR sensor plate and immune reaction measuring instrument using the same |
Jan. 14, 2003 |
| 6507403 |
Gloss sensor having dirt buildup compensation apparatus and method |
Jan. 14, 2003 |
| 6501542 |
Apparatus and method for measuring optical characteristics of an object |
Dec. 31, 2002 |
| 6498648 |
Procedure for taking a reference measurement |
Dec. 24, 2002 |
| 6498649 |
Pattern reading apparatus |
Dec. 24, 2002 |
| 6489801 |
Apparatus and method for evaluating a semiconductor wafer |
Dec. 3, 2002 |
| 6484564 |
Liquid leakage sensor, paper for detecting liquid leakage, and holder for detecting liquid leakage |
Nov. 26, 2002 |
| 6483590 |
Instrument for rapidly characterizing material reflectance properties |
Nov. 19, 2002 |
| 6480282 |
Capillary surface plasmon resonance sensors and multisensors |
Nov. 12, 2002 |
| 6476916 |
Active optical detector |
Nov. 5, 2002 |
| 6476917 |
Pattern reading apparatus |
Nov. 5, 2002 |
| 6473164 |
Systems, apparatuses and methods for diamond color measurement and analysis |
Oct. 29, 2002 |
| 6473714 |
Inclination measuring apparatus |
Oct. 29, 2002 |
| 6466323 |
Surface plasmon resonance spectroscopy sensor and methods for using same |
Oct. 15, 2002 |
| 6462821 |
Developability sensor with diffuse and specular optics array |
Oct. 8, 2002 |
| 6452685 |
Apparatus for evaluating metalized layers on semiconductors |
Sep. 17, 2002 |
| 6451621 |
Using scatterometry to measure resist thickness and control implant |
Sep. 17, 2002 |
| 6444971 |
Method and system for compensating intensity fluctuations of an illumination system in a confocal microscope |
Sep. 3, 2002 |
| 6441906 |
Set-up of measuring instruments for the parallel readout of SPR sensors |
Aug. 27, 2002 |
| 6429934 |
Optimal symbology illumination-apparatus and method |
Aug. 6, 2002 |
| 6429937 |
Pattern reading apparatus |
Aug. 6, 2002 |
| 6426644 |
Apparatus and method for determining the active dopant profile in a semiconductor wafer |
Jul. 30, 2002 |
| 6426791 |
Method and apparatus for evaluating semiconductor film, and method for producing the semiconductor film |
Jul. 30, 2002 |
| 6424418 |
Surface plasmon resonance sensor apparatus using surface emitting laser |
Jul. 23, 2002 |
| 6421128 |
Coupled plasmon-waveguide resonance spectroscopic device and method for measuring film properties in the ultraviolet and infrared special ranges |
Jul. 16, 2002 |
| 6421129 |
Pattern reading apparatus |
Jul. 16, 2002 |
| 6417924 |
Surface plasmon sensor obtaining total reflection break angle based on difference from critical angle |
Jul. 9, 2002 |
| 6417925 |
Surface plasmon sensor for analyzing liquid sample or humid atmosphere |
Jul. 9, 2002 |
| 6417928 |
Reflectance method for evaluating the surface characteristics of opaque materials |
Jul. 9, 2002 |
| 6415235 |
Fixed optic sensor system and distributed sensor network |
Jul. 2, 2002 |
| 6407674 |
Reflectivity measuring apparatus and method |
Jun. 18, 2002 |
| 6404502 |
Dual standard gloss sensor |
Jun. 11, 2002 |
| 6392750 |
Use of scattered and/or transmitted light in determining characteristics, including dimensional information, of object such as part of flat-panel display |
May. 21, 2002 |
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