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Class Information
Number: 356/398
Name: Optics: measuring and testing > By configuration comparison > With object being compared and light beam moved relative to each other (e.g., scanning)
Description: Subject matter including means to scan or sweep a configuration with a light beam, or including means to translate or rotate a configuration in a light beam to facilitate determination of the size or shape of the configuration, usually by means of at least one photocell.

Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
8629977 Traffic scanning LIDAR Jan. 14, 2014
8466966 Video calibration device Jun. 18, 2013
8363101 Method and device for optically measuring external threads Jan. 29, 2013
8310738 Scanning optical device, image forming device and jitter correction method Nov. 13, 2012
8279454 Method of measuring a length of sections of extrados or intrados curves of an elongated workpiece, and relevant length measuring instrument Oct. 2, 2012
8178837 Logical CAD navigation for device characteristics evaluation system May. 15, 2012
7920277 Method and apparatus for irradiating laser Apr. 5, 2011
7813537 Motion-guided segmentation for cine DENSE images Oct. 12, 2010
7724382 Method and apparatus for irradiating laser May. 25, 2010
7700916 Logical CAD navigation for device characteristics evaluation system Apr. 20, 2010
7599075 Automatic optical inspection using multiple objectives Oct. 6, 2009
7573586 Method and system for measuring a coating thickness Aug. 11, 2009
7539328 Surface position measuring method and apparatus May. 26, 2009
7499583 Optical inspection method for substrate defect detection Mar. 3, 2009
7433032 Method and apparatus for inspecting defects in multiple regions with different parameters Oct. 7, 2008
7403872 Method and system for inspecting manufactured parts and sorting the inspected parts Jul. 22, 2008
7394531 Apparatus and method for automatic optical inspection Jul. 1, 2008
7355689 Automatic optical inspection using multiple objectives Apr. 8, 2008
7345271 Optoelectric sensing device with common deflection device Mar. 18, 2008
7225051 Closed-loop feedback for maximizing Cpk in progressive forming operations May. 29, 2007
7110036 Systems and methods for identifying a lens used in a vision system Sep. 19, 2006
6853454 Optical analysis systems Feb. 8, 2005
6707543 Mounting information-collecting device, connector, and mounting information-collecting method Mar. 16, 2004
6602716 Method and device for referencing fluorescence intensity signals Aug. 5, 2003
6597445 Apparatus for deciding position of seam of golf ball Jul. 22, 2003
6480272 System and method for in-situ particle contamination measurement using shadowgrams Nov. 12, 2002
6406849 Interrogating multi-featured arrays Jun. 18, 2002
6403950 Method of producing a carrier frequency modulated signal Jun. 11, 2002
6396949 Machine vision methods for image segmentation using multiple images May. 28, 2002
6396942 Method and apparatus for locating ball grid array packages from two-dimensional image data May. 28, 2002
6363166 Automated photomask inspection apparatus Mar. 26, 2002
6304321 Vehicle classification and axle counting sensor system and method Oct. 16, 2001
6198529 Automated inspection system for metallic surfaces Mar. 6, 2001
6195019 Vehicle classifying apparatus and a toll system Feb. 27, 2001
6064483 Device for checking the position the coplanarity and the separation of terminals of components May. 16, 2000
5958760 Sample processing device with a chamber forming member Sep. 28, 1999
5870187 Method for aligning semiconductor wafer surface scans and identifying added and removed particles resulting from wafer handling or processing Feb. 9, 1999
5864394 Surface inspection system Jan. 26, 1999
5812268 Grid array inspection system and method Sep. 22, 1998
5793491 Intelligent vehicle highway system multi-lane sensor and method Aug. 11, 1998
5787887 Apparatus for tissue examination using bidirectional transirradiation with light Aug. 4, 1998
5757472 Intelligent vehicle highway system sensor and method May. 26, 1998
5686995 Scale pattern arrangement Nov. 11, 1997
5663799 Optical diffraction method and apparatus for integrated circuit lead inspection Sep. 2, 1997
5661671 Bending angle detecting position setting device Aug. 26, 1997
5652658 Grid array inspection system and method Jul. 29, 1997
5646724 Threaded parts inspection device Jul. 8, 1997
5641960 Circuit pattern inspecting device and method and circuit pattern arrangement suitable for the method Jun. 24, 1997
5615013 Galvanometer and camera system Mar. 25, 1997
5574233 Non-contact railway wheel test apparatus and method Nov. 12, 1996

1 2 3 4

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