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Class Information
Number: 356/367
Name: Optics: measuring and testing > By polarized light examination > With polariscopes > Including polarimeters
Description: Subject matter including either a null type or directly indicating instrument for determining the amount of polarized light rotation caused by the article or material being examined.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7599062 |
Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums |
Oct. 6, 2009 |
| 7541600 |
Lithographic and measurement techniques using the optical properties of biaxial crystals |
Jun. 2, 2009 |
| 7486897 |
Polarization duobinary optical transmitter |
Feb. 3, 2009 |
| 7463355 |
Nondestructive optical technique for simultaneously measuring optical constants and thickness of thin films |
Dec. 9, 2008 |
| 7456962 |
Conical refraction polarimeter |
Nov. 25, 2008 |
| 7426030 |
Reduced gas flow purging system in reflectometer, ellipsometer, polarimeter and the like systems |
Sep. 16, 2008 |
| 7420675 |
Multi-wavelength imaging system |
Sep. 2, 2008 |
| 7414733 |
Azimuthal scanning of a structure formed on a semiconductor wafer |
Aug. 19, 2008 |
| 7385695 |
Polarimetry |
Jun. 10, 2008 |
| 7336360 |
Imaging polarimetry |
Feb. 26, 2008 |
| 7304736 |
Method and apparatus for measuring polarization |
Dec. 4, 2007 |
| 7301633 |
High-throughput chiral detector and methods for using same |
Nov. 27, 2007 |
| 7286227 |
Method and system for removing the effects of corneal birefringence from a polarimetric image of the retina |
Oct. 23, 2007 |
| 7283234 |
Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface |
Oct. 16, 2007 |
| 7265837 |
Sensitive polarization monitoring and controlling |
Sep. 4, 2007 |
| 7265836 |
In-line optical polarimeter using free-space polarization sampling elements |
Sep. 4, 2007 |
| 7262848 |
Fiber polarimeter, the use thereof, as well as polarimetric method |
Aug. 28, 2007 |
| 7253899 |
Apparatus and method for measuring optically active materials |
Aug. 7, 2007 |
| 7239382 |
Polarizing plates grading method |
Jul. 3, 2007 |
| 7239392 |
Polarization modulation photoreflectance characterization of semiconductor electronic interfaces |
Jul. 3, 2007 |
| 7227638 |
Calibration system and method for calibration of various types of polarimeters |
Jun. 5, 2007 |
| 7224471 |
Azimuthal scanning of a structure formed on a semiconductor wafer |
May. 29, 2007 |
| 7218398 |
Method and apparatus for determining liquid crystal cell parameters from full Mueller matrix measurements |
May. 15, 2007 |
| 7196792 |
Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process |
Mar. 27, 2007 |
| 7084976 |
Concentration measuring instrument |
Aug. 1, 2006 |
| 7079246 |
Method and apparatus for measuring polarization |
Jul. 18, 2006 |
| 7079245 |
Method and apparatus for detecting gap of liquid-crystal panel and apparatus therefor |
Jul. 18, 2006 |
| 7034939 |
Calibration system and method for calibration of various types of polarimeters |
Apr. 25, 2006 |
| 6999172 |
Optical apparatus |
Feb. 14, 2006 |
| 6982789 |
Monochromator system and applications thereof |
Jan. 3, 2006 |
| 6927853 |
Method and arrangement for optical stress analysis of solids |
Aug. 9, 2005 |
| 6897955 |
Ellipsometer |
May. 24, 2005 |
| 6885466 |
Method for measuring thickness of oxide film |
Apr. 26, 2005 |
| 6836327 |
In-line optical polarimeter based on integration of free-space optical elements |
Dec. 28, 2004 |
| 6836362 |
Method for the rapid determination of the optical quality of combinatorial libraries |
Dec. 28, 2004 |
| 6831746 |
System, method, and apparatus for non-intrusively determining concentration of a solute in a solution |
Dec. 14, 2004 |
| 6816260 |
Fiber polarimeter, the use thereof, as well as polarimetric method |
Nov. 9, 2004 |
| 6765672 |
Fast optical stokes polarimeter |
Jul. 20, 2004 |
| 6744509 |
Retardance sweep polarimeter and method |
Jun. 1, 2004 |
| 6721051 |
Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation |
Apr. 13, 2004 |
| 6717665 |
Polarimeter |
Apr. 6, 2004 |
| 6717706 |
State of polarization detector |
Apr. 6, 2004 |
| 6704106 |
Method and system for canceling system retardance error in an ophthalmological polarimeter |
Mar. 9, 2004 |
| 6653152 |
Sensor disk having radial grooves and optical assaying method using same |
Nov. 25, 2003 |
| 6640116 |
Optical spectroscopy pathlength measurement system |
Oct. 28, 2003 |
| 6620622 |
Method of polarimetry and method of urinalysis using the same |
Sep. 16, 2003 |
| 6595678 |
Mixing apparatus |
Jul. 22, 2003 |
| 6567167 |
Compensating polarization mode dispersion in fiber optic transmission system |
May. 20, 2003 |
| 6556002 |
Wideband instantaneous polarization measurement |
Apr. 29, 2003 |
| 6552836 |
High performance polarization controller and polarization sensor |
Apr. 22, 2003 |
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