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Class Information
Number: 356/445
Name: Optics: measuring and testing > Of light reflection (e.g., glass)
Description: Subject matter which includes either a material or a sample designed to be placed next to or upon a material or sample to be examined on the basis of reflected light intensity; and which includes either light generating and optical means to direct the generated light, or optical means to direct natural light onto the material or sample to be examined, so that the light is reflected therefrom for examination by visual or photosensitive means to indicate or record, when so desired, the intensity or differences of intensity of the reflected light.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7619741 |
Modulated reflectance measurement system with multiple wavelengths |
Nov. 17, 2009 |
| 7619740 |
Microgloss measurement of paper and board |
Nov. 17, 2009 |
| 7619739 |
Detection and identification of biological agents using Bragg filters |
Nov. 17, 2009 |
| 7619724 |
Device and method for detecting changes in the refractive index of a dielectric medium |
Nov. 17, 2009 |
| 7612883 |
Dynamic plasmonics-enabled signal enhancement, a device comprising the same, and a method using the same |
Nov. 3, 2009 |
| 7609393 |
Filling test method and device |
Oct. 27, 2009 |
| 7609373 |
Reducing variations in energy reflected from a sample due to thin film interference |
Oct. 27, 2009 |
| 7605361 |
Fuel property detection device |
Oct. 20, 2009 |
| 7604999 |
System and method for universal identification of biological samples |
Oct. 20, 2009 |
| 7602509 |
Method for selecting optical configuration for high-precision scatterometric measurement |
Oct. 13, 2009 |
| 7602496 |
Optical sensor with biologically reactive surface |
Oct. 13, 2009 |
| 7602495 |
Method for measuring dissociation constant by surface plasmon resonance analysis |
Oct. 13, 2009 |
| 7602484 |
Method and apparatus for performing limited area spectral analysis |
Oct. 13, 2009 |
| 7599072 |
Method for determining physical properties of a multilayered periodic structure |
Oct. 6, 2009 |
| 7599066 |
Localized plasmon resonance sensor |
Oct. 6, 2009 |
| 7599064 |
Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method, substrate for use in the methods |
Oct. 6, 2009 |
| 7596422 |
Determining one or more profile parameters of a structure using optical metrology and a correlation between profile models and key profile shape variables |
Sep. 29, 2009 |
| 7595895 |
Laser beam machining system |
Sep. 29, 2009 |
| 7595885 |
Process monitoring system, process monitoring method, and method for manufacturing semiconductor device |
Sep. 29, 2009 |
| 7595884 |
Measurement of sample reflectance |
Sep. 29, 2009 |
| 7593116 |
Apparatus and method for detecting error of transfer system |
Sep. 22, 2009 |
| 7593111 |
Sensor apparatus |
Sep. 22, 2009 |
| 7593110 |
Surface plasmon resonance detecting apparatus and method thereof |
Sep. 22, 2009 |
| 7593107 |
Method and system for diffusion attenuated total reflection based concentration sensing |
Sep. 22, 2009 |
| 7586616 |
Surface plasmon resonance sensor |
Sep. 8, 2009 |
| 7586615 |
Measuring unit |
Sep. 8, 2009 |
| 7586614 |
System and method for self-referenced SPR measurements |
Sep. 8, 2009 |
| 7586608 |
Wafer-level testing of optical and optoelectronic chips |
Sep. 8, 2009 |
| 7583383 |
Biological property check device using light |
Sep. 1, 2009 |
| 7580131 |
Angularly resolved scatterometer and inspection method |
Aug. 25, 2009 |
| 7576863 |
Horizontal surface plasmon resonance sensor apparatus |
Aug. 18, 2009 |
| 7576862 |
Measuring time dependent fluorescence |
Aug. 18, 2009 |
| 7573576 |
Optical sensor device |
Aug. 11, 2009 |
| 7573567 |
Egg counter for counting eggs which are conveyed on an egg collection conveyer |
Aug. 11, 2009 |
| 7570409 |
Radiation modulation by reflection from controlled composite material |
Aug. 4, 2009 |
| 7570362 |
Optical measurement apparatus utilizing total reflection |
Aug. 4, 2009 |
| 7570361 |
Test method for the testing of the functional capability of a monitoring sensor, monitoring method and monitoring sensor |
Aug. 4, 2009 |
| 7567348 |
Method and apparatus for the evaluation of the local servers properties of surfaces |
Jul. 28, 2009 |
| 7567342 |
Arrangement for the optoelectronic recording of large-area fingerprints |
Jul. 28, 2009 |
| 7564555 |
Method and apparatus for angular-resolved spectroscopic lithography characterization |
Jul. 21, 2009 |
| 7564541 |
System for obtaining images in bright field and crossed polarization modes and chemical images in raman, luminescence and absorption modes |
Jul. 21, 2009 |
| 7561273 |
Device and method for measurement of surfaces |
Jul. 14, 2009 |
| 7561272 |
Precision correction of reflectance measurements |
Jul. 14, 2009 |
| 7557933 |
Measuring probe, sample surface measuring apparatus and sample surface measuring method |
Jul. 7, 2009 |
| 7557926 |
Apparatus for measuring semiconductor physical characteristics |
Jul. 7, 2009 |
| 7557909 |
Printed matter inspection device, printing press and printed matter inspection method |
Jul. 7, 2009 |
| 7554665 |
Dual beam set-up for parousiameter |
Jun. 30, 2009 |
| 7554662 |
Spatial filter means comprising an aperture with a non-unity aspect ratio in a system for investigating samples with electromagnetic radiation |
Jun. 30, 2009 |
| 7551286 |
Measurement apparatus |
Jun. 23, 2009 |
| 7548317 |
Apparatus and method for angular colorimetry |
Jun. 16, 2009 |
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