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Browse by Category: Main > Optical & Optics
Class Information
Number: 356/388
Name: Optics: measuring and testing > By configuration comparison
Description: Subject matter including means for comparing a given configuration such as an article, record, or scale with a standard either visually or by means of a photocell, both the preceding being effected by noting the light from the margins or surfaces of the specimens and standards to an observation point.










Sub-classes under this class:

Class Number Class Name Patents
356/394 With comparison to master, desired shape, or reference voltage 651
356/398 With object being compared and light beam moved relative to each other (e.g., scanning) 152
356/397 With object being compared and scale superimposed 62
356/389 With photosensitive film or plate 45
356/391 With projection on viewing screen 33
356/395 With relatively movable optical grids 76
356/396 With scale or optical grid displaced relative to remote fiducial mark 35
356/390 With two images of single article compared 99


Patents under this class:
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Patent Number Title Of Patent Date Issued
8619245 Authentication device with access control and calibration Dec. 31, 2013
8466966 Video calibration device Jun. 18, 2013
8368896 Measurement of sulfur trioxide via spectroscopy Feb. 5, 2013
8163224 Manufacturing method of three-dimensionally shaped object Apr. 24, 2012
8138089 Method and apparatus for measurement and control of photomask to substrate alignment Mar. 20, 2012
8027037 Method for evaluating microstructures on a workpiece based on the orientation of a grating on the workpiece Sep. 27, 2011
8027813 Method and system for reconstructing aberrated image profiles through simulation Sep. 27, 2011
7970577 Method and system for evaluating an object that has a repetitive pattern Jun. 28, 2011
7925072 Methods for identifying array areas in dies formed on a wafer and methods for setting up such methods Apr. 12, 2011
7920277 Method and apparatus for irradiating laser Apr. 5, 2011
7876438 Apparatus and methods for determining overlay and uses of same Jan. 25, 2011
7864319 Device and method for determining an optical property of a mask Jan. 4, 2011
7756569 Method for measuring the vessel diameter of optically accessible blood vessels Jul. 13, 2010
7724382 Method and apparatus for irradiating laser May. 25, 2010
7684056 Light detecting method and light detecting apparatus Mar. 23, 2010
7664608 Defect inspection method and apparatus Feb. 16, 2010
7542140 Detection method using electromagnetic wave and detection apparatus Jun. 2, 2009
7476856 Sample dimension-measuring method and charged particle beam apparatus Jan. 13, 2009
7446888 Matching optical metrology tools using diffraction signals Nov. 4, 2008
7446887 Matching optical metrology tools using hypothetical profiles Nov. 4, 2008
7368745 Pattern recognition system May. 6, 2008
7327476 Thin films measurement method and system Feb. 5, 2008
7307715 Method for the formation of a structure size measured value Dec. 11, 2007
6969836 Space carving for measurement of high-curvature areas on a mechanical part Nov. 29, 2005
6798515 Method for calculating a scale relationship for an imaging system Sep. 28, 2004
6765282 Semiconductor structure and method for determining critical dimensions and overlay error Jul. 20, 2004
6756241 Method of manufacturing semiconductor device and system for manufacturing the same Jun. 29, 2004
6734970 Method and a device for determining the radiation-damage resistance of an optical material May. 11, 2004
6704107 Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light Mar. 9, 2004
6671423 Method of suppressing geometric distortion of an image space Dec. 30, 2003
6643017 Method and system for controlling the photolithography process Nov. 4, 2003
6603529 Monitoring apparatus and method particularly useful in photolithographically processing substrates Aug. 5, 2003
6545764 Non-contact topographical analysis apparatus and method thereof Apr. 8, 2003
6538739 Bubble diagnostics Mar. 25, 2003
6512584 Quality control for laser peening Jan. 28, 2003
6501549 Method of measuring chemical concentration based on spatial separation and resolution of luminescence Dec. 31, 2002
6498648 Procedure for taking a reference measurement Dec. 24, 2002
6452677 Method and apparatus for detecting defects in the manufacture of an electronic device Sep. 17, 2002
6424417 Method and system for controlling the photolithography process Jul. 23, 2002
6396942 Method and apparatus for locating ball grid array packages from two-dimensional image data May. 28, 2002
6381013 Test slide for microscopes and method for the production of such a slide Apr. 30, 2002
6373576 Method for measuring concentrations of dopants in a liquid carrier on a wafer surface Apr. 16, 2002
6336052 Data acquistion image analysis image manipulation interface Jan. 1, 2002
6326606 Method and apparatus for checking shape Dec. 4, 2001
6314812 Apparatus and method for binocular measurement system Nov. 13, 2001
RE37392 Fired cartridge examination method and imaging apparatus Sep. 25, 2001
6271022 Device for incubating and monitoring multiwell assays Aug. 7, 2001
6222630 Measuring and compensating for warp in the inspection of printed circuit board assemblies Apr. 24, 2001
6211505 Method and apparatus for checking shape Apr. 3, 2001
6208418 Apparatus and method for measurement of the mechanical properties and electromigration of thin films Mar. 27, 2001

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