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Browse by Category: Main > Optical & Optics
Class Information
Number: 356/368
Name: Optics: measuring and testing > By polarized light examination > With polariscopes > Including polarimeters > With electro-optical light rotation
Description: Subject matter including an electrically operated rotator of the polarization plane.


Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
7593102 Polarization evaluation mask, polarization evaluation method, and polarization determination device Sep. 22, 2009
7564553 Polarization evaluation mask, polarization evaluation method, and polarization determination device Jul. 21, 2009
7548315 System and method to compensate for critical dimension non-uniformity in a lithography system Jun. 16, 2009
7528952 Hand-held fluorescence polarimeter May. 5, 2009
7515265 Imaging systems and methods to improve backscattering imaging using circular polarization memory Apr. 7, 2009
7498561 Arrangement for the detection of illumination radiation in a laser scanning microscope Mar. 3, 2009
7486897 Polarization duobinary optical transmitter Feb. 3, 2009
7471378 Method and system for determining a polarization dependent characteristics of optical and opto-electrical devices Dec. 30, 2008
7466471 Optical instrument and measurements using multiple tunable optical polarization rotators Dec. 16, 2008
7463174 Compressive sampling and signal inference Dec. 9, 2008
7450231 Deviation angle self compensating substantially achromatic retarder Nov. 11, 2008
7440103 Inspection apparatus of wiring pattern, inspection method, detection apparatus, detection method Oct. 21, 2008
7436569 Polarization measurement and self-calibration based on multiple tunable optical polarization rotators Oct. 14, 2008
7427932 Compressive sampling and signal inference Sep. 23, 2008
7408640 Fluorescence polarization instruments and methods for detection of exposure to biological materials by fluorescence polarization immunoassay of saliva, oral or bodily fluids Aug. 5, 2008
7405826 Systems and methods for chiroptical heterodyning Jul. 29, 2008
7349089 High transmission multi-wavelength filter and method Mar. 25, 2008
7321427 Multiple beam ellipsometer Jan. 22, 2008
7304736 Method and apparatus for measuring polarization Dec. 4, 2007
7295312 Rapid 4-Stokes parameter determination via Stokes filter wheel Nov. 13, 2007
7283231 Compressive sampling and signal inference Oct. 16, 2007
7283234 Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface Oct. 16, 2007
7253899 Apparatus and method for measuring optically active materials Aug. 7, 2007
7239392 Polarization modulation photoreflectance characterization of semiconductor electronic interfaces Jul. 3, 2007
7218436 Optical instrument and measurements using multiple tunable optical polarization rotators May. 15, 2007
7136164 Multiple beam ellipsometer Nov. 14, 2006
7084976 Concentration measuring instrument Aug. 1, 2006
7079246 Method and apparatus for measuring polarization Jul. 18, 2006
7054005 Elastic-wave monitoring device and surface-acoustic-wave device May. 30, 2006
7030981 Method and apparatus for measuring birefringent particles Apr. 18, 2006
7027198 Generation and analysis of state of polarization using tunable optical polarization rotators Apr. 11, 2006
6999172 Optical apparatus Feb. 14, 2006
6985228 Multiple beam ellipsometer Jan. 10, 2006
6947137 System and method for measuring birefringence in an optical material Sep. 20, 2005
6934023 Method of polarimetry Aug. 23, 2005
6927853 Method and arrangement for optical stress analysis of solids Aug. 9, 2005
6917427 Highly accurate calibration of polarimeters Jul. 12, 2005
6906800 Polarimeter using quantum well stacks separated by gratings Jun. 14, 2005
6891616 Polarization analyzer using a plurality of Faraday rotators May. 10, 2005
6879713 Meiotic spindle imaging in oocytes and uses therefor in in vitro fertilization Apr. 12, 2005
6873416 Medical scanning system and related method of scanning Mar. 29, 2005
6856391 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope Feb. 15, 2005
6833921 Optical systems and methods for rapid screening of libraries of different materials Dec. 21, 2004
6822739 Entangled-photon ellipsometry Nov. 23, 2004
6798512 Multiple beam ellipsometer Sep. 28, 2004
6795184 Odd bounce image rotation system in ellipsometer systems Sep. 21, 2004
6762837 Polarization compensator and wavelength division multiplexing apparatus using same Jul. 13, 2004
6721051 Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation Apr. 13, 2004
6721050 Method and device for the spectral analysis of light Apr. 13, 2004
6714301 Spectral ellipsometer without chromatic aberrations Mar. 30, 2004

1 2 3 4


 
 
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